Vertical sense devices in vertical trench MOSFET

1. An electronic circuit comprising:

a split gate vertical trench metal oxide semiconductor field effect transistor (MOSFET) configured for controlling currents of at least one amp;

a current sensing FET configured to provide an electrical signal as an indication of drain to source current of said MOSFET;

a plurality of isolation trenches that are not parallel to gate trenches of said MOSFET,

wherein said plurality of isolation trenches are configured to isolate said MOSFET from said current sensing FET, and

wherein a current sense ratio of said current sensing FET is greater than 15 thousand.

2. The electronic circuit of claim 1 wherein said current sense ratio of said current sensing FET is greater than twenty thousand.

3. The electronic circuit of claim 1 wherein said current sense ratio of said current sensing FET is greater than twenty-nine thousand.

4. The electronic circuit of claim 1 wherein said sense-FET is disposed within said MOSFET.

5. The electronic circuit of claim 1 wherein said sense-FET physically shares trenches with said MOSFET.

6. The electronic circuit of claim 1 wherein said MOSFET comprises a plurality of trench and wherein each said trench comprises at least two electrodes electrically isolated from one another.

7. The electronic circuit of claim 1 wherein a gate and drain of said MOSFET are electrically coupled to a gate and a drain of said current sensing FET.

8. The electronic circuit of claim 1 wherein said isolation trenches form an angle of 40 to 90 degrees to said gate trenches of said MOSFET.

9. The electronic circuit of claim 1 further comprising a surface isolation region between said MOSFET and said current sensing FET, wherein semiconducting materials of a source conduction type of said MOSFET in the mesas of said surface isolation region are left floating.

10. The electronic circuit of claim 8 wherein said surface isolation region is further covered with an insulator.

11. The electronic circuit of claim 8 wherein said surface isolation region is characterized as having a “U” shape.

12. The electronic circuit of claim 1 wherein one side of said current sensing FET is free of said MOSFET.

13. An electronic circuit comprising:

a split gate vertical trench metal oxide semiconductor field effect transistor (MOSFET) configured for controlling currents of at least one amp;

a split gate current sensing FET configured to provide an electrical signal as an indication of drain to source current of said MOSFET,

a plurality of isolation trenches that are not parallel to gate trenches of said MOSFET,

wherein said plurality of isolation trenches are configured to isolate said MOSFET from said current sensing FET, and

wherein said plurality of isolation trenches are formed to about the same depth as said gate trenches, and

wherein a current sense ratio of said current sensing FET is greater than 16 thousand.

14. The electronic circuit of claim 13 wherein said isolation trenches establish a physical barrier between a source region of said MOSFET and a source region of said current sensing FET.

15. The electronic circuit of claim 13 wherein a body to epi junction is at the same depth in both said MOSFET and in said current sensing FET.

16. The electronic circuit of claim 13 wherein at least one trench comprises a first gate of said MOSFET and a second gate of said current sensing FET,

wherein said first gate and said second gate are physically separate.

17. The electronic circuit of claim 13 wherein said current sense ratio varies by not more than +/−0.33 percent across a range of Ids of said MOSFET from 2 amps to 50 amps.