IP Library Granted Patent US 9,748,461
Granted Patent B2
US 9,748,461 · App. 14/992,787 · Granted Aug 29, 2017

Light emitting diodes with enhanced thermal sinking and associated methods of operation

Inventors: Kevin Tetz (Boise, ID); Charles M. Watkins (Eagle, ID)
Assignee: Micron Technology, Inc.
H01L33/64H01L33/44H01L33/50H01L33/507H01L33/52H01L33/644H01L25/0753H01L33/508H01L33/641H01L2924/0002H01L2933/005H01L2933/0041H01L2933/0075
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,748,461
App. No.
14/992,787
Granted
Aug 29, 2017
Kind
B2
Abstract

Solid state lighting devices and associated methods of thermal sinking are described below. In one embodiment, a light emitting diode (LED) device includes a heat sink, an LED die thermally coupled to the heat sink, and a phosphor spaced apart from the LED die. The LED device also includes a heat conduction path in direct contact with both the phosphor and the heat sink. The heat conduction path is configured to conduct heat from the phosphor to the heat sink.

Claims (18)

1. A method of manufacturing a light emitting diode (LED) device, comprising:

attaching an LED die to a heat sink, the LED die being thermally coupled to the heat sink

encapsulating the LED die with an insulating material that is at least partially transparent;

depositing a conduction material on the insulating material and the heat sink, the conduction material having a thermal conductivity greater than about 1.0W/(m·K); and

depositing a phosphor on the conduction material, the phosphor generally corresponding to the emission area of the LED die;

wherein depositing a conduction material includes:

depositing a first conduction material on the insulating material;

after depositing the phosphor, depositing a second conduction material on the phosphor;

forming a plurality of vias in the phosphor, the vias individually extending directly between the first and second conduction materials; and

filling the plurality of vias with a third conduction material.

2. The method of claim 1 wherein depositing a conduction material includes depositing at least one of indium tin oxide (ITO), fluorine-doped tin oxide (FTO), and zinc oxide (ZnO) on the insulating material via physical vapor deposition (PVD).

3. The method of claim 1 wherein:

encapsulating the LED die includes encapsulating the LED die with at least one of a polyimide, a solvent-soluble thermoplastic polyimide, a ceramic material, and glass via spin coating or chemical vapor deposition (CVD); and

depositing a conduction material includes depositing at least one of indium tin oxide (ITO), fluorine-doped tin oxide (FTO), and zinc oxide (ZnO) on the insulating material via physical vapor deposition (PVD).

4. The method of claim 1 wherein

the second conduction material is generally the same as the first conduction material.

5. The method of claim 1 wherein encapsulating the LED die includes encapsulating the LED die with at least one of a polyimide, a solvent-soluble thermoplastic polyimide, a ceramic material, and glass.

6. The method of claim 1 wherein the plurality of vias in the phosphor include at least one of indium tin oxide (ITO), fluorine-doped tin oxide (FTO), and zinc oxide (ZnO).

Assignments (8)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 28, 2016
From: TETZ, KEVIN; WATKINS, CHARLES M.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 038113/0160 →
Continuity (3)
Division 13774502 · Feb 22, 2013
Division 12727943 · Mar 19, 2010
Related Publication 20160197255A1 · Jul 7, 2016