IP Library Patent Application 18719983
Patent Application
App. No. 18/719,983

METHODS OF DEPOSITING MATERIALS ONTO 2-DIMENSIONAL LAYERED MATERIALS

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Quick Facts
Patent No.
US None
App. No.
18/719,983
Abstract

A method for plasma deposition of materials onto a 2-dimensional layer of a first substrate, the method comprising: depositing a protective layer directly onto the 2-dimensional layer in a pulsed plasma deposition process; and depositing a second layer onto the protective layer in a second plasma deposition process.

Claims (24)

1 . A method for plasma deposition of materials onto a 2-dimensional layer of a first substrate, the method comprising:

depositing a protective layer directly onto the 2-dimensional layer in a pulsed plasma deposition process; and

depositing a second layer onto the protective layer in a second plasma deposition process.

2 . A method of plasma deposition according to claim 1 , wherein the 2-dimensional layer comprises graphene.

3 . A method of plasma deposition according to claim 1 , wherein the protective layer comprises a dielectric.

4 . A method of plasma deposition according to claim 1 , wherein the protective layer comprises a metal or semiconductor nitride; a metal or semiconductor carbide; or a metal or semiconductor carbonitride.

5 . A method of plasma deposition according to claim 1 , wherein the pulsed plasma deposition process comprises a plasma enhanced atomic layer deposition process or a pulsed plasma enhanced chemical vapour deposition process.

6 . A method of plasma deposition according to claim 5 , wherein the step of depositing a protective layer directly onto the substrate in a plasma enhanced atomic layer deposition process comprises using a low energy plasma.

7 . A method of plasma deposition according to claim 1 , wherein the second plasma deposition process comprises a pulsed plasma deposition process.

8 . A method of plasma deposition according to claim 7 , wherein the second plasma deposition process comprises a plasma enhanced atomic layer deposition process or a pulsed plasma enhanced chemical vapour deposition process.

9 . A method of plasma deposition according to claim 7 , wherein the second layer comprises a dielectric.

10 . A method of plasma deposition according to claim 3 , wherein the protective layer and/or the second layer each have a dielectric constant greater than 3.

11 . A method of plasma deposition according to claim 1 , wherein the protective layer and the second layer are formed from different materials.

12 . A method of plasma deposition according to claim 1 , wherein the step of depositing a protective layer is carried out in a first deposition chamber and the method further comprises, prior to the step of depositing a protective layer, depositing a protective layer onto a second substrate in the first deposition chamber, removing the second substrate from the first deposition chamber, and providing the first substrate in the first deposition chamber.

13 . A method of plasma deposition according to claim 1 , wherein the step of depositing a second layer is carried out in a second deposition chamber and the method further comprises, prior to the step of depositing a second layer, depositing a third layer onto a third substrate in the second deposition chamber, removing the second substrate from the second deposition chamber, and providing the first substrate in the second deposition chamber.

14 . A method of plasma deposition according to claim 12 , wherein the first deposition chamber is the second deposition chamber.

15 . A method for deposition of materials onto a 2-dimensional layer of a first substrate, the method comprising:

depositing a protective layer directly onto the 2-dimensional layer in a radical enhanced atomic layer deposition process; and

depositing a second layer onto the protective layer in a second deposition process.

16 . A method of deposition according to claim 15 , wherein the radical enhanced atomic layer deposition process is a hot wire assisted atomic layer deposition process.

17 . A method of plasma deposition according to claim 9 , wherein the protective layer and/or the second layer each have a dielectric constant greater than 3.

18 . A method of plasma deposition according to claim 2 , wherein the protective layer and the second layer are formed from different materials.

19 . A method of plasma deposition according to claim 2 , wherein the protective layer comprises a dielectric.

20 . A method of plasma deposition according to claim 13 , wherein the first deposition chamber is the second deposition chamber.

Assignments (2)
CHANGE OF ADDRESS Recorded Jan 27, 2026
From: OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
To: OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Reel/Frame 074456/0084 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 13, 2024
From: RIAZIMEHR, SARAH; KNOOPS, HARM; SUNDARAM, RAVI
To: OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Reel/Frame 068586/0012 →