Method of electron beam diffraction analysis
View Patent ↗A method is provided for analysing electron backscatter diffraction data generated from a sample material. An image data set representative of an image of electron backscatter diffraction bands is obtained from the sample material. A set of estimated first diffraction parameters is then generated, these defining individual electron backscatter diffraction bands in the image data set. A candidate phase is then selected together with a respective orientation for the material, based upon the generated set of estimated parameters thereby identifying diffraction bands in the image data set. Second diffraction parameters of the identified diffraction bands are simulated for the candidate phase according to the respective orientation. These second diffraction parameters are then adjusted for the identified simulated bands so as to fit the simulated bands to the bands in the image data. A fitted orientation for the candidate phase is then calculated together with a corresponding fitting parameter defining the quality of fit. The second diffraction parameters are rho and phi angles, each of which is modulated independently during the said adjusting of a fit to a single band.
1. A method for analysing electron backscatter diffraction data generated from a sample material, comprising:
a) obtaining an image data set representative of an image of electron backscatter diffraction bands from the sample material;
b) generating a set of estimated first diffraction parameters defining individual electron backscatter diffraction bands in the image data set;
c) selecting a candidate phase and a set of plane indices consistent with a set of calculated plane normals for at least a subset of the defined diffraction bands;
d) simulating identified diffraction bands for the candidate phase according to the Bragg angle for each indexed band and second diffraction parameters;
e) adjusting, so as to refine, the second diffraction parameters for each of the simulated identified bands so as to maximize the sum of the slopes in the image values across the simulated band edges to fit each of the simulated bands to the corresponding identified bands in the image data; and,
f) using the refined second diffraction parameters for the identified bands to calculate a fitted orientation for the candidate phase together with a corresponding fitting parameter defining the quality of fit,
wherein the first and second diffraction parameters are rho and phi angles for the band centers of the simulated identified bands, each of which is modulated independently during the said adjusting of the second diffraction parameters in a fit to a single band.
2. A method according to claim 1 , wherein the second diffraction parameters further comprise a Bragg angle that is modulated independently during the said adjusting of a fit to a single band.
3. A method according to claim 1 , wherein the second diffraction parameters are modified iteratively in order to maximise the sum of slopes in image data values across the simulated band edges, the slope being measured in the rho direction and defined positive if the change in image value decreases away from the band centre.
4. A method according to claim 1 , wherein the fitting parameter is a maximum angular deviation between the simulated and actual planes for the candidate phase.
5. A method according to claim 1 , wherein the second diffraction parameters define the crystal orientation.
6. A method according to claim 1 , wherein the second diffraction parameters define the crystal orientation and set of d-spacings.
7. A method according to claim 5 , wherein the second diffraction parameters are modified iteratively in accordance with a correlation measure representing the correlation between chosen bands in an image data set and simulated bands in a simulated image.
8. A method according to claim 7 , wherein the second diffraction parameters are modified iteratively in accordance with a correlation measure represented by a mathematical combination of slopes in image data values across the simulated band edges, the slope being measured in the rho direction and defined positive if the change in image value decreases away from the band centre.
9. A method according to claim 7 , wherein the fitting parameter in step (f) is based upon the correlation measure.
10. A method according to claim 1 , wherein, prior to step (a) the image data set is produced by processing an initial image data set so as to reduce the size of the image data set in comparison with the initial image data set.
11. A method according to claim 1 , wherein step (b) comprises:
(i) applying a Hough transform to the image data set forming transformed data in Hough space, and
(ii) detecting Kikuchi bands in the Hough space.
12. A method according to claim 11 , wherein step (c) comprises interpreting the detected Kikuchi bands to determine plane normals and comparing these with crystallographic data so as to index at least a subset of the bands.
13. A method according to claim 1 , wherein in step (d) the number of bands simulated is smaller than the number of bands present within the image data set.
14. A method according to claim 1 , wherein the number of bands simulated is equal to the number of bands for which estimated diffraction parameters are generated in step (b).
15. A method according to claim 1 , further comprising, selecting a plurality of candidate solutions, each having a phase and set of indices for each band in accordance with step (c), performing steps (d), (e) and (f) for each candidate solution and selecting a resultant phase and associated fitted orientation based upon the fitting parameter for each solution.
16. A method according to claim 1 , wherein the effect of the adjustment in step (e) is calculated at a number of separated locations along the bands.
17. A method according to claim 1 , further comprising producing an image of the bands of the image data set overlaid with the simulated bands.
18. A method according to claim 1 , wherein the method is repeated for a number of scan points on the sample so as to produce a map of crystallographic properties.