IP Library Granted Patent US 9,595,512
Granted Patent B2
US 9,595,512 · App. 14/863,774 · Granted Mar 14, 2017

Passive component integrated with semiconductor device in semiconductor package

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,595,512
App. No.
14/863,774
Granted
Mar 14, 2017
Kind
B2
Abstract

According to one exemplary embodiment, a semiconductor package includes a substrate having lower and upper surfaces. The semiconductor package further includes at least one passive component coupled to first and second conductive pads on the upper surface of the substrate. The semiconductor package further includes at least one semiconductor device coupled to a first conductive pad on the lower surface of the substrate. The at least one semiconductor device has a first electrode for electrical and mechanical connection to a conductive pad external to the semiconductor package. The at least one semiconductor device can have a second electrode electrically and mechanically coupled to the first conductive pad on the lower surface of the substrate.

Claims (27)

1. A semiconductor package comprising:

a substrate having lower and upper surfaces;

at least one passive component coupled to first and second conductive pads and situated on said upper surface of said substrate;

at least one semiconductor device being directly coupled to said lower surface of said substrate, and being electrically coupled to said at least one passive component;

said at least one semiconductor device having a first electrode for electrical and mechanical connection to a conductive pad external to and not disposed on said semiconductor package.

2. The semiconductor package of claim 1 , wherein said at least one semiconductor device has a second electrode electrically and mechanically coupled to said first conductive pad on said lower surface of said substrate.

3. The semiconductor package of claim 2 , wherein said at least one semiconductor device has a third electrode adjacent to said first electrode for electrical and mechanical connection to a conductive pad external to said semiconductor package.

4. The semiconductor package of claim 2 , wherein said first and second electrodes of said at least one semiconductor device are situated on opposing surfaces of said at least one semiconductor device.

5. The semiconductor package of claim 2 , wherein said at least one semiconductor device is a FET, wherein said first electrode is a source electrode of said FET and said second electrode is a drain electrode of said FET.

6. The semiconductor package of claim 1 further comprising an integrated circuit (IC) die situated on said upper surface of said substrate and having a plurality of input/output electrodes.

7. The semiconductor package of claim 6 , wherein each of said input/output electrodes is electrically and mechanically coupled to one of a plurality of conductive pads on said upper surface of said substrate.

8. The semiconductor package of claim 6 further comprising a second conductive pad on said lower surface of said substrate, wherein said second conductive pad on said lower surface of said substrate is coupled to one of said plurality of input/output electrodes of said IC die.

9. The semiconductor package of claim 1 , wherein said at least one passive component is electrically and mechanically coupled to each of said first and second conductive pads by a conductive adhesive.

10. The semiconductor package of claim 1 , wherein said at least one semiconductor device is a GaN device.

11. A semiconductor package comprising:

a substrate having lower and upper surfaces;

a passive component situated on said upper surface of said substrate;

a power transistor being coupled to said lower surface of said substrate through a first conductive pad;

said passive component being electrically coupled to said power transistor in said semiconductor package.

12. The semiconductor package of claim 11 , wherein said power transistor has a first electrode for electrical and mechanical connection to a second conductive pad external to said semiconductor package.

13. The semiconductor package of claim 12 , wherein said power transistor has a second electrode electrically and mechanically coupled to said first conductive pad on said lower surface of said substrate.

14. The semiconductor package of claim 11 further comprising an integrated circuit (IC) die situated on said upper surface of said substrate.

15. The semiconductor package of claim 11 further comprising an integrated circuit (IC) die situated on said upper surface of said substrate and electrically connected to said power transistor.

16. The semiconductor package of claim 15 , wherein said IC die comprises a controller for controlling said power transistor.

17. The semiconductor package of claim 11 , wherein said passive component comprises a bypass capacitor.

18. The semiconductor package of claim 11 , wherein said passive component comprises an output capacitor.

19. The semiconductor package of claim 11 , wherein said power transistor is a GaN device.

Assignments (3)
MERGER AND CHANGE OF NAME Recorded Apr 13, 2016
From: INFINEON TECHNOLOGIES NORTH AMERICA CORP.; INTERNATIONAL RECTIFIER CORPORATION; INTERNATIONAL RECTIFIER CORPORATION
To: INFINEON TECHNOLOGIES AMERICAS CORP.
Reel/Frame 038463/0859 →
MERGER AND CHANGE OF NAME Recorded Feb 29, 2016
From: INTERNATIONAL RECTIFIER CORPORATION; INFINEON TECHNOLOGIES AMERICAS CORP.
To: INFINEON TECHNOLOGIES AMERICAS CORP.
Reel/Frame 037854/0440 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 9, 2015
From: STANDING, MARTIN
To: INTERNATIONAL RECTIFIER CORPORATION
Reel/Frame 036767/0957 →