Solid-state image sensor and camera
A solid-state image sensor is provided. The sensor includes a substrate having a light-receiving surface. The substrate includes a charge accumulation portion that forms part of a photoelectric conversion element, a charge holding portion arranged at a position deeper than the charge accumulation portion from the light-receiving surface, and a first transfer portion configured to transfer charges generated by the photoelectric conversion element to the charge holding portion along a depth direction of the substrate. A distance between the charge holding portion and the light-receiving surface is not less than 4 μm.
1. A solid-state image sensor comprising:
a substrate having a light-receiving surface;
a charge accumulation portion that forms part of a photoelectric conversion element;
a charge holding portion and a charge detection unit which are arranged at positions deeper than the charge accumulation portion from the light-receiving surface;
a first transfer portion configured to transfer charges generated by the photoelectric conversion element to the charge holding portion along a depth direction of the substrate; and
a second transfer portion configured to transfer the charges held by the charge holding portion to the charge detection unit,
wherein in a planar view of the light-receiving surface, the charge detection unit is arranged at positions overlapping the charge holding portion, and
in the depth direction of the substrate, the charge accumulation portion is arranged at a region shallower than a first depth from the light-receiving surface, either of the charge holding portion and the charge detection unit is arranged at a region deeper than a second depth from the light-receiving surface, and the other of the charge holding portion and the charge detection unit is arranged at the region between the first depth and the second depth.
2. The sensor according to claim 1 , wherein the distance between the charge holding portion and the light-receiving surface is not less than 8 μm.
3. The sensor according to claim 1 , further comprising a signal amplification unit configured to amplify a signal based on the potential of the charge detection unit and output the signal.
4. The sensor according to claim 1 , wherein the depth of the charge detection unit from the light-receiving surface is greater than the depth of the charge holding portion from the light-receiving surface.
5. The sensor according to claim 1 , wherein the charge detection unit is arranged at the depth from the light-receiving surface between the depth at which the charge accumulation portion is arranged and the depth at which the charge holding portion is arranged.
6. The sensor according to claim 3 , wherein in a planar view of the light-receiving surface, the charge holding portion and the charge detection unit are arranged at positions overlapping the charge accumulation portion.
7. The sensor according to claim 1 , wherein the first transfer portion transfers the charges in the vertical direction with respect to the light-receiving surface.
8. The sensor according to claim 1 , wherein the second transfer portion transfers the charges in the vertical direction with respect to the light-receiving surface.
9. The sensor according to claim 1 , further comprising, above the light-receiving surface, an optical filter configured to cover the charge accumulation portion.
10. The sensor according to claim 9 , wherein the optical filter comprises an infrared cut filter.
11. The sensor according to claim 9 , wherein the optical filter blocks light with a wavelength longer than a first wavelength, and
light with a wavelength shorter than the first wavelength is absorbed by the substrate in a region from the light-receiving surface to the charge holding portion.
12. The sensor according to claim 1 , wherein an element isolation layer is arranged on a side surface of the charge accumulation portion.
13. The sensor according to claim 1 , wherein the substrate further comprises a light-shielding layer at a position overlapping the charge holding portion in a planar view of the light-receiving surface, the light-shielding layer being between the charge accumulation portion and the charge holding portion.
14. The sensor according to claim 1 , further comprising, at a position overlapping the charge holding portion in a planar view of the light-receiving surface, a light-shielding layer configured to cover the light-receiving surface.
15. A camera comprising:
a solid-state image sensor according to claim 1 ; and
a signal processing unit configured to process a signal obtained by the solid-state image sensor.
16. The sensor according to claim 1 , wherein a distance between the charge holding portion and the light-receiving surface is not less than 4 μm.
17. The sensor according to claim 1 , further comprising an element isolation layer in contact with the first transfer portion.
18. A solid-state image sensor comprising:
a substrate having a light-receiving surface;
a charge accumulation portion that forms part of a photoelectric conversion element;
a charge holding portion arranged at a position deeper than the charge accumulation portion from the light-receiving surface;
a charge detection unit;
a first transfer portion configured to transfer charges generated by the photoelectric conversion element to the charge holding portion along a depth direction of the substrate; and
a second transfer portion configured to transfer the charges in the charge holding portion to the charge detection unit,
wherein the charge detection unit is arranged on a side of the light-receiving surface of the substrate.
19. The sensor according to claim 18 , wherein in a planar view of the light-receiving surface, the charge accumulation portion and the charge detection unit are arranged at positions overlapping the charge holding portion.
20. The sensor according to claim 18 , further comprising a signal amplification unit configured to amplify a signal based on the potential of the charge detection unit and output the signal.
21. The sensor according to claim 18 , wherein in a planar view of the light-receiving surface, the charge detection unit is arranged at positions overlapping the charge holding portion.
22. The sensor according to claim 18 , wherein the first transfer portion transfers the charges in the vertical direction with respect to the light-receiving surface.
23. The sensor according to claim 18 , wherein the second transfer portion transfers the charges in the vertical direction with respect to the light-receiving surface.
24. The sensor according to claim 18 , wherein an element isolation layer is arranged on a side surface of the charge accumulation portion.
25. The sensor according to claim 18 , further comprising, at a position overlapping the charge holding portion in a planar view of the light-receiving surface, a light-shielding layer configured to cover the light-receiving surface.
26. A camera comprising:
a solid-state image sensor according to claim 18 ; and
a signal processing unit configured to process a signal obtained by the solid-state image sensor.