IP Library Granted Patent US 9,984,901
Granted Patent B2
US 9,984,901 · App. 14/933,225 · Granted May 29, 2018

Method for making a microelectronic assembly having conductive elements

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Quick Facts
Patent No.
US 9,984,901
App. No.
14/933,225
Granted
May 29, 2018
Kind
B2
Abstract

A method of making a microelectronic assembly can include molding a dielectric material around at least two conductive elements which project above a height of a substrate having a microelectronic element mounted thereon, so that remote surfaces of the conductive elements remain accessible and exposed within openings extending from an exterior surface of the molded dielectric material. The remote surfaces can be disposed at heights from said surface of said substrate which are lower or higher than a height of the exterior surface of the molded dielectric material from the substrate surface. The conductive elements can be arranged to simultaneously carry first and second different electric potentials: e.g., power, ground or signal potentials.

Claims (27)

1. A method of making a microelectronic assembly comprising:

providing a microelectronic package including a substrate, a microelectronic element overlying said substrate, at least two conductive posts projecting from a first surface of said substrate, conductive pads, and terminals extending from a second surface of said substrate opposite said first surface, said at least two conductive posts each having a base adjacent said first surface of the substrate, a tip surface remote from said base and said first surface of said substrate, and an edge surface extending abruptly away from said tip;

compressing said at least two conductive posts so that each of said tips lie in a common plane and present at least substantially planar surfaces; and

molding an encapsulant material around said at least two conductive posts for supporting said microelectronic package and so that said remote, substantially planar surfaces of said at least two conductive posts remain accessible and exposed at an exterior surface of said molded encapsulant material,

wherein during said compressing said at least two conductive posts, said terminals are joined to said conductive pads.

2. The method as claimed in claim 1 , wherein said terminals further comprise at least two second conductive posts projecting from a second surface of said substrate, said at least two second conductive posts having surfaces remote from said second surface of said substrate.

3. The method as claimed in claim 2 , further comprising compressing said at least two second conductive posts so that said remote surfaces of said at least two second conductive posts lie in a common plane and present at least substantially planar surfaces.

4. The method as claimed in claim 1 , wherein said substrate is flexible.

5. The method as claimed in claim 1 , wherein said substrate comprises a dielectric material.

6. The method as claimed in claim 1 , wherein said microelectronic element is electrically interconnected with said substrate.

7. The method as claimed in claim 1 , wherein said microelectronic element is a semiconductor chip having a front face with contacts and a back face remote therefrom.

8. The method as claimed in claim 7 , wherein the front face of said semiconductor chip faces said substrate.

9. The method as claimed in claim 7 , wherein the front face of said semiconductor chip faces away from said substrate and the back face of said semiconductor chip faces said substrate.

10. The method as claimed in claim 1 , wherein said microelectronic element is electrically interconnected with said substrate by conductive wiring.

11. The method as claimed in claim 1 , further comprising a compliant layer disposed between said microelectronic element and said substrate.

12. The method as claimed in claim 1 , wherein said substrate comprises a plurality of dielectric layers, and wherein a plurality of layers of conductive traces extend through said substrate.

13. The method as claimed in claim 1 , further comprising making a second microelectronic package using the steps of claim 1 , and stacking said second microelectronic package atop said first microelectronic package, wherein said first and second microelectronic packages are electrically interconnected together through said at least two conductive posts.

14. The method of claim 1 , wherein said terminals further include conductive masses, and wherein said mold is heated to transform said conductive masses to an at least partially molten state for wetting said conducive masses to said conductive pads.

15. The method of claim 1 , wherein said mold further includes recesses for receiving said conductive masses and said conductive masses are reflowed prior to joining said conductive masses with said conductive pads.

16. The method of claim 1 , wherein during compressing said at least two conductive posts, said terminals are also compressed so that outer surfaces of said terminals lie in a common plane and present at least substantially planar surfaces.

17. A method of making a microelectronic assembly comprising:

providing a mold having an internal cavity;

placing a microelectronic package into said cavity of said mold, said microelectronic package including a substrate, a microelectronic element overlying said substrate, at least one conductive post projecting from a first surface of said substrate, said at least one conductive post having a surface remote from said first surface of said substrate, and conductive pads and terminals extending from a second surface of said substrate opposite said first surface;

utilizing said mold for compressing said at least one conductive post so that said remote surface lies in a plane and presents an at least substantially planar surface and so that said terminals are joined with said conductive pads; and

after the compressing and while said mold remains in contact with said remote surface of said at least one conductive post, introducing an encapsulant material into said cavity of said mold for encapsulating said microelectronic element and surrounding said at least one conductive post, wherein said mold remains in contact with said remote surface of said at least one conductive posts during the introducing said encapsulant material so that after said introducing an encapsulant material, said remote, substantially planar surface of said at least one conductive post remains accessible and exposed at an exterior surface of said encapsulant material and said terminals remain accessible and exposed at said second surface of said substrate.

18. The method as claimed in claim 17 , wherein said substrate is a flexible dielectric substrate.

19. The method of claim 17 , wherein surfaces of said terminals in contact with said mold also lie in a common plane and present at least substantially planar surfaces.

Assignments (6)
CHANGE OF NAME Recorded Nov 21, 2025
From: TESSERA, INC.
To: TESSERA LLC
Reel/Frame 073657/0979 →
CHANGE OF NAME Recorded Nov 21, 2025
From: TESSERA LLC
To: ADEIA SEMICONDUCTOR SOLUTIONS LLC
Reel/Frame 073658/0661 →
RELEASE OF SECURITY INTEREST Recorded Jun 11, 2020
From: ROYAL BANK OF CANADA
To: TESSERA, INC.; INVENSAS BONDING TECHNOLOGIES, INC. (F/K/A ZIPTRONIX, INC.); FOTONATION CORPORATION (F/K/A DIGITALOPTICS CORPORATION AND F/K/A DIGITALOPTICS CORPORATION MEMS); INVENSAS CORPORATION; TESSERA ADVANCED TECHNOLOGIES, INC; DTS, INC.; DTS LLC; PHORUS, INC.; IBIQUITY DIGITAL CORPORATION
Reel/Frame 052920/0001 →
SECURITY INTEREST Recorded Jun 1, 2020
From: ROVI SOLUTIONS CORPORATION; ROVI TECHNOLOGIES CORPORATION; ROVI GUIDES, INC.; TIVO SOLUTIONS INC.; VEVEO, INC.; INVENSAS CORPORATION; INVENSAS BONDING TECHNOLOGIES, INC.; TESSERA, INC.; TESSERA ADVANCED TECHNOLOGIES, INC.; DTS, INC.; PHORUS, INC.; IBIQUITY DIGITAL CORPORATION
To: BANK OF AMERICA, N.A.
Reel/Frame 053468/0001 →
SECURITY INTEREST Recorded Dec 2, 2016
From: INVENSAS CORPORATION; TESSERA, INC.; TESSERA ADVANCED TECHNOLOGIES, INC.; ZIPTRONIX, INC.; DIGITALOPTICS CORPORATION; DIGITALOPTICS CORPORATION MEMS; DTS, LLC; DTS, INC.; PHORUS, INC.; IBIQUITY DIGITAL CORPORATION
To: ROYAL BANK OF CANADA, AS COLLATERAL AGENT
Reel/Frame 040797/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 10, 2015
From: HABA, BELGACEM; KANG, TECK-GYU; MOHAMMED, ILYAS; CHAU, ELLIS
To: TESSERA, INC.
Reel/Frame 037002/0031 →