IP Library Granted Patent US 9,824,883
Granted Patent B2
US 9,824,883 · App. 14/805,104 · Granted Nov 21, 2017

Substrate processing apparatus, method of manufacturing semiconductor device, and non-transitory computer-readable recording medium

Inventors: Hiroshi Ashihara (Toyama, JP); Arito Ogawa (Toyama, JP)
Assignee: HITACHI KOKUSAI ELECTRIC INC.
H01L21/02271C23C16/4405C23C16/4412C23C16/455H01L21/0228H01L21/02104H01L21/02164H01L21/02211H01L21/02219H01L21/02274H01L21/67017
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Quick Facts
Patent No.
US 9,824,883
App. No.
14/805,104
Granted
Nov 21, 2017
Kind
B2
Abstract

A method of manufacturing a semiconductor device by processing a substrate by supplying a processing space with a gas dispersed in a buffer space disposed at an upstream side of the processing space is provided. The method includes (a) transferring the substrate into the processing space while exhausting a transfer space of the substrate by a first vacuum pump; (b) closing a first valve disposed at a downstream side of the first vacuum pump; (c) supplying the gas into the processing space via the buffer space; and (d) exhausting the buffer space through an exhaust pipe connected to a downstream side of the first valve.

Claims (10)

1. A method of manufacturing a semiconductor device by processing a substrate by supplying a processing space with a processing gas dispersed in a buffer space disposed at an upstream side of the processing space, the method comprising:

(a) transferring the substrate into the processing space while exhausting a transfer space of the substrate by a first vacuum pump;

(b) closing a first valve disposed at a downstream side of the first vacuum pump;

(c) supplying the processing gas into the processing space via the buffer space while exhausting the processing gas from the processing space through a third valve connected to the processing space;

(d) exhausting an inner atmosphere of the processing space through the third valve by supplying a purge gas into the processing space via the buffer space with a second valve connected to the buffer space closed and a supply of the process gas into the processing space suspended; and

(e) exhausting the buffer space through the second valve and an exhaust pipe connected to a downstream side of the first valve after performing (d) by supplying the purge gas into the buffer space with the third valve closed and the second valve open.

2. The method of claim 1 , wherein (c) comprises (c-1) supplying a first processing gas and (c-2) supplying a second processing gas, and (d) and (e) are performed between (c-1) and (c-2).

3. The method of claim 1 , wherein (b) is performed after closing a fourth valve disposed at an upstream side of the first vacuum pump after (a) is performed.

4. The method of claim 1 , wherein (c) is performed while suspending the exhausting of the transfer space.

5. The method of claim 1 , further comprising: exhausting the inner atmosphere of the processing space through the third valve after performing (e) by supplying the purge gas into the processing space with the second valve closed.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 31, 2018
From: HITACHI KOKUSAI ELECTRIC INC.
To: KOKUSAI ELECTRIC CORPORATION
Reel/Frame 047995/0490 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 21, 2015
From: ASHIHARA, HIROSHI; OGAWA, ARITO
To: HITACHI KOKUSAI ELECTRIC INC.
Reel/Frame 036146/0385 →
Priority Claims (1)
JP 2013-271927 · Dec 27, 2013 · national
Continuity (2)
Division 14201017 · Mar 7, 2014
Related Publication 20150340226A1 · Nov 26, 2015