IP Library Granted Patent US 10,355,475
Granted Patent B2
US 10,355,475 · App. 14/827,165 · Granted Jul 16, 2019

GaN overvoltage protection circuit

Inventor: Daniel M. Kinzer (El Segundo, CA)
Assignee: NAVITAS SEMICONDUCTOR, INC.
H02H9/045H01L27/0255H01L27/0285
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Quick Facts
Patent No.
US 10,355,475
App. No.
14/827,165
Granted
Jul 16, 2019
Kind
B2
Abstract

A gallium-nitride based power transistor is coupled to a voltage source that has transient overvoltage conditions exceeding the allowable withstanding voltage of the power transistor. An overvoltage protection circuit is coupled to the power transistor to temporarily turn on the power transistor during the overvoltage condition to protect the power transistor from overvoltage breakdown.

Claims (46)

1. An electronic circuit comprising:

a power transistor having a gate terminal, a source terminal and a drain terminal;

an overvoltage protection circuit coupled to the gate terminal of the power transistor and configured to protect the power transistor from an overvoltage potential between the source terminal and the drain terminal by temporarily changing a voltage on the gate terminal such that a resistance between the source terminal and the drain terminal decreases; and

a driver circuit, configured to selectively change the voltage on the gate terminal such that a resistance between the source terminal and the drain terminal changes in response to an input signal, wherein the driver circuit comprises:

a pull-up switch configured to change the voltage on the gate terminal such that the resistance between the source terminal and the drain terminal decreases, and

a pull-down switch configured to change the voltage on the gate terminal such that the resistance between the source terminal and the drain terminal increases,

wherein the pull-up switch and the pull-down switch have the same conductivity type,

wherein the overvoltage protection circuit is further configured to selectively cause both the pull-up switch and the pull-down switch to simultaneously be substantially non-conductive by respectively applying first and second signals to the pull-up switch and the pull-down switch, wherein the first and second signals have the same polarity.

2. The electronic circuit of claim 1 wherein the power transistor is a GaN-based device and the overvoltage protection circuit comprises a voltage sensing circuit coupled to the drain terminal.

3. The electronic circuit of claim 2 , further comprising a diode coupled between the drain terminal and the gate terminal.

4. The electronic circuit of claim 3 wherein the diode includes a plurality of series connected diodes.

5. The electronic circuit of claim 2 , further comprising a transistor coupled between the drain terminal and the gate terminal.

6. The electronic circuit of claim 2 wherein the voltage sensing circuit starts to conduct current when a voltage potential between the drain terminal and the source terminal goes above a threshold voltage.

7. The electronic circuit of claim 6 wherein the threshold voltage is selected to be higher than an intended use voltage of the power transistor, but lower than a voltage that damages the power transistor.

8. The electronic circuit of claim 6 wherein when above the threshold voltage the voltage sensing circuit conducts enough current to bias the gate terminal of the power transistor such that the power transistor conducts a current between the source terminal and the drain terminal, and an off circuit that keeps the power transistor off is disabled.

9. The electronic circuit of claim 6 wherein when above the threshold voltage the voltage sensing circuit sends a signal to a control system.

10. The electronic circuit of claim 2 , further comprising a GaN diode or a GaN transistor connected to the gate terminal, wherein the GaN diode or GaN transistor has a GaN buffer layer and an AlGaN barrier layer forming a two-dimensional electron gas.

11. The electronic circuit of claim 10 wherein the voltage sensing circuit can conduct more than 10 milliamperes of current without failure or reliability degradation.

12. The electronic circuit of claim 2 wherein the power transistor is a GaN-based high electron mobility transistor.

13. The electronic circuit of claim 2 wherein the power transistor is disposed on a first die and at least a portion of the voltage sensing circuit is disposed on a second die that is co-packaged with the power transistor.

14. The electronic circuit of claim 2 wherein the power transistor and at least one element of the voltage sensing circuit are disposed on a unitary GaN-based die.

15. The electronic circuit of claim 2 wherein the voltage sensing circuit is configured to turn on a drive transistor that turns on the power transistor.

16. The electronic circuit of claim 2 wherein the voltage sensing circuit includes a resistor divider network.

17. The electronic circuit of claim 2 wherein the voltage sensing circuit is configured to activate an output of a comparator in response to detecting the overvoltage potential and the output turns on a pass transistor and disables one or more power transistor gate drive transistors.

18. The electronic circuit of claim 17 wherein after the output of the comparator is activated and the overvoltage potential increases, an operational amplifier is configured to transmit a gate drive signal through the pass transistor to the gate terminal of the power transistor.

19. The electronic circuit of claim 2 wherein the voltage sensing circuit is configured to exceed a reference voltage when a voltage potential between the drain terminal and the source terminal goes above a threshold voltage.

20. The electronic circuit of claim 2 , further comprising a diode coupled to the drain terminal that starts to conduct current when a voltage potential between the drain terminal and the source terminal goes above a threshold voltage and that supplies current to a transistor that transmits an amplified gate drive signal to the gate terminal of the power transistor.

21. The electronic circuit of claim 1 wherein the power transistor is a high side GaN-based transistor in a synchronous power converter.

22. An electronic component comprising:

a package base;

a GaN-based power transistor secured to the package base and including a gate terminal, a drain terminal and a source terminal;

an overvoltage protection circuit coupled to the gate terminal of the power transistor and configured to protect the power transistor from an overvoltage potential between the source terminal and the drain terminal by temporarily changing a voltage on the gate terminal such that a resistance between the source terminal and the drain terminal decreases; and

a driver circuit, configured to selectively change the voltage on the gate terminal such that a resistance between the source terminal and the drain terminal changes in response to an input signal, wherein the driver circuit comprises:

a pull-up switch configured to change the voltage on the gate terminal such that the resistance between the source terminal and the drain terminal decreases, and

a pull-down switch configured to change the voltage on the gate terminal such that the resistance between the source terminal and the drain terminal increases,

wherein the pull-up switch and the pull-down switch have the same conductivity type,

wherein the overvoltage protection circuit is further configured to selectively cause both the pull-up switch and the pull-down switch to simultaneously be substantially non-conductive by respectively applying first and second signals to the pull-up switch and the pull-down switch, wherein the first and second signals have the same polarity; and

an electrically insulative mold compound encapsulating at least a portion of a top surface of the package base, the power transistor and the overvoltage protection circuit.

23. The electronic component of claim 22 wherein the at least one component of the overvoltage protection circuit is a GaN-based diode.

24. A method of protecting a power transistor from an overvoltage condition, the method comprising:

sensing a voltage that exceeds a threshold voltage across a source terminal and a drain terminal of a GaN-based power transistor;

temporarily activating a gate terminal of the power transistor with a voltage sensing circuit to reduce a resistance between the source terminal and the drain terminal;

with a pull-up switch of a driver circuit, changing the voltage on the gate terminal such that the resistance between the source terminal and the drain terminal decreases;

with a pull-down switch of the driver circuit, changing the voltage on the gate terminal such that the resistance between the source terminal and the drain terminal increases,

wherein the pull-up switch and the pull-down switch have the same conductivity type; and

selectively causing both the pull-up switch and the pull-down switch to simultaneously be substantially non-conductive by respectively applying first and second signals to the pull-up switch and the pull-down switch, wherein the first and second signals have a same polarity.

Assignments (3)
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNMENT DOCUMENTS AND THE RECEIVING PARTY'S POSTAL CODE PREVIOUSLY RECORDED AT REEL: 053864 FRAME: 0208. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Mar 9, 2021
From: NAVITAS SEMICONDUCTOR, INC.
To: NAVITAS SEMICONDUCTOR LIMITED
Reel/Frame 056758/0314 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 23, 2020
From: NAVITAS SEMICONDUCTOR, INC.
To: NAVITAS SEMICONDUCTOR LIMITED
Reel/Frame 053864/0208 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 17, 2015
From: KINZER, DANIEL M.
To: NAVITAS SEMICONDUCTOR, INC.
Reel/Frame 036335/0261 →
Continuity (2)
Provisional Application 62038063 · Aug 15, 2014
Related Publication 20160049786A1 · Feb 18, 2016
Cited By (3)
US 12,334,421 US 12,395,093 US 12,438,528