Method of smoothing solid surface with gas cluster ion beam and solid surface smoothing apparatus
A method of smoothing a solid surface with a gas cluster ion beam includes irradiating the solid surface with the gas cluster ion beam. The irradiating includes, when scratches which can be likened to a line-and-space pattern structure with widths and heights on the order of a submicrometer to micrometer are present on the solid surface, a process of emitting the gas cluster ion beam so as to expose substances, which remain on side-walls of the scratches due to lateral transferal caused by collisions with gas clusters, to other gas clusters, and the gas cluster ion beam diverges non-concentrically and/or non-uniformly.
1. A method of smoothing a solid surface with a single gas cluster ion beam emitted from a single emitter, the method comprising irradiating the solid surface with the single gas cluster ion beam,
wherein:
scratches shaped like a line-and-space pattern structure with widths and heights on an order of a submicrometer to micrometer are present on the solid surface;
the single gas cluster ion beam diverges at least one of non-concentrically and non-uniformly; and
the irradiating comprises:
transferring to side-walls of the scratches, only materials of the solid surface by collisions with gas clusters included in the single gas cluster ion beam; and
colliding other gas clusters, which are included in the single gas cluster ion beam, with the materials transferred through the transferring.
2. The method according to claim 1 , wherein:
the solid is moved back and forth in each of two directions which are normal to each other;
the solid is moved back and forth at a rate of over 1 Hz in one direction of said two directions; and
the solid is moved back and forth at a rate of over 0.02 Hz in another direction of said two directions.
3. The method according to claim 1 , wherein:
the solid is rotated at a rate of over 60 revolutions per minute, and
irradiation of the single gas cluster ion beam is performed by emitting the single gas cluster ion beam with an irradiation angle between the single gas cluster ion beam and a normal to the solid surface irradiated with the single gas cluster ion beam being not equal to 0°.