Measuring device and related methods

1. A measuring device arranged to take measurements of a part using one or more probes which are controlled to contact the part at positions, wherein two or more queues of measurement positions are used to control the position of the one or more probes, the queues comprising:

a first queue comprising positions at which surface touch measurements are to be performed, wherein each surface touch measurement is performed by moving at least one of the one or more probes into contact with a surface of the part; and

a second queue comprising positions at which edge measurements are to be performed, wherein each edge measurement is performed by moving at least one of the one or more probes into contact with an edge region of the part;

and wherein the measuring device is arranged to:

(i) process the first queue, comprising surface touch measurement positions;

(ii) move at least one of the one or more probes to each position listed in the first queue, taking a surface touch measurement at each position to generate surface touch measurement data;

(iii) process the second queue, comprising edge measurement positions; and

(iv) move at least one of the one or more probes to each position listed in the second queue, taking an edge measurement at each position to generate edge measurement data.

2. The measuring device of claim 1 , wherein the measuring device is arranged to perform at least one of steps (ii) and (iv) asynchronously.

3. The measuring device of claim 1 , wherein the measuring device is arranged to output measurement data comprising at least one position for the contact between the at least one probe, and each surface touch measurement, and each edge measurement, following the corresponding measurement.

4. The measuring device of claim 3 , wherein the measuring device is arranged to take surface touch measurements proximate an edge region of the part.

5. The measuring device of claim 3 , wherein the measuring device is arranged to take an edge measurement proximate one or more surface touch measurements.

6. The measuring device of claim 1 , wherein the measuring device is arranged to take an edge measurement corresponding to substantially each surface touch measurement.

7. The measuring device of claim 1 , which is arranged to calculate the positions at which edge measurements are to be performed within the second queue based on the surface touch measurement data.

8. The measuring device of claim 7 , wherein the measuring device is arranged to take fewer surface touch measurements caused by the first queue when compared to the number of edge measurements caused by the second queue.

9. A computer-implemented method for controlling the measuring device of claim 1 , wherein the method comprises:

processing data providing information on a shape of the part to determine a set of suitable surface touch positions, the set of suitable surface touch positions being used to generate the first queue;

instructing the measuring device to move at least one of the one or more probes to each position listed in the first queue, and to take a surface touch measurement at each position;

calculating a set of suitable edge touch positions based on the surface touch measurements, the set of suitable edge touch positions being used to generate the second queue of measurements; and

instructing the measuring device to move the at least one of the one or more probes to each position listed in the second queue, and to take an edge measurement at each position.

10. A computer-implemented method of generating a path for a measuring device to take measurements of a part using one or more probes which are controlled to touch the part at positions, wherein two or more queues of measurement positions are used to control the position of the one or more probes, the queues comprising:

a first queue comprising positions at which surface touch measurements are to be performed, wherein each surface touch measurement is performed by moving at least one of the one or more probes into contact with a surface of the part; and

a second queue comprising positions at which edge measurements are to be performed, wherein each edge measurement is performed by moving at least one of the one or more probes into contact with an edge region of the part;

wherein the method comprises:

(i) processing data providing information on a shape of the part to determine a set of suitable surface touch positions, the set of suitable surface touch positions being used to generate the first queue; and

(ii) processing surface touch measurement data corresponding to the first queue to determine a set of suitable edge touch positions, the set of suitable edge touch positions being used to generate the second queue of measurements.

11. The computer implemented method according to claim 10 , comprising:

comparing at least one of the edge measurements against an expected edge measurement; and

determining if a discrepancy exists between the expected and actual edge measurement.

12. The computer implemented method according to claim 11 , comprising, should a discrepancy be determined, determining positions for a third queue of measurements, wherein the third queue comprises further positions at which surface touch measurements, edge measurements, or both surface touch measurements and edge measurements are to be performed.

13. The computer implemented method according to claim 10 , comprising receiving position data from edge measurements taken at edge touch positions defined in the second queue.

14. The computer implemented method according to claim 13 , comprising:

comparing at least one of the edge measurements against an expected edge measurement; and

determining if a discrepancy exists between the expected and actual edge measurement.

15. The computer implemented method according to claim 14 , comprising, should a discrepancy be determined, determining positions for a third queue of measurements, wherein the third queue comprises further positions at which surface touch measurements, edge measurements, or both surface touch measurements and edge measurements are to be performed.

16. A processing apparatus arranged to generate a path for a measuring device to take measurements of a part using one or more probes which are controlled to touch the part at positions, wherein the measurements comprise:

surface touch measurements, wherein each surface touch measurement is performed by moving at least one of the one or more probes into contact with a surface of the part; and

edge measurements, wherein each edge measurement is performed by moving at least one of the one or more probes into contact with an edge region of the part, and

wherein the positions at which the edge measurements are to be performed are calculated based on positions generated from surface touch measurements; and

wherein the processing apparatus is arranged to generate more than one edge measurement for at least some of the surface touch measurements.

17. The processing apparatus of claim 16 , wherein more than one edge measurement is generated for each of the at least some of the surface touch measurements based on an interpolated shape of the part.