IP Library › Granted Patent US 10,712,407
Granted Patent B2
US 10,712,407 · App. 14/766,250 · Granted Jul 14, 2020

Device and methodology for measuring minute changes in ambient magnetic field

Inventors: Andrei Ben Amar Baranga (Omer, IL); David Levron (Omer, IL); Eugene Paperno (Beer Sheva, IL); Reuben Shuker (Omer, IL)
Assignee: BEN GURION UNIVERSITY OF THE NEGEV RESEARCH AND DEVELOPMENT AUTHORITY
G01R33/26G01R33/032
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Quick Facts
Patent No.
US 10,712,407
App. No.
14/766,250
Granted
Jul 14, 2020
Kind
B2
Abstract

An optical magnetometer comprising: a response frequency measurement unit comprising a vapor cell, a pulsed-mode pump laser and a probe laser; and a computing unit configured to compute a magnetic field change based on a difference between at least two temporally-distinct response frequency values received from the frequency measurement unit. Optionally, the response frequency measurement unit is magnetically non-shielded.

Claims (29)

1. An optical magnetometer comprising:

a response frequency measurement unit comprising a vapor cell, a pulsed diode pump laser and a probe laser; and

a computing unit configured to compute a magnetic field change within an ambient magnetic field based on a difference between at least two temporally distinct response frequency values received from the response frequency measurement unit;

wherein at least said vapor cell of said response frequency measurement unit is magnetically exposed to said ambient magnetic field, said ambient magnetic field being the magnetic field of the Earth; and

wherein said pulsed diode pump laser is configured to effect decaying oscillations within said vapor cell following generation of a single pulse of 200 ns or less.

2. The optical magnetometer according to claim 1 , wherein said vapor cell comprises alkaline atoms.

3. The optical magnetometer according to claim 2 , wherein said alkaline atoms are selected from the group consisting of Cesium (Cs), Rubidium (Rb) and Potassium (K).

4. The optical magnetometer according to claim 2 , wherein said response frequency measurement unit further comprises an oven configured to control a temperature in said vapor cell.

5. The optical magnetometer according to claim 1 , wherein said pulsed diode pump laser emits a pulsating laser beam.

6. The optical magnetometer according to claim 5 , wherein said pulsed diode pump laser further comprises a diffraction grating configured to tune the pulsating laser beam.

7. The optical magnetometer according to claim 6 , wherein said response frequency measurement unit further comprises an optical delivery system and a polarimeter system.

8. The optical magnetometer according to claim 5 , wherein said pulsed diode pump laser further comprises a linear polarizer configured to filter the pulsating laser beam.

9. The optical magnetometer according to claim 5 , wherein said pulsed diode pump laser further comprises a circular polarizer configured to circularly polarize the pulsating laser beam.

10. The optical magnetometer according to claim 9 , wherein said circular polarizer is a λ/4 quarter wave plate.

11. The optical magnetometer according to claim 1 , wherein said probe laser comprises a single mode diode laser.

12. The optical magnetometer according to claim 11 , wherein said probe laser further comprises a linear polarizer.

13. The optical magnetometer according to claim 1 , wherein said response frequency measurement unit further comprises a polarized splitter configured to split a beam transmitted by said probe laser.

14. The optical magnetometer according to claim 13 , wherein said response frequency measurement unit further comprises multiple photodiodes, such that light of different polarizations is transferred to different ones of the multiple photodiodes from said polarized splitter, resulting in the at least two temporally-distinct response frequency values.

15. A method for measuring change in an ambient magnetic field, the method comprising

placing in an ambient magnetic field of the earth a pulsed atomic magnetometer comprising a response frequency measurement unit comprising a vapor cell, a pulsed diode pump laser and a continuous wave (CW) probe laser, magnetically exposing at least said vapor cell of said response frequency measurement unit to said ambient magnetic field of the earth;

generating a single pulse from said pulsed diode pump laser; and

computing a difference between at least two temporally-distinct response frequency values received from said pulsed atomic magnetometer, wherein said computing is performed by a hardware computing unit.

16. A method for measuring a change in a magnetic field, the method comprising:

placing in an ambient magnetic field of the earth a pulsed atomic magnetometer comprising a response frequency measurement unit comprising a vapor cell, a pulsed diode pump laser and a continuous wave (CW) probe laser;

magnetically exposing at least said vapor cell of said response frequency measurement unit to said ambient magnetic field of the earth;

irradiating said vapor cell with a single pulse from said pulsed diode pump laser, and while a magnetic field changes;

measuring at least two temporally distinct responses from said vapor cell to the irradiation; and

determining an amount of change to the ambient magnetic field based on a difference between the at least two responses.

17. The method according to claim 16 , wherein said irradiating is at a repetition rate of 5 KHz or less.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 28, 2017
From: BARANGA, ANDREI BEN AMAR; LEVRON, DAVID; PAPERNO, EUGENE; SHUKER, REUBEN
To: BEN GURION UNIVERSITY OF THE NEGEV RESEARCH AND DEVELOPMENT AUTHORITY
Reel/Frame 042520/0888 →
Continuity (3)
Provisional Application 61814378 · Apr 22, 2013
Provisional Application 61761752 · Feb 7, 2013
Related Publication 20150377989A1 · Dec 31, 2015