IP Library Granted Patent US 9,865,465
Granted Patent B2
US 9,865,465 · App. 14/761,799 · Granted Jan 9, 2018

Nanocrystal thin film fabrication methods and apparatus

Inventors: Cherie R. Kagan (Bala Cynwyd, PA); David K. Kim (Lincoln, MA); Ji-Hyuk Choi (Philadelphia, PA); Yuming Lai (Philadelphia, PA)
Assignee: The Trustees Of The University Of Pennsylvania
H01L21/225B82Y10/00H01L21/0256H01L21/02422H01L21/02628H01L21/30604H01L29/0665H01L29/36H01L29/66969H01L29/78681H01L29/22
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Quick Facts
Patent No.
US 9,865,465
App. No.
14/761,799
Granted
Jan 9, 2018
Kind
B2
Abstract

Nanocrystal thin film devices and methods for fabricating nanocrystal thin film devices are disclosed. The nanocrystal thin films are diffused with a dopant such as Indium, Potassium, Tin, etc. to reduce surface states. The thin film devices may be exposed to air during a portion of the fabrication. This enables fabrication of nanocrystal-based devices using a wider range of techniques such as photolithography and photolithographic patterning in an air environment.

Claims (12)

1. A method of fabricating a nanocrystal thin film device that enables exposure to an air environment during a portion of the fabrication, the method comprising:

assembling a nanocrystal layer on a substrate;

depositing electrodes over the nanocrystal layer with a metal dopant present in the electrodes to form the nanocrystal thin film device;

annealing the nanocrystal thin film device to diffuse the deposited metal dopant into the nanocrystal layer to reduce surface states of the nanocrystal layer;

repeating the annealing to restore a portion of electrical properties of the nanocrystal thin film device; and

encapsulating the nanocrystal thin film device;

wherein the electrical properties of the nanocrystal thin film device diminish when expose to air.

2. The method of claim 1 , further comprising: the encapsulating the nanocrystal thin film device in a layer of Aluminum Tri-Oxide (Al2O3).

3. The method of claim 2 , wherein the annealing and encapsulating step are performed simultaneously.

4. The method of claim 1 , further comprising: patterning the nanocrystal layer in an air environment.

5. The method of claim 1 , wherein the metal dopant includes indium, potassium, or tin.

6. The method of claim 1 , wherein the depositing of the electrodes comprises photolithographically depositing the electrodes and wherein the method further comprises: depositing a porous oxide layer over the nanocrystal layer prior to depositing the electrodes to prevent delamination of the nanocrystal layer.

Assignments (3)
CONFIRMATORY LICENSE Recorded Jan 4, 2017
From: UNIVERSITY OF PENNSYLVANIA
To: NATIONAL SCIENCE FOUNDATION
Reel/Frame 041244/0268 →
CONFIRMATORY LICENSE Recorded Dec 14, 2016
From: UNIVERSITY OF PENNSYLVANIA
To: NATIONAL SCIENCE FOUNDATION
Reel/Frame 040940/0203 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 30, 2015
From: KAGAN, CHERIE R.; KIM, DAVID K.; CHOI, JI-HYUK; LAI, YUMING
To: THE TRUSTEES OF THE UNIVERSITY OF PENNSYLVANIA
Reel/Frame 037383/0137 →
Continuity (2)
Provisional Application 61754248 · Jan 18, 2013
Related Publication 20150364324A1 · Dec 17, 2015