Lithographic apparatus and a method of operating the apparatus
A lithographic apparatus is disclosed that includes a projection system, and a liquid confinement structure configured to at least partly confine immersion liquid to an immersion space defined by the projection system, the liquid confinement structure and a substrate and/or substrate table. Measures are taken in the lithographic apparatus, for example, to reduce the effect of droplets on the final element of the projection system or to substantially avoid such droplet formation.
1. A lithographic apparatus, comprising:
a projection system configured to project a patterned radiation beam through an optically active part of a final optical element of the projection system towards a substrate supported by a substrate table;
a liquid confinement structure to at least partly confine immersion liquid to an immersion space defined by the projection system, the liquid confinement structure and the substrate and/or the substrate table; and
a member, substantially surrounding the final optical element, located between the projection system and the liquid confinement structure and configured to form a passageway between the member and the optically active part of the final optical element, the passageway being in liquid communication via an opening with the immersion space to allow an immersion liquid flow through the passageway to or from the immersion space and the member spaced apart from the liquid confinement structure to allow a further immersion liquid flow between the member and the liquid confinement structure, wherein, in an operation of the lithographic apparatus, the immersion liquid flow and the further immersion liquid flow originate at a same end of the member and flow along respective major surfaces of the member and a facing surface of the member which faces the liquid confinement structure is configured such that immersion liquid has a contact angle of greater than 90° with the facing surface.
2. The lithographic apparatus of claim 1 , wherein the final optical element has an exposure surface through which the patterned radiation beam passes and a bottom surface surrounding the exposure surface, the bottom surface having an outer edge and wherein the passageway extends outwardly of the exposure surface to the outer edge of the surface.
3. The lithographic apparatus of claim 1 , wherein the member is supported by the projection system.
4. The lithographic apparatus of claim 3 , wherein the member is attached to the final optical element.
5. The lithographic apparatus of claim 1 , wherein the passageway is between the member and a non-optically active part of the final optical element through which the patterned beam of radiation does not pass.
6. The lithographic apparatus of claim 1 , wherein the member is supported independently of the projection system and the liquid confinement structure.
7. The lithographic apparatus of claim 1 , wherein the immersion liquid has a contact angle of less than 90° on at least a part of a surface forming the passageway.
8. The lithographic apparatus of claim 1 , further comprising a further opening in liquid communication with the passageway at an end of the passageway opposite to the opening in liquid communication with the immersion space, the further opening being adapted to receive fluid.
9. The lithographic apparatus of claim 1 , wherein the passageway extends to cover at least part of a horizontal surface of the final optical element.
10. A lithographic apparatus comprising:
a projection system configured to project a patterned radiation beam through an optically active part of a final optical element of the projection system towards a substrate supported by a substrate table, the final optical element having an exposure surface through which the patterned radiation beam passes;
a liquid confinement structure configured to at least partly confine immersion liquid to an immersion space between the final optical element and a surface of the substrate and/or the substrate table; and
a member, substantially surrounding the final optical element, located between the projection system and the liquid confinement structure and configured to form a passageway between the member and the optically active part of the final optical element, the passageway being in liquid communication via an opening with the immersion space and extending outwardly, with respect to an optical axis of the projection system, of an edge of the exposure surface of the final optical element and being constructed and configured such that, when liquid is in the immersion space, it is filled with liquid from the immersion space by capillary action, wherein, in an operation of the lithographic apparatus, a liquid flow in the passageway and in a space between the member and the liquid confinement structure originates at a same end of the member and flows along respective major surfaces of the member.
11. The lithographic apparatus of claim 10 , wherein the final optical element has a bottom surface surrounding the exposure surface, the bottom surface having an outer edge and wherein the passageway extends outwardly of the exposure surface to the outer edge of the surface.
12. The lithographic apparatus of claim 10 , wherein the member is supported by the projection system.
13. The lithographic apparatus of claim 10 , wherein the member is supported independently of the projection system and the liquid confinement structure.
14. The lithographic apparatus of claim 10 , wherein the immersion liquid has a contact angle of greater than 90° on a facing surface of the member which faces the liquid confinement structure.
15. The lithographic apparatus of claim 10 , wherein the immersion liquid has a contact angle of less than 90° on at least a part of a surface forming the passageway.
16. The lithographic apparatus of claim 10 , further comprising a further opening in liquid communication with the passageway at an end of the passageway opposite to the opening in liquid communication with the immersion space, the further opening being adapted to receive fluid.
17. The lithographic apparatus of claim 10 , wherein the passageway extends to cover at least part of a horizontal surface of the final optical element.
18. A lithographic apparatus comprising:
a projection system configured to project a patterned radiation beam through an optically active part of a final optical element of the projection system towards a substrate supported by a substrate table, the final optical element having an exposure surface through which the patterned radiation beam passes;
a liquid confinement structure configured to at least partly confine immersion fluid to an immersion space between the final optical element and a surface of the substrate and/or the substrate table; and
a member, substantially surrounding the final optical element, located in a gap between the projection system and the liquid confinement structure and configured to form a passageway between the member and the final optical element, the member being closer to the final optical element than the liquid confinement structure and the passageway configured to receive liquid, wherein, in an operation of the lithographic apparatus, a liquid flow in the passageway and in a space between the member and the liquid confinement structure originates at a same end of the member and flows along respective major surfaces of the member and wherein the member is supported by the projection system.
19. The lithographic apparatus of claim 18 , wherein the passageway is in liquid communication via an opening with the immersion space to allow an immersion fluid flow through the passageway to or from the immersion space.
20. The lithographic apparatus of claim 18 , wherein the passageway extends to cover at least part of a horizontal surface of the final optical element.
21. The lithographic apparatus of claim 18 , wherein a facing surface of the member which faces the liquid confinement structure is configured such that immersion liquid has a contact angle of greater than 90° with the facing surface.