Fiducial design for tilted or glancing mill operations with a charged particle beam
A method for analyzing a sample with a charged particle beam including directing the beam toward the sample surface; milling the surface to expose a second surface in the sample in which the end of the second surface distal to ion source is milled to a greater depth relative to a reference depth than the end of the first surface proximal to ion source; directing the charged particle beam toward the second surface to form one or more images of the second surface; forming images of the cross sections of the multiple adjacent features of interest by detecting the interaction of the electron beam with the second surface; assembling the images of the cross section into a three-dimensional model of one or more of the features of interest. A method for forming an improved fiducial and determining the depth of an exposed feature in a nanoscale three-dimensional structure is presented.
1. A method of analyzing a three-dimensional microscopic structure, the method comprising:
locating a region of interest on a work piece;
cutting a trench at a specified angle in the work piece, the trench exposing a feature of interest in the work piece, wherein the feature of interest is present in the work piece before cutting the trench;
determining the horizontal distance between the edge of the trench and the feature of interest;
calculating the depth of the feature of interest below the plane of the work piece surface using the specified angle at which the trench is cut and the horizontal distance between the edge of the trench and the feature of interest.
2. The method of claim 1 in which determining the horizontal distance between the edge of the trench and the feature of interest comprises determining the horizontal distance between a reference mark and the feature of interest and determining the horizontal distance between the reference mark and the edge of the trench.
3. The method of claim 2 further comprising milling a reference mark using a focused ion beam adjacent the region of interest.
4. The method of claim 2 in which the reference mark is a preexisting feature on the work piece.
5. The method of claim 1 further comprising processing the work piece at a specified depth determined from the horizontal distance.
6. The method of claim 1 , in which the specified angle at which the trench is cut in the work piece is no greater than ten degrees with respect to the plane of the work piece surface.
7. The method of claim 1 , in which the specified angle at which the trench is cut in the work piece is no greater than five degrees with respect to the plane of the work piece surface.
8. The method of claim 1 , in which the specified angle at which the trench is cut in the work piece is no greater than one degree with respect to the plane of the work piece surface.