Error correction based on thermal profile of flash memory device
Systems and methods to manage a memory device by executing program code to determine a temperature profile associated with a region of the memory device. The temperature profile may be one of many temperature profiles each associated with a respective region of the memory device. A correction capability may be determined based on the thermal profile and an error in the memory region may be corrected using the determined correction capability.
1. An apparatus comprising:
a memory device storing data and program code;
a temperature sensor configured to sense a temperature of the memory device;
a controller in communication with the memory and the temperature sensor, the controller configured execute the program code to:
determine a temperature profile associated with a region of the memory device, wherein the temperature profile is one of a plurality of temperature profiles each associated with a respective region of a plurality of regions of the memory device;
determine a correction capability based on the thermal profile; and
correct an error in the memory region using the determined correction capability; and
a logical-to-physical address table maintaining information associating the plurality of temperature profiles with the plurality of regions.
2. The apparatus of claim 1 , wherein the controller is further configured to generate a bias vector indicative of the correction capability.
3. The apparatus of claim 1 , wherein the controller is further configured to associate the plurality of regions with a plurality of correction capabilities.
4. The apparatus of claim 1 , wherein the controller is further configured to set a plurality of set points based on a plurality of changing temperature bounds.
5. The apparatus of claim 1 , wherein the thermal profile is determined at runtime, and wherein the correction capability is set at system startup to a highest supported error-correcting code (ECC) set point for the memory device.
6. An apparatus comprising:
a memory device storing data and program code;
a temperature sensor configured to sense a temperature of the memory device; and
a controller in communication with the memory and the temperature sensor, the controller configured execute the program code to:
determine a temperature profile associated with a region of the memory device, wherein the temperature profile is one of a plurality of temperature profiles each associated with a respective region of a plurality of regions of the memory device;
determine a correction capability based on the thermal profile; and
correct an error in the memory region using the determined correction capability,
wherein the controller is further configured to generate a bias vector indicative of the correction capability.
7. The apparatus of claim 6 , wherein the memory device is divided into a plurality of regions based on a temperature gradient.
8. The apparatus of claim 6 , wherein the controller is further configured to communicate the bias vector to an error-correcting code (ECC) decoder.
9. The apparatus of claim 6 , further comprising a logical-to-physical address table maintaining information associating the plurality of temperature profiles with the plurality of regions.
10. The apparatus of claim 6 , wherein the controller is configured to determine the temperature profile in response to at least one of a determined runtime, a specified traffic-related condition, and a set number of cycles.
11. The apparatus of claim 6 , wherein the controller is further configured to associate the plurality of regions with a plurality of correction capabilities.
12. The apparatus of claim 6 , wherein the controller is further configured to set a plurality of set points based on a plurality of changing temperature bounds.
13. The apparatus of claim 6 , wherein the thermal profile is determined at runtime, and wherein the correction capability is set at system startup to a highest supported error-correcting code (ECC) set point for the memory device.
14. An apparatus comprising:
a memory device storing data and program code;
a temperature sensor configured to sense a temperature of the memory device; and
a controller in communication with the memory and the temperature sensor, the controller configured execute the program code to:
determine a temperature profile associated with a region of the memory device, wherein the temperature profile is one of a plurality of temperature profiles each associated with a respective region of a plurality of regions of the memory device;
determine a correction capability based on the thermal profile, wherein the thermal profile is determined at runtime, and wherein the correction capability is set at system startup to a highest supported error-correcting code (ECC) set point for the memory device; and
correct an error in the memory region using the determined correction capability.
15. The apparatus of claim 14 , further comprising a logical-to-physical address table maintaining information associating the plurality of temperature profiles with the plurality of regions.
16. The apparatus of claim 14 , wherein the memory device is divided into a plurality of regions based on a temperature gradient.
17. The apparatus of claim 14 , wherein the controller is further configured to generate a bias vector indicative of the correction capability.
18. The apparatus of claim 17 , wherein the controller is further configured to communicate the bias vector to an error-correcting code (ECC) decoder.
19. The apparatus of claim 14 , wherein the controller is further configured to associate the plurality of regions with a plurality of correction capabilities.
20. The apparatus of claim 14 , wherein the controller is further configured to set a plurality of set points based on a plurality of changing temperature bounds.