IP Library Granted Patent US 9,240,520
Granted Patent B2
US 9,240,520 · App. 14/751,780 · Granted Jan 19, 2016

Semiconductor light-emitting device and method for manufacturing same

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Quick Facts
Patent No.
US 9,240,520
App. No.
14/751,780
Granted
Jan 19, 2016
Kind
B2
Abstract

A semiconductor light-emitting device of the invention includes: a semiconductor layer including a light-emitting layer and having a first major surface and a second major surface opposite to the first major surface; a phosphor layer facing to the first major surface; an interconnect layer provided on the second major surface side and including a conductor and an insulator; and a light-blocking member provided on a side surface of the semiconductor layer and being opaque to light emitted from the light-emitting layer.

Claims (54)

1. A semiconductor light-emitting device comprising:

a semiconductor layer having a first major surface and a second major surface opposite to the first major surface, the semiconductor layer including a light-emitting layer, and the semiconductor layer not including a substrate on the first major surface side;

an n-side electrode and a p-side electrode provided on the second major surface of the semiconductor layer;

an insulating film having a first opening and a second opening, the first opening reaching the n-side electrode, the second opening reaching the p-side electrode;

an n-side interconnect connected to the n-side electrode;

a p-side interconnect connected to the p-side electrode;

an n-side pillar connected to the n-side interconnect and having an end portion being available to connect external;

a p-side pillar connected to the p-side interconnect and having an end portion being available to connect external;

a resin provided between the n-side pillar and the p-side pillar, the resin supporting the semiconductor layer together with the n-side pillar and the p-side pillar;

a metal film provided outside of a side surface continued from the first major surface of the semiconductor layer; and

a phosphor layer provided on the first major surface side without a substrate being interposed between the first major surface and the phosphor layer,

a portion of the n-side interconnect being electrically connected to the semiconductor layer at a portion not including the light-emitting layer, and

another portion of the n-side interconnect extending toward the light-emitting layer side opposite to the light-emitting layer.

2. The device of claim 1 , wherein a side surface of the metal film is exposed from the resin.

3. The device of claim 1 , wherein the resin is opaque to light emitted from the light-emitting layer.

4. The device of claim 1 , wherein the resin is opaque to light emitted from the light-emitting layer, and covers the metal film.

5. The device of claim 1 , wherein a part of the n-side interconnect as the metal film extends to the side surface of the semiconductor layer.

6. The device of claim 1 , wherein the n-side interconnect, the p-side interconnect, the n-side pillar and the p-side pillar contain a copper.

7. The device of claim 1 , wherein the n-side pillar, the p-side pillar, and the resin are thicker than the semiconductor layer.

8. The device of claim 1 , wherein the resin covers around the n-side pillar and the p-side pillar.

9. The device of claim 1 , wherein the semiconductor layer had been formed on a substrate, and the substrate is removed from the semiconductor layer.

10. The device of claim 1 , wherein the insulating film is provided on the n-side electrode and the p-side electrode,

the n-side interconnect is provided in the first opening, and

the p-side interconnect is provided in the second opening.

11. The device of claim 1 , wherein

the n-side interconnect and the p-side interconnect include a seed metal provided on the semiconductor layer side, and

the seed metal as a part of the metal film is provided on the side surface of the semiconductor layer.

12. A semiconductor light-emitting device comprising:

a semiconductor layer having a first major surface and a second major surface opposite to the first major surface, the semiconductor layer including a light-emitting layer, and the semiconductor layer not including a substrate on the first major surface side;

an n-side electrode and a p-side electrode provided on the second major surface of the semiconductor layer;

an insulating film having a first opening and a second opening, the first opening reaching the n-side electrode, the second opening reaching the p-side electrode;

an n-side interconnect connected to the n-side electrode;

a p-side interconnect connected to the p-side electrode;

an n-side pillar connected to the n-side interconnect and having an end portion being available to connect external;

a p-side pillar connected to the p-side interconnect and having an end portion being available to connect external;

a resin provided between the n-side pillar and the p-side pillar, a thickness of the resin being thicker than a thickness of the insulating film;

a metal film provided outside of a side surface continued from the first major surface of the semiconductor layer; and

a phosphor layer provided on the first major surface side without a substrate being interposed between the first major surface and the phosphor layer,

a portion of the n-side interconnect being electrically connected to the semiconductor layer at a portion not including the light-emitting layer, and

another portion of the n-side interconnect extending toward the light-emitting layer side opposite to the light-emitting layer.

13. The device of claim 12 , wherein a side surface of the metal film is exposed from the resin.

14. The device of claim 12 , wherein the resin is opaque to light emitted from the light-emitting layer.

15. The device of claim 12 , wherein the resin is opaque to light emitted from the light-emitting layer, and covers the metal film.

16. The device of claim 12 , wherein a part of the n-side interconnect as the metal film extends to the side surface of the semiconductor layer.

17. The device of claim 12 , wherein the n-side interconnect, the p-side interconnect, the n-side pillar and the p-side pillar contain a copper.

18. The device of claim 12 , wherein the n-side pillar, the p-side pillar, and the resin are thicker than the semiconductor layer.

19. The device of claim 12 , wherein the resin covers around the n-side pillar and the p-side pillar.

20. The device of claim 12 , wherein the semiconductor layer had been formed on a substrate, and the substrate is removed from the semiconductor layer.

21. The device of claim 12 , wherein the insulating film is provided on the n-side electrode and the p-side electrode,

the n-side interconnect is provided in the first opening, and

the p-side interconnect is provided in the second opening.

22. The device of claim 12 , wherein

the n-side interconnect and the p-side interconnect include a seed metal provided on the semiconductor layer side, and

the seed metal as a part of the metal film is provided on the side surface of the semiconductor layer.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 30, 2018
From: TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 046986/0159 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 14, 2018
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
Reel/Frame 046364/0164 →