IP Library Granted Patent US 9,672,318
Granted Patent B2
US 9,672,318 · App. 14/754,464 · Granted Jun 6, 2017

Synthesis of reduced netlist having positive elements and no controlled sources

Inventors: Yiannis Moisiadis (Athens, GR); Nikolaos Mouravliansky (Athens, GR)
Assignee: HELIC, INC.
G06F17/5081G06F17/505G06F17/5045
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Quick Facts
Patent No.
US 9,672,318
App. No.
14/754,464
Granted
Jun 6, 2017
Kind
B2
Abstract

In one embodiment, a circuit analysis method includes obtaining a netlist of a circuit, generating a reduced model from the netlist, using the reduced model to synthesize a positive netlist having no controlled current or voltage sources, unstamping the synthesized positive netlist, and simulating the circuit using the unstamped synthesized positive netlist.

Claims (2416)

1. A circuit analysis method comprising:

obtaining a netlist of a circuit;

generating a reduced model from the netlist;

using a processor to synthesize from the reduced model a positive netlist having no controlled current or voltage sources; and

unstamping the synthesized positive netlist,

wherein generating a reduced model from the netlist includes performing Tichonov regularization.

2. The method of claim 1 , wherein the reduced model is representable as a second-order formulation given as

(

s

Q

~

+

N

~

+

F

~

s

)

x

~

=

A

i

u

where

A

i

=

(

I

K

×

K

0

(

q

-

K

)

×

K

)

{tilde over (Q)}: Reduced capacitance matrix

Ñ: Reduced resistor matrix

{tilde over (F)}: Reduced susceptance (inverse of inductance) matrix

{tilde over (x)}: Reduced state-space vector including the node voltages and the branch currents for inductors

u: Input vector including the voltage sources applied in the ports

s: Laplace frequency notation

K: Number of ports

q: Number of nodes in the reduced netlist

and wherein using the reduced model to synthesize a positive netlist comprises:

introducing into the second-order formulation k virtual susceptances, where k is a number of circuit terminals, to achieve the formulation

(

s

(

0

k

×

k

0

k

×

q

0

q

×

k

Q

~

)

+

(

0

k

×

k

0

k

×

q

0

q

×

k

N

~

)

+

1

s

(

F

1

F

2

F

2

T

F

~

)

)

x

~

=

(

I

K

×

K

0

q

×

K

)

u

applying positive definite enforcement (PDE)

performing a first singular value decomposition on the matrix {tilde over (Q)}, represented as {tilde over (Q)}=X Q S Q X Q T , to achieve

(

s

(

0

0

0

X

Q

S

Q

X

Q

T

)

+

(

0

0

0

N

~

)

+

1

s

(

F

1

F

2

F

2

T

F

~

)

)

x

~

=

(

I

0

)

u

considering the matrix T Q =X Q S Q −1/2 , applying a first transformation

(

(

I

0

0

T

Q

T

)

(

s

(

0

0

0

X

Q

S

Q

X

Q

T

)

+

(

0

0

0

N

~

)

+

1

s

(

F

1

F

2

F

2

T

F

~

)

)

(

I

0

0

T

Q

)

)

x

~

=

(

I

0

0

T

Q

)

(

I

0

)

u

to achieve to the identity matrix I

(

s

(

0

0

0

1

)

+

(

0

0

0

T

Q

T

N

~

T

Q

)

+

1

s

(

F

1

F

2

T

Q

T

Q

T

F

2

T

T

Q

T

F

~

T

Q

)

)

x

~

=

(

I

0

)

u

performing a second singular value decomposition to T Q T ÑT Q =X N S N X N T to achieve

(

s

(

0

0

0

1

)

+

(

0

0

0

X

N

S

N

X

N

T

)

+

1

s

(

F

1

F

2

T

Q

T

Q

T

F

2

T

T

Q

T

F

~

T

Q

)

)

x

~

=

(

I

0

)

u

applying a second transformation,

(

(

I

0

0

X

N

T

)

(

s

(

0

0

0

I

)

+

(

0

0

0

X

N

S

N

X

N

T

)

+

1

s

(

F

1

F

2

T

Q

T

Q

T

F

2

T

T

Q

T

F

~

T

Q

)

)

(

I

0

0

X

N

)

)

x

~

=

(

I

0

0

X

N

T

)

(

I

0

)

u

to obtain

(

s

(

0

0

0

I

)

+

(

0

0

0

S

N

)

+

1

s

(

F

1

F

2

T

Q

X

N

X

N

T

T

Q

T

F

2

T

X

N

T

T

Q

T

F

~

T

Q

X

N

)

)

x

~

=

(

I

0

)

u

considering the following matrices

F′ 2 =F 2 T Q X N

F 3 =X N T T Q T {tilde over (F)}T Q X N

representing the circuit as

(

s

(

0

0

0

I

)

+

(

0

0

0

S

N

)

+

1

s

(

F

1

F

2

F

2

T

F

3

)

)

x

~

=

(

I

0

)

u

3. The method of claim 2 , wherein the identity matrix I and the positive valued diagonal matrix S N correspond respectively to the reduced capacitor {tilde over (Q)} and resistor Ñ matrices, and wherein the unstamping is a direct unstamping of the identity matrix I and the positive valued diagonal matrix S N by constant value capacitors to Gnd and positive resistors respectively.

4. The method of claim 2 , further comprising inverting and unstamping susceptance matrix

F

~

=

(

F

1

F

2

F

2

T

F

3

)

using inductors and mutual inductance (k) elements.

5. The method of claim 4 , wherein the susceptance matrix

F

~

=

(

F

1

F

2

F

2

T

F

3

)

is enforced to positive definite, the inverse inductance matrix is positive definite, diagonal elements of the inverse inductance matrix are positive and are synthesized with positive inductances to ground, and non-diagonal elements of the inverse inductance matrix are synthesized as k-elements between each pair of indices of non-diagonal elements.

6. The method of claim 1 , further comprising:

generating a DC behavior extraction model, and

merging the DC behavior extraction model with the synthesized a positive netlist.

7. The method of 6 , wherein the generating the DC behavior extraction model includes:

formulating a Z parameter matrix of the reduced positive netlist, given by

Z

=

(

A

i

0

)

T

(

(

N

~

E

~

l

-

E

~

l

T

0

)

+

s

(

Q

~

0

0

F

~

)

)

-

1

(

A

i

0

)

calculating the Z matrix at DC,

evaluating the Y matrix, with Y=Z −1 .

8. The method of claim 7 , further comprising unstamping the Y matrix as follows:

A resistor R ij =−1/Y ij is inserted between ports i, j

A resistor R i =1/(Σ j=1 m K ij ) is inserted between port i and gnd.

9. The method of claim 1 , further comprising performing modified nodal analysis (MNA) using the formulations

C

x

.

+

Gx

=

Bu

y

=

B

T

x

wherein

x

=

[

v

n

i

l

i

v

]

u

=

[

-

i

v

v

]

y

=

[

v

i

i

v

]

C

=

[

Q

0

0

l

]

G

=

[

N

A

l

T

-

A

l

0

]

B

=

[

A

i

0

]

Q

=

A

c

T

cA

c

,

N

=

A

g

T

g

A

g

Where

:

B

R

(

N

V

+

N

l

+

K

)

×

K

,

A

i

R

K

×

K

,

N

R

(

N

V

+

K

)

×

(

N

V

+

K

)

,

Q

R

(

N

V

+

K

)

×

(

N

V

+

K

)

,

l

R

N

l

×

N

l

,

A

l

T

R

(

N

V

+

K

)

×

N

l

and Nv is the number of internal nodes, N l is the number of inductors and K the number of ports,

and storing only Q, l, N, A l sub-matrices instead of the dense matrices C and G.

10. The method of claim 1 , further comprising simulating the circuit using the unstamped synthesized positive netlist.

11. A circuit analysis system comprising:

a memory;

a processor for executing instructions stored in the memory, the instructions implementing:

a reduced model generator operable to generate a reduced model of a circuit from a netlist of the circuit, wherein generating a reduced model from the netlist includes performing Tichonov regularization; and

a positive netlist synthesizer operable to generate a positive netlist from the reduced model, the positive netlist having no controlled current or voltage sources.

12. The system of claim 11 , wherein the reduced model is representable as a second-order formulation given as

(

s

Q

~

+

N

~

+

F

~

s

)

x

~

=

A

i

u

where

A

i

=

(

I

K

×

K

0

(

q

-

K

)

×

K

)

and

{tilde over (Q)}: Reduced capacitance matrix

Ñ: Reduced resistor matrix

{tilde over (F)}: Reduced susceptance (inverse of inductance) matrix

{tilde over (x)}: Reduced state-space vector including the node voltages and the branch currents for inductors

u: Input vector including the voltage sources applied in the ports

s: Laplace frequency notation

K: Number of ports

q: Number of nodes in the reduced netlist

and wherein the positive netlist synthesizer is further operable to:

introduce into the second-order formulation k virtual susceptances, where k is a number of circuit terminals, to achieve the formulation

(

s

(

0

k

×

k

0

k

×

q

0

q

×

k

Q

~

)

+

(

0

k

×

k

0

k

×

q

0

q

×

k

N

~

)

+

1

s

(

F

1

F

2

F

2

T

F

~

)

)

x

~

=

(

I

K

×

K

0

q

×

K

)

u

apply positive definite enforcement (PDE)

perform a first singular value decomposition on the matrix {tilde over (Q)}, represented as {tilde over (Q)}=X Q S Q X Q T , to achieve

(

s

(

0

0

0

X

Q

S

Q

X

Q

T

)

+

(

0

0

0

N

~

)

+

1

s

(

F

1

F

2

F

2

T

F

~

)

)

x

~

=

(

I

0

)

u

considering the matrix T Q =X Q S Q −1/2 , applying a first transformation

(

(

I

0

0

T

Q

T

)

(

s

(

0

0

0

X

Q

S

Q

X

Q

T

)

+

(

0

0

0

N

~

)

+

1

s

(

F

1

F

2

F

2

T

F

~

)

)

(

I

0

0

T

Q

)

)

x

~

=

(

I

0

0

T

Q

T

)

(

I

0

)

u

to achieve to the identity matrix I

(

s

(

0

0

0

I

)

+

(

0

0

0

T

Q

T

N

~

T

Q

)

+

1

s

(

F

1

F

2

T

Q

T

Q

T

F

2

T

T

Q

T

F

~

T

Q

)

)

x

~

=

(

I

0

)

u

perform a second singular value decomposition to T Q T ÑT Q =X N S N X N T to achieve

(

s

(

0

0

0

I

)

+

(

0

0

0

X

N

S

N

X

N

T

)

+

1

s

(

F

1

F

2

T

Q

T

Q

T

F

2

T

T

Q

T

F

~

T

Q

)

)

x

~

=

(

I

0

)

u

apply a second transformation,

(

(

I

0

0

X

N

T

)

(

s

(

0

0

0

I

)

+

(

0

0

0

X

N

S

N

X

N

T

)

+

1

s

(

F

1

F

2

T

Q

T

Q

T

F

2

T

T

Q

T

F

~

T

Q

)

)

(

I

0

0

X

N

)

)

x

~

=

(

I

0

0

X

N

T

)

(

I

0

)

u

to obtain

(

s

(

0

0

0

I

)

+

(

0

0

0

S

N

)

+

1

s

(

F

1

F

2

T

Q

X

N

X

N

T

T

Q

T

F

2

T

X

N

T

T

Q

T

F

~

T

Q

X

N

)

)

x

~

=

(

I

0

)

u

considering the following matrices

F′ 2 =F 2 T Q X N

F 3 =X N T T Q T {tilde over (F)}T Q X N

represent the circuit as

(

s

(

0

0

0

I

)

+

(

0

0

0

S

N

)

+

1

s

(

F

1

F

2

F

2

T

F

3

)

)

x

~

=

(

I

0

)

u

13. The system of claim 12 , wherein the identity matrix I and the positive valued diagonal matrix S N correspond respectively to the reduced capacitor {tilde over (Q)} and resistor Ñ matrices.

14. The system of claim 11 , further comprising:

a DC behavior extractor for generating a model of the DC behavior of the circuit; and

a merger for merging the a positive netlist and the model of the DC behavior.

15. The system of 14 , wherein generating the DC behavior extraction model includes:

formulating a Z parameter matrix of the reduced positive netlist, given by

Z

=

(

A

i

0

)

T

(

(

N

~

E

~

l

-

E

~

l

T

0

)

+

s

(

Q

~

0

0

F

~

)

)

-

1

(

A

i

0

)

calculating the Z matrix at DC,

evaluating the Y matrix, with Y=Z −1 .

16. The system of claim 11 , further comprising a circuit analyzer for analyzing the circuit based on the positive netlist.

17. A non-transitory program storage device readable by a machine, embodying a program of instructions executable by the machine to perform a circuit analysis method, the method comprising:

obtaining a netlist of a circuit;

generating a reduced model from the netlist, wherein generating a reduced model from the netlist includes performing Tichonov regularization;

using the reduced model to synthesize a positive netlist having no controlled current or voltage sources; and

unstamping the synthesized positive netlist.

18. The device of claim 17 , wherein the reduced model is representable as a second-order formulation given as

(

s

Q

~

+

N

~

+

F

~

s

)

x

~

=

A

i

u

where

A

i

=

(

I

K

×

K

0

(

q

-

K

)

×

K

)

and

{tilde over (Q)}: Reduced capacitance matrix

Ñ: Reduced resistor matrix

{tilde over (F)}: Reduced susceptance (inverse of inductance) matrix

{tilde over (x)}: Reduced state-space vector including the node voltages and the branch currents for inductors

u: Input vector including the voltage sources applied in the ports

s: Laplace frequency notation

K: Number of ports

q: Number of nodes in the reduced netlist

and wherein using the reduced model to synthesize a positive netlist comprises:

introducing into the second-order formulation k virtual susceptances, where k is a number of circuit terminals, to achieve the formulation

(

s

(

0

k

×

k

0

k

×

q

0

q

×

k

Q

~

)

+

(

0

k

×

k

0

k

×

q

0

q

×

k

N

~

)

+

1

s

(

F

1

F

2

F

2

T

F

~

)

)

=

x

~

(

I

K

×

K

0

q

×

K

)

u

applying positive definite enforcement (PDE)

performing a first singular value decomposition on the matrix {tilde over (Q)}, represented as {tilde over (Q)}=X Q S Q X Q T , to achieve

(

s

(

0

0

0

X

Q

S

Q

X

Q

T

)

+

(

0

0

0

N

~

)

+

1

s

(

F

1

F

2

F

2

T

F

~

)

)

x

~

=

(

I

0

)

u

considering the matrix T Q =X Q S Q −1/2 , applying a first transformation

(

(

I

0

0

T

Q

T

)

(

s

(

0

0

0

X

Q

S

Q

X

Q

T

)

+

(

0

0

0

N

~

)

+

1

s

(

F

1

F

2

F

2

T

F

~

)

)

(

I

0

0

T

Q

)

)

x

~

=

(

I

0

0

T

Q

T

)

(

I

0

)

u

to achieve to the identity matrix I

(

s

(

0

0

0

I

)

+

(

0

0

0

T

Q

T

N

~

T

Q

)

+

1

s

(

F

1

F

2

T

Q

T

Q

T

F

2

T

T

Q

T

F

~

T

Q

)

)

x

~

=

(

I

0

)

u

performing a second singular value decomposition to T Q T ÑT Q =X N S N X N T to achieve

(

s

(

0

0

0

I

)

+

(

0

0

0

X

N

S

N

X

N

T

)

+

1

s

(

F

1

F

2

T

Q

T

Q

T

F

2

T

T

Q

T

F

~

T

Q

)

)

x

~

=

(

I

0

)

u

applying a second transformation,

(

(

I

0

0

X

N

T

)

(

s

(

0

0

0

I

)

+

(

0

0

0

X

N

S

N

X

N

T

)

+

1

s

(

F

1

F

2

T

Q

T

Q

T

F

2

T

T

Q

T

F

~

T

Q

)

)

(

I

0

0

X

N

)

)

x

~

=

(

I

0

0

X

N

T

)

(

I

0

)

u

to obtain

(

s

(

0

0

0

I

)

+

(

0

0

0

S

N

)

+

1

s

(

F

1

F

2

T

Q

X

N

X

N

T

T

Q

T

F

2

T

X

N

T

T

Q

T

F

~

T

Q

X

N

)

)

x

~

=

(

I

0

)

u

considering the following matrices

F′ 2 =F 2 T Q X N

F 3 =X N T T Q T {tilde over (F)}T Q X N

representing the circuit as

(

s

(

0

0

0

I

)

+

(

0

0

0

S

N

)

+

1

s

(

F

1

F

2

F

2

T

F

3

)

)

x

~

=

(

I

0

)

u

19. The device of claim 18 , wherein the identity matrix I and the positive valued diagonal matrix S N correspond respectively to the reduced capacitor {tilde over (Q)} and resistor Ñ matrices, and wherein the unstamping is a direct unstamping of the identity matrix I and the positive valued diagonal matrix S N by constant value capacitors to Gnd and positive resistors respectively.

20. The device of claim 18 , the method further comprising inverting and unstamping susceptance matrix

F

~

=

(

F

1

F

2

F

2

T

F

3

)

using inductors and mutial inductance (k) elements.

21. The device of claim 20 , wherein the susceptance matrix

F

~

=

(

F

1

F

2

F

2

T

F

3

)

is enforced to positive definite, the inverse inductance matrix is positive definite, diagonal elements of the inverse inductance matrix are positive and are synthesized with positive inductances to ground, and non-diagonal elements of the inverse inductance matrix are synthesized as k-elements between each pair of indices of non-diagonal elements.

22. The device of claim 17 , the method further comprising:

generating a DC behavior extraction model, and

merging the DC behavior extraction model with the synthesized a positive netlist.

23. The device of 22 , wherein the generating the DC behavior extraction model includes:

formulating a Z parameter matrix of the reduced positive netlist, given by

Z

=

(

A

i

0

)

T

(

(

N

~

E

~

l

-

E

~

l

T

0

)

+

s

(

Q

~

0

0

F

~

)

)

-

1

(

A

i

0

)

calculating the Z matrix at DC,

evaluating the Y matrix, with Y=Z −1 .

24. The device of claim 23 , the method further comprising unstamping the Y matrix as follows:

A resistor R ij =−1/Y ij is inserted between ports i, j

A resistor R i =1/(Σ j=1 m Y ij ) is inserted between port i and gnd.

25. The device of claim 17 , the method further comprising performing modified nodal analysis (MNA) using the formulations

C

x

.

+

Gx

=

Bu

y

=

B

T

x

wherein

x

=

[

v

n

i

l

i

v

]

u

=

[

-

i

i

v

v

]

y

=

[

v

i

i

v

]

C

=

[

Q

0

0

l

]

G

=

[

N

A

l

T

-

A

l

0

]

B

=

[

A

i

0

]

Q

=

A

c

T

cA

c

,

N

=

A

g

T

gA

g

Where

:

B

R

(

N

V

+

N

l

+

K

)

×

K

,

A

i

R

K

×

K

,

N

R

(

N

V

+

K

)

×

(

N

V

+

K

)

,

Q

R

(

N

V

+

K

)

×

(

N

V

+

K

)

,

l

R

N

l

×

N

l

,

A

l

T

R

(

N

V

+

K

)

×

N

l

and Nv is the number of internal nodes, N l is the number of inductors and K the number of ports,

and storing only Q, l, N, A l sub-matrices instead of the dense matrices C and G.

26. The device of claim 17 , the method further comprising simulating the circuit using the unstamped synthesized positive netlist.

Assignments (2)
MERGER Recorded Jan 7, 2021
From: HELIC, INC.
To: ANSYS, INC.
Reel/Frame 054850/0070 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 3, 2017
From: MOISIADIS, YIANNIS; MOURAVLIANSKY, NIKOLAOS
To: HELIC, INC.
Reel/Frame 041461/0267 →
Continuity (1)
Related Publication 20160378905A1 · Dec 29, 2016