Patent Assignment
Reel/Frame 074456/0084
Change of Address
Recorded: 2026-01-27
Pages: 6
Assignor
OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Executed: 2026-01-27
Assignee
OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
HALIFAX ROAD, HIGH WYCOMBE, HP12 3SE, UNITED KINGDOM
Covered Properties
(38)
Improved Camera for Electron Diffraction Pattern Analysis
Application:
17/923,867 →
Publication:
US 2023/0175991
Material Analysis with Multiple Detectors
Sample Preparation Method and Apparatus
Method of Preparing a Silicon Carbide Wafer
Application:
18/027,071 →
Publication:
US 2023/0326735
Method and System for Indexing Electron Diffraction Patterns
Application:
18/205,711 →
Publication:
US 2023/0395350
Method and System for Indexing Electron Diffraction Patterns
Application:
18/205,878 →
Publication:
US 2023/0393083
Methods for Positioning a Measurement Spot Using a Scanning Probe Microscrope
Application:
63/602,009 →
Live Chemical Imaging with Multiple Detectors
Application:
18/408,347 →
Publication:
US 2024/0241068
Method of Etching or Depositing a Thin Film
Application:
18/576,486 →
Publication:
US 2025/0079141
Improved Navigation for Electron Microscopy
Application:
18/580,555 →
Publication:
US 2024/0339293
Method for Dislocation Analysis
Application:
18/713,247 →
Publication:
US 2024/0337611
Methods of Depositing Materials Onto 2-Dimensional Layered Materials
Application:
18/719,983 →
Publication:
US 2025/0051923
Electron Filter
Application:
18/826,469 →
Publication:
US 2025/0087449
Method and System for Identifying Diffraction Spots in an Electron Diffraction Pattern
Application:
18/904,761 →
Publication:
US 2026/0094408
Improved X-Ray Analysis for Heated Specimens in Electron Microscopes
Application:
18/858,486 →
Publication:
US 2025/0264424
Methods for Positioning a Measurement Spot Using a Scanning Probe Microscrope
Application:
18/949,856 →
Publication:
US 2025/0164523
Method of Calculating the Structure of an Inhomogeneous Sample
Method of Determining the Feasibility of a Proposed Structure Analysis Process
Method for Quantitative Analysis of a Material
Charged Particle Filter
Material Identification Using Multiple Images
Charge-Sensitive Amplifier
Apparatus and Method for Performing Microdiffraction Analysis
Methods and Apparatus for Depositing and/or Etching Material on a Substrate
Method of Electron Beam Diffraction Analysis
Method of Reducing the Thickness of a Target Sample
Method of Processing a Particle Spectrum
X-Ray Analysis in Air
Method of Performing Electron Diffraction Pattern Analysis Upon a Sample
Cyclical Plasma Etching
A Method for Measuring the Mass Thickness of a Target Sample for Electron Microscopy
X-Ray Analysis in Air
Improved Analysis with Preliminary Survey
Navigation for Electron Microscopy
Collision Avoidance for Particle Beam Instruments
Improved System for Electron Diffraction Analysis
Sample Preparation Method and Apparatus
Collision Avoidance for Particle Beam Instruments
Related Assignments
(24)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
May 29, 2009
From: STATHAM, PETER JOHN; PENMAN, CHARLES
To: OXFORD INSTRUMENTS ANALYTICAL LIMITED
Reel/Frame 022755/0373 →
Assignment of Assignor's Interest
Jan 25, 2010
From: STATHAM, PETER JOHN; BARKSHIRE, IAN RICHARD
To: OXFORD INSTRUMENTS ANALYTICAL LIMITED
Reel/Frame 023838/0377 →
Assignment of Assignor's Interest
Mar 26, 2010
From: BEWICK, ANGUS
To: OXFORD INSTRUMENTS ANALYTICAL LIMITED
Reel/Frame 024147/0338 →
Change of Name
Jun 8, 2011
From: OXFORD INSTRUMENTS SUPERCONDUCTIVITY LIMITED
To: OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Reel/Frame 026407/0823 →
Assignment of Assignor's Interest
Jun 8, 2011
From: OXFORD INSTRUMENTS ANALYTICAL LIMITED
To: OXFORD INSTRUMENTS SUPERCONDUCTIVITY LIMITED
Reel/Frame 026407/0848 →
Change of Name
Jun 21, 2011
From: OXFORD INSTRUMENTS ANALYTICAL LIMITED
To: OXFORD INSTRUMENTS SUPERCONDUCTIVITY LIMITED
Reel/Frame 026472/0030 →
Change of Name
Jun 21, 2011
From: OXFORD INSTRUMENTS SUPERCONDUCTIVITY LIMITED
To: OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Reel/Frame 026472/0389 →
Change of Name
Jun 21, 2012
From: OXFORD INSTRUMENTS SUPERCONDUCTIVITY LIMITED
To: OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Reel/Frame 028427/0566 →
Assignment of Assignor's Interest
Oct 23, 2013
From: STATHAM, PETER JOHN
To: OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Reel/Frame 031461/0742 →
Assignment of Assignor's Interest
Nov 22, 2013
From: NASHASHIBI, TAWFIC
To: OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Reel/Frame 031658/0330 →
Assignment of Assignor's Interest
Apr 14, 2023
From: BURGESS, SIMON; BHADARE, SANTOKH; TYRRELL, CHRIS; STATHAM, PETER
To: OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Reel/Frame 063330/0357 →
Assignment of Assignor's Interest
Nov 7, 2023
From: MAZZAMUTO, SAMANTHA; NEWTON, ANDREW; LOVEDAY, MATTHEW; COOKE, MICHAEL
To: OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Reel/Frame 065486/0608 →
Assignment of Assignor's Interest
Jan 19, 2024
From: STATHAM, PETER; PINARD, PHILIPPE
To: OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Reel/Frame 066175/0511 →
Assignment of Assignor's Interest
May 23, 2024
From: HYDE, ANTHONY; STRATHAM, PETER; PINARD, PHILIPPE; BURGESS, SIMON
To: OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Reel/Frame 067510/0898 →
Assignment of Assignor's Interest
Sep 13, 2024
From: RIAZIMEHR, SARAH; KNOOPS, HARM; SUNDARAM, RAVI
To: OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Reel/Frame 068586/0012 →
Assignment of Assignor's Interest
Sep 16, 2024
From: NEWTON, ANDREW; CHO, SUNGJIN; LOVEDAY, MATTHEW; GOODYEAR, ANDREW
To: OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Reel/Frame 068599/0827 →
Assignment of Assignor's Interest
Mar 18, 2025
From: LEFEVER, JOEL; PROKSCH, ROGER; LABUDA, ALEKSANDER; ZHANG, HAIGANG
To: OXFORD INSTRUMENTS ASYLUM RESEARCH, INC.
Reel/Frame 070546/0497 →
Assignment of Assignor's Interest
Sep 24, 2025
From: BHADARE, SANTOKH; MANSOUR, HAITHEM; TYRRELL, CHRIS
To: OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Reel/Frame 072363/0036 →
Assignment of Assignor's Interest
Dec 23, 2025
From: LINDSAY, JOHN; TRIMBY, PATRICK; STATHAM, PATRICK; SCHMIDT, NIELS-HENRIK
To: OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Reel/Frame 073300/0280 →
Assignment of Assignor's Interest
Mar 27, 2026
From: TRIMBY, PATRICK; MEHNERT, KLAUS; WINKELMANN, AMINO
To: OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Reel/Frame 074207/0540 →
Assignment of Assignor's Interest
Apr 10, 2026
From: MASTERS, ROBERT; BEWICK, ANGUS; STATHAM, PETER
To: OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Reel/Frame 074340/0001 →
Assignment of Assignor's Interest
May 27, 2026
From: STATHAM, PETER
To: OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Reel/Frame 074769/0926 →
Assignment of Assignor's Interest
Jun 5, 2026
From: MASTERS, ROBERT
To: OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Reel/Frame 074862/0786 →
Assignment of Assignor's Interest
Jul 15, 2026
From: TRIMBY, PATRICK; MEHNERT, KLAUS; WINKELMANN, AIMO
To: OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Reel/Frame 075281/0798 →