IP Library Granted Patent US 9,899,442
Granted Patent B2
US 9,899,442 · App. 14/945,292 · Granted Feb 20, 2018

Image sensor device

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,899,442
App. No.
14/945,292
Granted
Feb 20, 2018
Kind
B2
Abstract

An image sensor device, as well as methods therefor, is disclosed. This image sensor device includes a substrate having bond pads. The substrate has a through substrate channel defined therein extending between a front side surface and a back side surface thereof. The front side surface is associated with an optically-activatable surface. The bond pads are located at or proximal to the front side surface aligned for access via the through substrate channel. Wire bond wires are bonded to the bond pads at first ends thereof extending away from the bond pads with second ends of the wire bond wires located outside of an opening of the channel at the back side surface. A molding layer is disposed along the back side surface and in the through substrate channel. A redistribution layer is in contact with the molding layer and interconnected to the second ends of the wire bond wires.

Claims (40)

1. An image sensor device, comprising:

a substrate having bond pads;

the substrate having a front side surface and a back side surface opposite the front side surface, wherein the front side surface is associated with an optically-activatable surface;

the substrate having a through substrate channel defined therein extending between the front side surface and the back side surface;

the bond pads located at or proximal to the front side surface of the substrate aligned for access to the through substrate channel with widths of the bond pads in the through substrate channel;

wire bond wires bonded to the bond pads at first ends thereof;

the wire bond wires extending away from the bond pads;

portions of the wire bond wires being in the through substrate channel;

second ends of the wire bond wires located outside of an opening of the through substrate channel beyond the back side surface of the substrate;

a molding layer disposed along the back side surface of the substrate and in the through substrate channel; and

a redistribution layer in contact with the molding layer and interconnected to the second ends of the wire bond wires.

2. The image sensor device according to claim 1 , wherein the substrate is for dicing at least one first die therefrom, the image sensor device further comprising:

a second die coupled to the back side surface of the substrate to provide the image sensor device as a single package.

3. The image sensor device according to claim 2 , wherein the first die and the second die respectively are an image sensor die and either a controller or image processor die.

4. The image sensor device according to claim 1 , wherein the redistribution layer is not in direct contact with the substrate.

5. The image sensor device according to claim 2 , wherein the substrate has defined therein a cavity for receipt of the second die.

6. The image sensor device according to claim 2 , wherein the substrate has a low profile for coupling of the second die to the back side surface of the substrate.

7. The image sensor device according to claim 1 , wherein the substrate having a first die and a second die, the image sensor device further comprising a cover glass coupled to cover both the first die and the second die to provide the image sensor device as a single package.

8. An image sensor device, comprising:

an image sensor;

a substrate coupled to the image sensor;

the substrate having a front side surface and a back side surface opposite the front side surface;

the substrate having a through substrate channel defined therein at least extending between the front side surface and the back side surface;

bond pads located at or proximal to the front side surface of the substrate aligned for access to the through substrate channel with widths of the bond pads in the through substrate channel;

wire bond wires bonded to the bond pads at first ends thereof;

the wire bond wires extending away from the bond pads;

portions of the wire bond wires being in the through substrate channel;

second ends of the wire bond wires located outside of an opening of the through substrate channel beyond the back side surface of the substrate;

a molding layer disposed along the back side surface of the substrate and in the through substrate channel; and

a redistribution layer in contact with the molding layer and interconnected to the second ends of the wire bond wires.

9. The image sensor device according to claim 8 , wherein the image sensor and the substrate respectively have thereon a first dielectric layer and a second dielectric layer bonded to one another for coupling the image sensor and the substrate.

10. The image sensor device according to claim 9 , wherein the bond pads are at least partially disposed in the first dielectric layer.

11. The image sensor device according to claim 9 , wherein the bond pads are at least partially disposed in the second dielectric layer.

12. The image sensor device according to claim 9 , wherein:

the substrate comprises an image processor die; and

the image sensor is a back side image sensor.

13. The image sensor device according to claim 9 , wherein:

the substrate comprises a carrier; and

the image sensor is a back side image sensor.

14. The image sensor device according to claim 9 , wherein the redistribution layer is not in direct contact with the substrate.

Assignments (6)
CHANGE OF NAME Recorded Dec 12, 2024
From: INVENSAS LLC
To: ADEIA SEMICONDUCTOR TECHNOLOGIES LLC
Reel/Frame 069604/0051 →
CERTIFICATE OF CONVERSION & CHANGE OF NAME Recorded Apr 4, 2022
From: INVENSAS CORPORATION
To: INVENSAS LLC
Reel/Frame 059581/0435 →
RELEASE OF SECURITY INTEREST Recorded Jun 11, 2020
From: ROYAL BANK OF CANADA
To: TESSERA, INC.; INVENSAS BONDING TECHNOLOGIES, INC. (F/K/A ZIPTRONIX, INC.); FOTONATION CORPORATION (F/K/A DIGITALOPTICS CORPORATION AND F/K/A DIGITALOPTICS CORPORATION MEMS); INVENSAS CORPORATION; TESSERA ADVANCED TECHNOLOGIES, INC; DTS, INC.; DTS LLC; PHORUS, INC.; IBIQUITY DIGITAL CORPORATION
Reel/Frame 052920/0001 →
SECURITY INTEREST Recorded Jun 1, 2020
From: ROVI SOLUTIONS CORPORATION; ROVI TECHNOLOGIES CORPORATION; ROVI GUIDES, INC.; TIVO SOLUTIONS INC.; VEVEO, INC.; INVENSAS CORPORATION; INVENSAS BONDING TECHNOLOGIES, INC.; TESSERA, INC.; TESSERA ADVANCED TECHNOLOGIES, INC.; DTS, INC.; PHORUS, INC.; IBIQUITY DIGITAL CORPORATION
To: BANK OF AMERICA, N.A.
Reel/Frame 053468/0001 →
SECURITY INTEREST Recorded Dec 2, 2016
From: INVENSAS CORPORATION; TESSERA, INC.; TESSERA ADVANCED TECHNOLOGIES, INC.; ZIPTRONIX, INC.; DIGITALOPTICS CORPORATION; DIGITALOPTICS CORPORATION MEMS; DTS, LLC; DTS, INC.; PHORUS, INC.; IBIQUITY DIGITAL CORPORATION
To: ROYAL BANK OF CANADA, AS COLLATERAL AGENT
Reel/Frame 040797/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 18, 2015
From: KATKAR, RAJESH
To: INVENSAS CORPORATION
Reel/Frame 037077/0660 →