IP Library Granted Patent US 10,170,719
Granted Patent B2
US 10,170,719 · App. 14/964,876 · Granted Jan 1, 2019

Organic monolayer passivation and silicon heterojunction photovoltaic devices using the same

Inventors: Ali Afzali-Ardakani (Ossining, NY); Bahman Hekmatshoartabari (White Plains, NY); Davood Shahrjerdi (White Plains, NY)
Assignee: INTERNATIONAL BUSINESS MACHINES CORPROATION
H01L51/4213H01L51/005H01L51/0017H01L51/441Y02E10/549
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Quick Facts
Patent No.
US 10,170,719
App. No.
14/964,876
Granted
Jan 1, 2019
Kind
B2
Abstract

A method for inorganic surface passivation in a photovoltaic device includes etching a native oxide over an inorganic substrate, the inorganic substrate having a surface; and forming an organic monolayer on the surface of the inorganic substrate to form a heterojunction, the organic monolayer having the following formula: ˜X—Y, wherein X is an oxygen or a sulfur; Y is an alkyl chain, an alkenyl chain, or an alkynyl chain; and X covalently bonds to the surface of the inorganic substrate by a covalent bond.

Claims (25)

1. A method for inorganic passivation in a photovoltaic device, the method comprising:

etching a native oxide over an inorganic substrate, the inorganic substrate having a surface;

forming an organic monolayer directly on the surface of the inorganic substrate to form a heterojunction, the organic monolayer having the following formula:

˜X—Y,

wherein X is an oxygen or a sulfur; Y is an alkyl chain, an alkenyl chain, or an alkynyl chain; and X covalently bonds to the surface of the inorganic substrate by a covalent bond;

depositing an organic semiconductor material directly on a surface of the organic monolayer, the organic semiconductor material being substantially free of doping; and

disposing a conductive electrode directly on at least on a portion of the organic semiconductor material;

wherein the organic semiconductor material comprises an electron blocking or a hole transport material when the inorganic substrate comprises an n-type inorganic material, and the organic semiconductor material comprises a hole blocking or electron transport material when the inorganic substrate comprises a p-type inorganic material.

2. The method of claim 1 , wherein the inorganic substrate comprises silicon.

3. The method of claim 1 , wherein the etching of the native oxide comprises etching with hydrofluoric acid (HF).

4. The method of claim 1 , wherein Y has about 4 to about 21 carbons.

5. The method of claim 1 , wherein the organic monolayer has a thickness in a range from about 0.5 nanometers (nm) to about 5 nm.

6. The method of claim 1 , wherein forming the organic monolayer on the surface of the inorganic substrate further comprises heating the inorganic substrate in the presence of a compound having the following formula: HX—Y.

7. The method of claim 6 , wherein the heating is performed at a temperature in a range from about 90 to about 150° Celsius (° C.).

8. A method for inorganic passivation in a photovoltaic device, the method comprising:

etching a native oxide over an inorganic substrate, the inorganic substrate comprising silicon and having a surface;

forming an organic monolayer directly on the surface of the inorganic substrate to form a silicon heterojunction, the organic monolayer having the following formula:

˜X—Y—Z,

wherein X is an oxygen or a sulfur; Y is an alkyl chain, an alkenyl chain, or an alkynyl chain; Z is a methyl group or an epoxy group; and X covalently bonds to the surface of the inorganic substrate by a silicon-oxygen bond or a silicon-sulfur bond;

depositing an organic semiconductor material directly on a surface of the organic monolayer, the organic semiconductor material being substantially free of doping; and

disposing a conductive electrode directly on at least on a portion of the organic semiconductor material;

wherein the organic semiconductor material comprises an electron blocking or a hole transport material when the inorganic substrate comprises an n-type inorganic material, and the organic semiconductor material comprises a hole blocking or electron transport material when the inorganic substrate comprises a p-type inorganic material.

9. The method of claim 8 , wherein the Y is an alkenyl chain comprising all cis double bonds or all trans double bonds.

10. The method of claim 8 , wherein Y is substantially free of branching.

11. The method of claim 8 , wherein the silicon heterojunction is further processed to form a portion of a photovoltaic device.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 10, 2015
From: AFZALI-ARDAKANI, ALI; HEKMATSHOARTABARI, BAHMAN; SHAHRJERDI, DAVOOD
To: INTERNATIONAL BUSINESS MACHINES CORPORATION
Reel/Frame 037259/0354 →
Continuity (2)
Continuation 14749956 · Jun 25, 2015
Related Publication 20160380220A1 · Dec 29, 2016