X-ray filter for x-ray powder diffraction
Technologies are described for apparatus, methods and systems effective for filtering. The filters may comprise a first plate. The first plate may include an x-ray absorbing material and walls defining first slits. The first slits may include arc shaped openings through the first plate. The walls of the first plate may be configured to absorb at least some of first x-rays when the first x-rays are incident on the x-ray absorbing material, and to output second x-rays. The filters may comprise a second plate spaced from the first plate. The second plate may include the x-ray absorbing material and walls defining second slits. The second slits may include arc shaped openings through the second plate. The walls of the second plate may be configured to absorb at least some of second x-rays and to output third x-rays.
1. A filter comprising:
a first plate, wherein the first plate includes a center, an x-ray absorbing material and walls defining first slits, wherein the first slits include arc shaped openings through the first plate starting from the center and wherein the arc shaped openings arc radially from the center, form a spiral, and are staggered when viewed radially from respective centers of respective plates, the walls of the first plate configured to absorb at least some of first x-rays when the first x-rays are incident on the x-ray absorbing material and to output second x-rays; and
a second plate spaced from the first plate, wherein the second plate includes a center, the x-ray absorbing material and walls defining second slits, wherein the second slits include arc shaped openings through the second plate starting from the center and wherein the arc shaped openings arc radially from the center, form a spiral, and are staggered when viewed radially from respective centers of respective plates, the walls of the second plate configured to absorb at least some of second x-rays and to output third x-rays.
2. The filter of claim 1 , wherein the first and second slits range in width from about 1 micron to about 500 microns.
3. The filter of claim 1 , wherein radial distances of the first and second slits continuously increase over angular distances and radial distances between first and second slits continuously increase over angular distances when viewed radially from respective centers of respective plates each time the spiral completes 360 degrees around the first and second plates.
4. The filter of claim 1 , wherein the first plate includes an aligned first stack of a plurality of alternating third plates and fourth plates stacked together surface to surface, wherein the third plates include the x-ray absorbing material and
third slits and the fourth slits include the x-ray absorbing material and fourth slits, and the alternating third and fourth slits define the first slits; and
the second plate includes an aligned second stack of a plurality of alternating fifth plates and sixth plates stacked together surface to surface, wherein the fifth plates include the x-ray absorbing material and fifth slits and the sixth plates include the x-ray absorbing material and sixth slits, and the alternating fifth and sixth slits define the second slits.
5. The filter of claim 4 , wherein the third and fourth slits are staggered.
6. The filter of claim 1 , wherein the first plate and the second plate are aligned with a distance between the first plate and the second plate of about 5 mm to about 50 mm.
7. The filter of claim 1 , wherein the first plate and the second plate are aligned with a distance between the first plate and the second plate of about 20 mm.
8. The filter of claim 1 , wherein the first and second plates include a high electron density material.
9. The filter of claim 1 , wherein the first and second plates include tungsten, gold, silver, palladium, rhodium, osmium, platinum, tantalum, lead, molybdenum, or iridium, or combinations thereof.
10. The filter of claim 1 , wherein at least one of the first or second slits are filled with an x-ray transparent material.
11. The filter of claim 10 , wherein the transparent material is silicon.
12. A method to implement a filter, the method comprising:
aligning a first plate spaced from a second plate, the first plate including a center, an x-ray absorbing material and walls defining first slits, wherein the first slits include arc shaped openings through the first plate starting from the center and wherein the arc shaped openings arc radially from the center, form a spiral, and are staggered when viewed radially from respective centers of respective plates, the walls of the first plate configured to absorb at least some of first x-rays when the first x-rays are incident on the x-ray absorbing material, and to output second x-rays, the second plate including a center, the x-ray absorbing material and walls defining second slits, wherein the second slits include arc shaped openings through the second plate starting from the center and wherein the arc shaped openings arc radially from the center, form a spiral, and are staggered when viewed radially from respective centers of respective plates, the walls of the second plate configured to absorb at least some of second x-rays and to output third x-rays positioning the aligned first and second plates a distance from a sample; and
directing fourth x-rays at the sample, such that at least some of fourth x-rays are diffracted by the sample to produce the first x-rays.
13. A method of claim 12 , wherein the first and second slits include arc shaped openings and the first and second slits range in width from about 1 micron to about 500 microns.
14. The method of claim 12 , wherein radial distances of the first and second slits continuously increase over angular distances and radial distances between first and second slits continuously increase over angular distances when viewed radially from respective centers of respective plates each time the spiral completes 360 degrees around the first and second plates.
15. The method of claim 12 , wherein the first and second plates include tungsten, gold, silver, palladium, rhodium, osmium, platinum, tantalum, lead, molybdenum, or iridium, or combinations thereof.
16. The method of claim 12 , wherein the first plate and the second plate are aligned with a distance between the first plate and the second plate of about 5 mm to about 50 mm.
17. The method of claim 12 , wherein the first plate and the second plate are aligned with a distance between the first plate and the second plate of about 20 mm.
18. The method of claim 12 , wherein the distance from the sample to the first plate is from about 25 mm to about 175 mm.
19. The method of claim 12 , wherein the distance from the sample to the first plate is about 100 mm.
20. A filter system comprising:
a first plate, wherein the first plate includes a center, an x-ray absorbing material and walls defining first slits, wherein the first slits include arc shaped openings through the first plate starting from the center and wherein the arc shaped openings arc radially from the center, form a spiral, and are staggered when viewed radially from respective centers of respective plates, the walls of the first plate configured to absorb at least some of first x-rays when the first x-rays are incident on the x-ray absorbing material, and to output second x-rays;
a second plate spaced from the first plate, wherein the second plate includes a center, the x-ray absorbing material and walls defining second slits, wherein the second slits include arc shaped openings through the second plate starting from the center and wherein the arc shaped openings arc radially from the center, form a spiral, and are staggered when viewed radially from respective centers of respective plates, the walls of the second plate configured to absorb at least some of second x-rays and to output third x-rays;
an area detector positioned so as to receive the third x-rays; and
an x-ray source configured to direct fourth x-rays at a sample, such that at least some of fourth x-rays are diffracted by the sample to produce the first x-rays.