IP Library Granted Patent US 9,663,355
Granted Patent B2
US 9,663,355 · App. 14/835,001 · Granted May 30, 2017

Method and structure for creating cavities with extreme aspect ratios

Inventors: Thoralf Kautzsch (Dresden, DE); Heiko Froehlich (Radebeul, DE); Mirko Vogt (Dresden, DE); Maik Stegemann (Pesterwitz, DE)
Assignee: Infineon Technologies Dresden GmbH
B81C1/00619B81C1/00476G01N27/414G01N27/4473G01N33/48721H01L21/30604H01L29/06B81C1/00047
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Quick Facts
Patent No.
US 9,663,355
App. No.
14/835,001
Granted
May 30, 2017
Kind
B2
Abstract

Embodiments relate to structures, systems and methods for more efficiently and effectively etching sacrificial and other layers in substrates and other structures. In embodiments, a substrate in which a sacrificial layer is to be removed to, e.g., form a cavity comprises an etch dispersion system comprising a trench, channel or other structure in which etch gas or another suitable gas, fluid or substance can flow to penetrate the substrate and remove the sacrificial layer. The trench, channel or other structure can be implemented along with openings or other apertures formed in the substrate, such as proximate one or more edges of the substrate, to even more quickly disperse etch gas or some other substance within the substrate.

Claims (13)

1. An etch dispersion system formed in a substrate and comprising:

at least one dispersion aperture formed in the substrate and configured to provide access to a sacrificial layer of the substrate by an etch material; and

at least one dispersion channel formed in the substrate proximate the sacrificial layer and configured to facilitate dispersion of the etch material within the substrate,

wherein the at least one dispersion aperture and the at least one dispersion channel are formed prior to application of the etch material, and

wherein the at least one dispersion aperture and the at least one dispersion channel are separated by the sacrificial layer.

2. The system of claim 1 , wherein etch material gains access to the at least one dispersion channel by removing a portion of the sacrificial layer between the at least one dispersion aperture and the at least one dispersion channel.

3. The system of claim 1 , wherein the at least one dispersion aperture comprises a plurality of apertures formed proximate a perimeter of the substrate.

4. The system of claim 3 , wherein the at least one dispersion aperture comprises at least one aperture formed in an interior portion of the substrate.

5. The system of claim 1 , wherein the at least one dispersion channel comprises a plurality of channels.

6. The system of claim 5 , wherein at least two of the plurality of channels are coupled with one another.

7. The system of claim 5 , wherein at least two of the plurality of channels are formed in different layers of the substrate.

8. The system of claim 5 , wherein at least two of the plurality of channels are formed at different depths of the substrate.

9. The system of claim 1 , wherein a width of the at least one channel is less than about 300 nanometers.

Assignments (1)
CHANGE OF NAME Recorded Jun 12, 2024
From: INFINEON TECHNOLOGIES DRESDEN GMBH
To: INFINEON TECHNOLOGIES DRESDEN GMBH & CO. KG
Reel/Frame 067699/0648 →
Continuity (2)
Division 14031694 · Sep 19, 2013
Related Publication 20160060106A1 · Mar 3, 2016