Integrated mass spectrometry systems

1. A mass spectrometry system, comprising:

an ion source;

a module comprising:

an ion trap and an ion detector; and

a module housing that at least partially surrounds the ion trap and the ion detector; and

a vacuum pump comprising a housing having a recess dimensioned to receive the module,

wherein when the module is positioned within the recess of the vacuum pump housing, a portion of the module is surrounded by the vacuum pump housing; and

wherein during operation of the system, when the module is positioned within the recess of the vacuum pump housing:

the ion source, ion trap, ion detector, and vacuum pump are connected along a common gas flow path; and

heat is transferred from the vacuum pump to the module.

2. The system of claim 1 , wherein the ion source is a component of the module.

3. The system of claim 1 , wherein the ion source is positioned external to the module, and wherein the common gas flow path extends through the module housing to connect the ion source to the ion trap, ion detector, and vacuum pump.

4. The system of claim 1 , wherein the module comprises a first thermal transfer surface and the vacuum pump housing comprises a second thermal transfer surface, and during operation of the system, the first thermal transfer surface contacts the second thermal transfer surface to transfer heat from the vacuum pump to the module.

5. The system of claim 1 , wherein the common gas flow path has a volume of 5 cm 3 or less.

6. The system of claim 1 , wherein the common gas flow path has a volume of 3 cm 3 or less.

7. The system of claim 1 , wherein the vacuum pump comprises one or more of a scroll pump comprising interleaved scroll flanges, a roots blower pump, and a rotor/stator pump.

8. The system of claim 7 wherein the vacuum pump comprises a scroll pump comprising interleaved scroll flanges, and wherein a minimum length of the common gas flow between the ion source and the interleaved scroll flanges is 2 cm or less.

9. The system of claim 7 , wherein the vacuum pump comprises a scroll pump comprising an interleaved fixed flange and a movable flange, and wherein the fixed flange is positioned closer to the recess than the movable flange.

10. The system of claim 4 , wherein the module is configured to form a sealed connection with the vacuum pump when the module is received within the recess, and wherein at least some surfaces of contact between the module and the recess are gasketless.

11. The system of claim 4 , wherein the first thermal transfer surface comprises an exterior surface of a cylindrical member.

12. The system of claim 1 , wherein during operation, the vacuum pump is configured to maintain a gas pressure within the common gas flow path of between 10 mTorr and 100 Torr.

13. The system of claim 12 , wherein during operation, the vacuum pump is configured to maintain the gas pressure so that gas pressures among the ion source, the ion trap, and the ion detector differ by less than 100 mTorr.

14. The system of claim 1 , wherein the module comprises a first gas flow path, the vacuum pump comprises a second gas flow path, and wherein the first and second gas flow paths extend along a common axis to form the common gas flow path.

15. The system of claim 14 , wherein the module comprises a sample inlet having an inlet flow path extending in a direction perpendicular to the first gas flow path and connected to the first gas flow path.

16. The system of claim 1 , wherein the module comprises a first gas flow path, the vacuum pump comprises an internal axis of rotation, and wherein the first gas flow path and the axis of rotation extend in different directions.

17. The system of claim 16 , wherein the first gas flow path and the axis of rotation extend in perpendicular directions.

18. The system of claim 1 , wherein the module comprises a plurality of electrical connectors extending from a surface of the module, and wherein during operation, when the module is positioned within the recess, the plurality of electrical connectors engage with a support structure comprising an electronic processor.

19. The system of claim 18 , wherein the electronic processor is configured to control the ion source, the ion trap, the ion detector, and the vacuum pump.

20. The system of claim 4 , wherein:

the module comprises a plurality of electrical connectors extending from a surface of the module that is received within the recess;

the vacuum pump comprises a plurality of corresponding electrical connectors configured to engage with the connectors of the module; and

during operation, when the module is positioned within the recess, the module is electrically connected to an electronic processor through the connectors of the vacuum pump.

21. The system of claim 20 , wherein the electronic processor is configured to control the ion source, the ion trap, the ion detector, and the vacuum pump.

22. The system of claim 4 , wherein the recess and an exterior surface of the module are shaped so that the module can be received within the recess in only one orientation.

23. The system of claim 4 , wherein the recess is dimensioned so that when the module is positioned within the recess, the vacuum pump housing entirely surrounds at least one exterior surface of the module.

24. The system of claim 4 , wherein the recess is dimensioned so that when the module is positioned within the recess, the vacuum pump housing entirely surrounds more than one exterior surface of the module.

25. The system of claim 4 , wherein the recess is dimensioned so that when the module is positioned within the recess, the vacuum pump housing entirely surrounds all but one exterior surface of the module.

26. The system of claim 1 , wherein the recess comprises a cavity, and wherein the module comprises a protruding member dimensioned to be received within the cavity when the module is received within the recess.

27. The system of claim 26 , wherein the protruding member is formed from a metallic material.

28. The system of claim 26 , wherein the recess comprises a plurality of cavities, and wherein the module comprises a plurality of corresponding protruding members dimensioned to be received within the cavities when the module is received within the recess.

29. The system of claim 1 , wherein the module comprises a cavity, and wherein the vacuum pump housing comprises a protruding member dimensioned to be received within the cavity when the module is received within the recess.

30. The system of claim 29 , wherein the module comprises a plurality of cavities, and wherein the vacuum pump housing comprises a plurality of protruding members dimensioned to be received within the cavities when the module is received within the recess.

31. A method, comprising:

introducing a sample into a mass spectrometry system comprising:

an ion source;

a module comprising:

an ion trap and an ion detector; and

a module housing that at least partially surrounds the ion trap and the ion detector; and

a vacuum pump comprising a housing having a recess dimensioned to receive the module,

wherein when the module is positioned within the recess of the vacuum pump housing, a portion of the module is surrounded by the vacuum pump housing; and

wherein during operation of the system, when the module is positioned within the recess of the vacuum pump housing:

the ion source, ion trap, ion detector, and vacuum pump are connected along a common gas flow path; and

heat is transferred from the vacuum pump to the module;

generating ions from the sample using the ion source;

trapping the generated ions within the ion trap;

selectively ejecting the trapped ions from the ion trap and detecting the ejected ions using the ion detector to determine mass spectral information about the sample; and

outputting the mass spectral information to at least one of a display unit and a storage unit.