IP Library Granted Patent US 10,115,693
Granted Patent B2
US 10,115,693 · App. 14/775,112 · Granted Oct 30, 2018

Solder layer of a semiconductor chip arranged within recesses

Inventor: Akihiko Hatasawa (Tokyo, JP)
Assignee: LONGITUDE LICENSING LIMITED
H01L24/17H01L23/3135H01L23/481H01L24/97H01L25/065H01L25/0657H01L25/07H01L25/50H01L21/561H01L21/568H01L23/3128H01L25/18H01L2224/05556H01L2224/05571H01L2224/06181H01L2224/16145H01L2224/16146H01L2224/16147H01L2224/16225H01L2224/32145H01L2224/32225H01L2224/73204H01L2224/81191H01L2225/06513H01L2225/06517H01L2225/06541H01L2225/06544H01L2924/15311H01L2924/181H01L2924/351
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Quick Facts
Patent No.
US 10,115,693
App. No.
14/775,112
Filed
Sep 11, 2015
Granted
Oct 30, 2018
Kind
B2
Art Unit
2815
USPC
257/737
Abstract

One semiconductor chip includes a substrate having insulation properties, a plurality of bump electrodes provided on one surface of the substrate, a plurality of recesses provided in the other surface of the substrate, and a solder layer disposed within the recesses. The recesses are formed such that the area of the opening decreases from the other surface side toward the one surface side of the substrate.

Claims (12)

1. A semiconductor chip comprising:

a semiconductor substrate;

a plurality of bump electrodes provided on one face side of said substrate;

a plurality of recesses provided on the other face side of said substrate;

a solder layer arranged within said recesses, wherein said recesses are formed so as to have a smaller aperture area from said other face side of said substrate towards said one face side thereof, and wherein the solder layer completely fills said recesses; and

a circuit forming layer disposed between the solder layer and the plurality of bump electrodes.

2. The semiconductor chip as claimed in claim 1 , comprising:

a linkage section passing through from said recess to said one face side of said substrate and formed in said substrate; and

a conductor layer being arranged in said linkage section, wherein said bump electrodes and said solder layer are electrically connected through said conductor layer.

3. The semiconductor chip as claimed in claim 1 , wherein said recesses are formed in conical shape.

4. The semiconductor chip as claimed in claim 1 , wherein said bump electrodes are made of copper.

5. The semiconductor chip as claimed in claim 4 , wherein said copper bump electrodes are formed in a cylindrical pillar shape.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 21, 2018
From: LONGITUDE SEMICONDUCTOR S.A.R.L.
To: LONGITUDE LICENSING LIMITED
Reel/Frame 046864/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 24, 2016
From: PS4 LUXCO S.A.R.L.
To: PS5 LUXCO S.A.R.L.
Reel/Frame 039793/0528 →
CHANGE OF NAME Recorded Aug 24, 2016
From: PS5 LUXCO S.A.R.L.
To: LONGITUDE SEMICONDUCTOR S.A.R.L.
Reel/Frame 039793/0715 →
Priority Claims (1)
JP 2013-051849 · Mar 14, 2013 · national
Continuity (1)
Related Publication 20160027755A1 · Jan 28, 2016
Cited By (1)
US 12,315,818