Test device
A test device includes: a test control unit suitable for detecting a deterioration-expected unit circuit among a plurality of unit circuits included in a test-subject device according to operation histories of the plural unit circuits, and detecting a deterioration degree according to a test output value of the deterioration-expected unit circuit; and an interface unit suitable for routing control operation results and test results between the test control unit and the test-subject device during a test operation.
1. A test device comprising:
a test control unit suitable for detecting a deterioration-expected unit circuit among a plurality of unit circuits included in a test-subject device according to operation histories of the plurality of unit circuits, and detecting a deterioration degree according to a test output value of the deterioration-expected unit circuit; and
an interface unit suitable for routing control operation results and test results between the test control unit and the test-subject device during a test operation,
wherein the test control unit comprises:
a first test driving unit suitable for controlling the test-subject device to perform a normal operation;
a circuit operation detection unit suitable for detecting the operation histories indicating operation states of the respective unit circuits during the normal operation, and outputting a signal corresponding to the deterioration-expected unit circuit among the plurality of unit circuits, which is detected based on the operation histories of the plurality of unit circuits;
a second test driving unit suitable for controlling the deterioration-expected unit circuit among the plurality of unit circuits to perform a circuit operation;
a test comparison unit suitable for comparing a test output value of the deterioration-expected unit circuit to an expected value; and
a deterioration detection unit suitable for detecting deterioration degrees of the deterioration-expected unit circuit according to an output signal of the test comparison unit.
2. The test device of claim 1 , wherein each of the operation histories comprises one or more of number of activations, activation time, and current consumption of the plurality of unit circuits.
3. An operating method of a test device, comprising:
performing a normal operation on a test-subject device at a first test driving unit;
acquiring operation histories of a plurality of unit circuits included in the test-subject device through the normal operation at a circuit operation detection unit, the operation histories indicating operation states of the respective unit circuits during the normal operation;
detecting a deterioration-expected unit circuit among the plurality of unit circuits according to the operation histories of the plurality of unit circuits and outputting a signal corresponding to the deterioration-expected unit circuit among the plurality of unit circuits at the circuit operation detection unit;
controlling the deterioration-expected unit circuit among the plurality of unit circuits to perform a circuit operation at a second test driving unit;
comparing a test data value generated through an operation of the deterioration-expected unit circuit to an expected value at a test comparison unit; and
detecting a deterioration degree of the deterioration-expected unit circuit according to a result of the detecting the deterioration-expected unit circuit at a deterioration detection unit.
4. The operating method of claim 3 , wherein each of the operation histories comprises one or more of a number of activations, activation time, and current consumption of the plurality of unit circuits.