SYSTEM AND METHOD FOR COMPENSATING SPECTROPHOTOMETER THERMAL DRIFT WITHOUT DIRECT TEMPERATURE MEASUREMENT
In accordance with a broad aspect of the present invention, a system and method are provided for monitoring and compensating thermal drift of the electronic elements in the sensor of a color measurement device, such as a spectrophotometer. Such a system and method involves, obtaining with a color sensor a plurality of measurements of a black trap with and without illumination across a range of temperatures and using those values to generate a correlation function that allows for the compensation of thermal drift in sample measurements.
1 . A method for compensating the thermal drift in a spectrophotometer configured to output a signal in response to light incident upon an integrated sensor, and configured with a selectable light source, the method comprising;
obtaining, for a range of temperatures, a plurality of non-illuminated measurement values by measuring a black trap with the light source deactivated and a plurality of illuminated measurement values by measuring the black trap illuminated by the light source and recording the plurality of non-illuminated and illuminated measurements,
selecting an initial non-illuminated measurement value D 0 from the plurality of non-illuminated measurement values;
generating from the measured range of values a data model f configured to correlate the output signal of the sensor with a non-illuminated measurement value when measuring a black trap;
obtaining a sample measurement value D with the light source deactivated and a sample measurement value I with the light source activated;
generating a corrected sample measurement according to a compensation algorithm that incorporates D 0 , D, I and f; and
displaying a corrected sample value based on the corrected sample measurement signal.
2 . The method of claim 1 , wherein the compensation algorithm is
I c =I+f ( D 0 )− f ( D ),
where I c is the corrected sample signal.
3 . The method of claim 1 , wherein the generating step includes performing regression analysis on the illuminated measurement values and the non-illuminated measurement values and obtaining a best-fitting function.
4 . The method of claim 1 , wherein the data model is formed by performing a regression analysis on the non-illuminated and illuminated measurement values across a range of temperatures.
5 . The method of claim 1 , wherein the light source is a LED.
6 . The method of claim 1 , where the sample sensor is a component of a spectrophotometer.
7 . The method of claim 1 , wherein the selection step further comprises determining the range of non-illuminated measurement values and determining a mid-range value for D 0 .
8 . A system for compensating thermal drift effects on a spectrophotometer sensor, the system comprising:
a. a spectrophotometer having a processor, a memory, a light source, a sample sensor configured to output a sample signal related to a measurement of a sample,
b. the processor of the spectrophotometer configured by code executing therein to implement the steps of:
i. obtaining, for a range of temperatures, a plurality of non-illuminated measurement values by measuring a black trap with the light source deactivated and a plurality of illuminated measurement values by measuring the black trap illuminated by the light source and storing the plurality of non-illuminated and illuminated measurements within the memory of the processor,
ii. selecting, with a selection module, an initial dark value D o from the plurality of non-illuminated values;
iii. generating from the measured range of values a data model f configured to correlate the output signal of the sensor with a non-illuminated measurement value;
iv. obtaining a sample measurement value D with the light source deactivated and a sample measurement value I with the light source activated;
v. generating a corrected sample measurement according to:
I c =I+f ( D 0 )− f ( D ),
where I c is the corrected sample signal;
vi. outputting the corrected sample measurement.
9 . The system of claim 8 , wherein the data model is formed by performing a linear regression analysis on the non-illuminated and illuminated measurement values across a range of temperatures.
10 . The system of claim 8 , wherein the data model is formed by computing a best-fitting function through the non-illuminated and illuminated measurement values.
11 . The system of claim 8 , where the sample sensor is a component of a spectrophotometer.
12 . The system of claim 8 , wherein the selection step further comprises determining the range of non-illuminated measurement values and determining a mid-range value for D 0 .
13 . The system of claim 8 , wherein the light source is a LED.