Memory circuit using dynamic random access memory arrays
A memory circuit using dynamic random access memory (DRAM) arrays. The DRAM arrays can be configured as CAMs or RAMs on the same die, with the control circuitry for performing comparisons located outside of the DRAM arrays. In addition, DRAM arrays can be configured for secure authentication where, after the first authentication performed with a non-volatile secure element, subsequent authentications can be performed by the DRAM array. Input patterns can be loaded into a DRAM array by loading logic state ones (“1”) into each of the plurality of input data bit lines in each of the columns in the DRAM array and shunting one or more of the plurality of input data bit lines in the DRAM array corresponding to logic state zeroes (“0”) in the input pattern.
1. A memory circuit comprising:
a first die;
a first dynamic random access memory (DRAM) array configured as a content addressable memory (CAM) located on the first die, wherein the CAM comprises a first block of a plurality of DRAM cells configured for storing a first reference pattern, a second block of a plurality of DRAM cells configured for receiving a first input pattern, a third block of a plurality of DRAM cells configured for storing a second reference pattern, and a fourth block of a plurality of DRAM cells configured for receiving the first input pattern, wherein the first reference pattern comprises a first reference authentication cryptographic key stored in the first block of a plurality of DRAM cells in the CAM, the second reference pattern comprises a second reference authentication cryptographic key stored in the third block of a plurality of DRAM cells in the CAM, and the first input pattern comprises an input authentication cryptographic key;
a second DRAM array configured as a random access memory (RAM) located on the first die, wherein the RAM comprises a fifth block of a plurality of DRAM cells configured for storing a third reference pattern;
a first compare circuit for comparing the first reference pattern in the first block of a plurality of DRAM cells to the first input pattern in the second block of a plurality of DRAM cells during a first authentication cycle; and
a second compare circuit for comparing the second reference pattern in the third block of a plurality of DRAM cells to the first input pattern in the fourth block of a plurality of DRAM cells during the first authentication cycle.
2. The memory circuit of claim 1 , wherein the first and second compare circuits are located outside of the first DRAM array and the second DRAM array.
3. The memory circuit of claim 2 , further comprising a second die separate from the first die, wherein the first and second compare circuits are located on the second die.
4. The memory circuit of claim 3 , wherein the first die and the second die are assembled using three-dimensional packaging.
5. The memory circuit of claim 2 , wherein the first and second compare circuits comprise a plurality of comparators.
6. The memory circuit of claim 1 , wherein the CAM is a two-state CAM (BCAM).
7. The memory circuit of claim 1 , wherein the CAM is a three-state CAM (TCAM).