Methods to reduce debonding forces on flexible semiconductor films disposed on vapor-releasing adhesives

1. A method, comprising:

providing a handle substrate having a front surface and a back surface;

providing a layer of flexible semiconductor material having a front surface and a back surface and an at least partially sacrificial backing layer stack on the back surface of the layer of flexible semiconductor material;

bonding the front surface of the layer of flexible semiconductor material to the front surface of the handle substrate;

removing at least a portion of the at least partially sacrificial backing layer stack from the back surface of the layer of flexible semiconductor material;

opening outgassing paths through the layer of flexible semiconductor material; and

processing the layer of flexible semiconductor material.

2. The method of claim 1 , further comprising disposing a metal adhesion layer on the front surface of the layer of flexible semiconductor material such that the front surface of the layer of flexible semiconductor material is bonded to the front surface of the handle substrate via the metal adhesion layer.

3. The method of claim 2 , further comprising opening the outgassing paths through the metal adhesion layer.

4. The method of claim 2 , wherein the layer of flexible semiconductor material comprises silicon and the metal adhesion layer is a thermally evaporated metal layer.

5. The method of claim 1 , wherein bonding the front surface of the layer of flexible semiconductor material to the front surface of the handle substrate comprises applying an epoxy adhesive to at least a portion of the front surface of the handle substrate.

6. The method of claim 5 , further comprising applying pressure to distribute the epoxy adhesive between the layer of flexible semiconductor material and the handle substrate.

7. The method of claim 1 , wherein the layer of flexible semiconductor material comprises material selected from the group consisting of silicon, germanium, SiGe, bulk III-V materials, epitaxially grown semiconductor layers, any of the foregoing materials having doped layers, any of the foregoing materials having metallic layers, any of the foregoing materials having passivating layers, and combinations of the foregoing materials.

8. The method of claim 1 , wherein the at least partially sacrificial backing layer stack comprises an adhesion layer disposed on the back surface of the layer of flexible semiconductor material, a seed layer disposed on the adhesion layer, a stressor layer disposed on the seed layer, and a transfer tape disposed on the stressor layer.

9. The method of claim 1 , wherein processing the layer of flexible semiconductor material comprises at least one of patterning, thermally treating, and depositing a film on the layer of flexible semiconductor material.

10. A method, comprising:

providing an at least partially sacrificial backing layer stack on a back surface of a semiconductor layer;

disposing a metal adhesion layer on a front surface of the semiconductor layer;

bonding the metal adhesion layer to a front surface of a substrate;

removing at least a portion of the at least partially sacrificial backing layer stack from the back surface of the semiconductor layer;

opening outgassing paths through the semiconductor layer; and

processing the semiconductor layer.

11. The method of claim 10 , wherein bonding the metal adhesion layer to the front surface of the substrate comprises applying an epoxy adhesive to at least a portion of the front surface of the substrate.

12. The method of claim 11 , further comprising applying pressure to distribute the epoxy adhesive between the front surface of the substrate and the metal adhesion layer.

13. The method of claim 10 , wherein the semiconductor layer comprises material selected from the group consisting of silicon, germanium, SiGe, bulk III-V materials, epitaxially grown semiconductor layers, any of the foregoing materials having doped layers, any of the foregoing materials having metallic layers, any of the foregoing materials having passivating layers, and combinations of the foregoing materials.

14. The method of claim 10 , wherein the semiconductor layer comprises silicon and the metal adhesion layer is a thermally evaporated metal layer.

15. The method of claim 11 , wherein the at least partially sacrificial backing layer stack on a back surface of a semiconductor layer is formed by controlled spalling.

16. A method, comprising:

providing a stressor layer stack on a back surface of a semiconductor substrate;

adhesively bonding a front surface of the semiconductor substrate to a handle substrate using an epoxy adhesive;

removing at least a portion of the stressor layer stack from the back surface of the semiconductor substrate;

applying a hardmask to the back surface of the semiconductor substrate exposed by removing the at least a portion of the stressor layer stack;

forming semiconductor cells in the semiconductor substrate under the hardmask such that the formed semiconductor cells are spaced apart from each other; and

allowing the epoxy adhesive to outgas from the spaces defined between the semiconductor cells.

17. The method of claim 16 , further comprising forming a metal adhesion layer on the front surface of the semiconductor substrate and adhesively bonding the front surface of the semiconductor substrate to the handle substrate via the metal adhesion layer.

18. The method of claim 17 , further comprising allowing the epoxy adhesive to outgas through the metal adhesion layer.

19. The method of claim 17 , wherein the semiconductor substrate comprises silicon and the metal adhesion layer is a thermally evaporated metal layer.

20. The method of claim 19 , wherein the thermally evaporated metal layer is aluminum.