Optical network span sensing
An apparatus includes a polarization beam splitter (PBS) and an optical detector. The PBS is configured to receive a polarized optical signal transported via an optical communication path of an optical network. The detector is configured to receive from the PBS a first polarization component of the optical signal, and to produce a first electrical measure of the first polarization component. A processor is configured to determine a dynamic metric of the optical communication path based at least on the first electrical measure. Some embodiments also include a second detector configured to receive from the PBS a second polarization component of the optical signal. The second detector produces a second electrical measure of the second polarization component, and the processor is configured to determine the dynamic metric based on both the first and second electrical measures.
1. An apparatus, comprising:
a polarization beam splitter configured to receive a polarized optical signal transported via an optical communication path of an optical network;
a first detector configured to receive, from said polarization beam splitter, light of a first decomposed polarization component of said optical signal, and to produce therefrom a first electrical measure of said first polarization component; and
a second detector configured to receive, from said polarization beam splitter, light of a second decomposed polarization component of said optical signal, and to produce therefrom a second electrical measure of said second polarization component, said first and second detectors being a first pair of detectors;
a processor; and
a second pair of detectors configured to receive first and second interference signals produced by interfering together said first and second decomposed polarization components, and to produce therefrom respective third and fourth electrical measures of said first and second interference optical signals, and
wherein said processor is further configured to determine a dynamic metric of said optical communication path based on said first, second, third and fourth electrical measures.
2. The apparatus of claim 1 , further comprising an interferometer configured to produce said first and second interference signals.
3. An apparatus, comprising:
a polarization beam splitter configured to receive a polarized optical signal transported via an optical communication path of an optical network;
a first detector configured to receive, from said polarization beam splitter, light of a first decomposed polarization component of said optical signal, and to produce therefrom a first electrical measure of said first polarization component;
a processor;
a second detector configured to receive, from said polarization beam splitter, light of a second decomposed polarization component of said optical signal, and to produce therefrom a second electrical measure of said second polarization component, said first and second detectors being configured to receive respective portions of said optical signal produced by interfering light from first and second outputs of said polarization beam splitter;
a third detector configured to produce a third electrical representation of light from said first polarization beam splitter output; and
a fourth detector configured to produce a fourth electrical representation of light from said second polarization beam splitter output, and wherein said processor is further configured to determine a dynamic metric of said optical communication path from said first, second, third and fourth electrical representations.