Thermal simulation device and method for integrated circuits
A thermal simulation device for an integrated circuit according to the disclosure comprises a thermal analysis unit and a mesh size analysis unit. The thermal analysis unit performs a thermal analysis of the integrated circuit to obtain temperatures of the center point and boundary of each function block. The mesh size analysis unit determines the cell number in the mesh of each function block. The thermal analysis unit computes a temperature of the center point and boundary of each cell in every function block according to the temperatures of the boundary of each function block.
1. A thermal simulation device for an integrated circuit, comprising:
a thermal analysis unit performing a thermal analysis of the integrated circuit to obtain a temperature of the center point and boundary temperatures of each function block in the integrated circuit; and
a mesh size analysis unit determining a cell number in a mesh of each function block according to the boundary temperatures of each function block and a temperature resolution set by a user, the thermal analysis unit computes a temperature of the center point and boundary temperatures of each cell in every function block according to the boundary temperatures of each function block,
wherein the integrated circuit, after being simulated by the thermal simulation device, is provided for manufacturing.
2. The thermal simulation device as recited in claim 1 , wherein the function blocks correspond to circuit modules of the integrated circuit.
3. The thermal simulation device as recited in claim 1 , wherein the thermal analysis unit uses a thermal model in function block mode to perform the thermal analysis, computes the temperature of the center point of each function block and obtains the boundary temperatures of each function block according to the temperature the center point of each function block.
4. The thermal simulation device as recited in claim 3 , wherein the temperature of the center point of each function block in the integrated circuit is obtained according to the thermal model of the integrated circuit, the power consumption of each function block, and the ambient temperature.
5. The thermal simulation device as recited in claim 1 , wherein the boundary temperatures of each function block include the surface temperature of each function block contacting the ambiance, the surface temperature of each function block contacting the adjacent function block, the corner temperature of each function block contacting the ambiance, and the corner temperature of each function block contacting the adjacent function block.
6. The thermal simulation device as recited in claim 1 , wherein the thermal analysis unit obtains the boundary temperatures of each cell in each function block by an interpolation method.
7. The thermal simulation device as recited in claim 1 , wherein the temperature of the center point of each cell in the mesh of each function block is calculated by the average in the all the boundary temperatures of the cell.
8. A thermal simulation method for an integrated circuit cooperating with a thermal simulation device including a thermal analysis unit and a mesh size analysis unit, the thermal simulation method comprising steps as follows:
performing a thermal analysis of the integrated circuit by the thermal analysis unit to compute a temperature of the center point of each function block in the integrated circuit;
computing the boundary temperatures of each function block by the thermal analysis unit according to the temperature of the center point of each function block in the integrated circuit;
determining a cell number in a mesh of each function block by the mesh size analysis unit according to the boundary temperatures of each function blocks and a temperature resolution set by users;
computing the boundary temperatures of each cell in the mesh of each function block by the mesh size analysis unit according to the boundary temperatures of each function block; and
computing a temperature of the center point of each cell in the mesh of each function block by the thermal analysis unit according to the boundary temperatures of each cell in the mesh of each function block,
wherein the integrated circuit, after being simulated by the thermal simulation device, is provided for manufacturing.
9. The thermal simulation method as recited in claim 8 , wherein in the step of computing the temperature of the center point of each function block, a thermal model in function block mode is used to perform the thermal analysis of integrated circuits.
10. The thermal simulation method as recited in claim 9 , wherein the temperature of the center point of each function block is obtained according to the thermal model of integrated circuits, the power consumption of each function block, and the ambient temperature.
11. The thermal simulation method as recited in claim 8 , wherein the boundary temperatures of each function block include the surface temperature of each function block contacting the ambiance, the surface temperature of each function block contacting the adjacent function block, the corner temperature of each function block contacting the ambiance and the corner temperature of each function block contacting the adjacent function block.
12. The thermal simulation method as recited in claim 8 , wherein in the step of computing the boundary temperatures of each cell in each function block, the boundary temperatures are obtained by an interpolation method.
13. The thermal simulation method as recited in claim 8 , wherein the temperature of the center point of each cell in the mesh of each function block is calculated by the average in the all the boundary temperatures of the cell.