IP Library › Granted Patent US 10,145,679
Granted Patent B2
US 10,145,679 · App. 14/966,960 · Granted Dec 4, 2018

Three-dimensional shape measuring device and three-dimensional shape measuring method

Inventor: Takahiro Aoki (Kawasaki, JP)
Assignee: Fujitsu Limited
G01B11/24A61B5/117G06K9/2027G06T7/0053G06K2009/00395G06T2207/10028
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Quick Facts
Patent No.
US 10,145,679
App. No.
14/966,960
Granted
Dec 4, 2018
Kind
B2
Abstract

A three-dimensional shape measuring device is provided that enables an accuracy in measuring a three-dimensional shape of a subject to be improved even when a relationship between a luminance value and a distance deviates from an ideal point light source model in which the luminance value is inversely proportional to the square of the distance. A biometric authentication device includes a coefficient setting unit that sets a coefficient that is an index of a power in a model expression for making a luminance value of a captured image be proportional to an inverse of the power of a distance from a light source to a measurement point of the luminance value according to a prescribed condition, and a three-dimensional shape measuring unit that measures the three-dimensional shape of the subject according to the luminance value of the captured image and the coefficient.

Claims (28)

1. A three-dimensional shape measuring device that measures a three-dimensional shape of a subject included in a captured image, the three-dimensional shape measuring device comprising

a processor configured:

to calculate, according to a position of the subject in the captured image, a coefficient that depends on a distance in a distance-dependent variable model from a light source to a measurement point of a luminance value according to a prescribed condition;

to calculate the luminance value by using the coefficient; and

to measure the three-dimensional shape of the subject according to the luminance value of the captured image and the coefficient, wherein

in calculating the coefficient, the processor specifies a region of the subject in the captured image, and calculates a mean value of an index that corresponds to each pixel included in the region to be the coefficient.

2. The three-dimensional shape measuring device according to claim 1 , wherein

the processor configures

to estimate a reflectance of the subject according to the luminance value of a reference object that is a plane body for which a stored reflectance is constant and known, and the luminance value of the subject in the captured image, and performing, on the luminance value of the captured image, correction to make the reflectance of the subject almost equal to the reflectance of the reference object according to the estimated reflectance; and

to measure the three-dimensional shape of the subject according to the corrected luminance value of the captured image and the coefficient.

3. The three-dimensional shape measuring device according to claim 1 , wherein

the processor configures

to perform, on the luminance value of the captured image, correction to remove influence of peripheral darkening on the luminance value of the captured image; and

to measure the three-dimensional shape of the subject according to the corrected luminance value of the captured image and the coefficient.

4. The three-dimensional shape measuring device according to claim 3 , wherein

the processor configures to perform the correction to remove the influence of the peripheral darkening under the assumption that the index of the power of the distance from the light source to which the peripheral darkening is almost proportional is the coefficient.

5. The three-dimensional shape measuring device according to claim 1 , wherein

the processor corrects a tilt of the subject in the captured image according to the three-dimensional shape of the subject.

6. A three-dimensional shape measuring method for measuring a three-dimensional shape of a subject included in a captured image, the three-dimensional shape measuring method comprising:

calculating, according to a position of the subject in the captured image, a coefficient that depends on a distance in a distance-dependent variable model from a light source to a measurement point of a luminance value according to a prescribed condition;

calculating the luminance value by using the coefficient; and

measuring the three-dimensional shape of the subject according to the luminance value of the captured image and the coefficient, wherein

in the calculating the coefficient, the three-dimensional shape measuring method includes specifying a region of the subject in the captured image, and calculating a mean value of an index that corresponds to each pixel included in the region to be the coefficient.

7. A non-transitory computer-readable recording medium having stored herein a program for causing a computer of a three-dimensional shape measuring device that measures a three-dimensional shape of a subject included in a captured image to execute a process comprising:

calculating, according to a position of the subject in the captured image, a coefficient that depends on a distance in a distance-dependent variable model from a light source to a measurement point of a luminance value according to a prescribed condition;

calculating the luminance value by using the coefficient; and

measuring the three-dimensional shape of the subject according to the luminance value of the captured image and the coefficient, wherein

in the calculating the coefficient, the process includes specifying a region of the subject in the captured image, and calculating a mean value of an index that corresponds to each pixel included in the region to be the coefficient.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 14, 2015
From: AOKI, TAKAHIRO
To: FUJITSU LIMITED
Reel/Frame 037282/0302 →
Priority Claims (1)
JP 2015-002698 · Jan 8, 2015 · national
Continuity (1)
Related Publication 20160202047A1 · Jul 14, 2016