Semiconductor memory device

1. A semiconductor memory device comprising:

a plurality of first conductive lines which are stacked in a first direction above a semiconductor substrate and extend in a second direction along to the semiconductor substrate;

a second conductive line which extends in the first direction;

a semiconductor layer which is arranged between the first conductive lines and the second conductive line and extends in the first direction;

a conductive layer which is in contact with a bottom surface of the semiconductor layer and includes a first impurity of a first conductivity type; and

a variable resistance film which is arranged between the first conductive lines and the semiconductor layer,

the semiconductor layer having a first semiconductor part which is arranged from the bottom surface of the semiconductor layer to a position equal to or lower than a bottom surface of the first conductive line at a lowermost layer in the first direction and includes a second impurity of a second conductivity type different from the first conductivity type.

2. The semiconductor memory device according to claim 1 , wherein

the first impurity is a donor, and

the second impurity is an acceptor.

3. The semiconductor memory device according to claim 2 , wherein

the first impurity is phosphorus (P) or arsenic (As).

4. The semiconductor memory device according to claim 2 , wherein

the second impurity is boron (B).

5. The semiconductor memory device according to claim 1 , wherein

the semiconductor layer has a second semiconductor part which is arranged from an upper surface of the first semiconductor part to a position of an upper surface of the semiconductor layer in the first direction, and

the second semiconductor part is formed using an intrinsic semiconductor.

6. The semiconductor memory device according to claim 1 , wherein

the semiconductor layer has a second semiconductor part which is arranged from an upper surface of the first semiconductor part to a position of an upper surface of the semiconductor layer in the first direction, and

the second semiconductor part includes a third impurity of the first conductivity type or the second conductivity type.

7. The semiconductor memory device according to claim 1 , wherein

the first semiconductor part has a lower impurity concentration than the conductive layer.

8. The semiconductor memory device according to claim 6 , wherein

the first semiconductor part has a higher impurity concentration than the second semiconductor part.

9. The semiconductor memory device according to claim 1 , further comprising

a third conductive line which extends in a third direction crossing the first and second directions between the semiconductor substrate and the conductive layer in the first direction.

10. The semiconductor memory device according to claim 9 , further comprising

a first barrier layer between the third conductive line and the conductive layer in the first direction,

wherein the conductive layer is electrically connected to the third conductive layer with the first barrier layer interposed therebetween.

11. The semiconductor memory device according to claim 10 , wherein

the conductive layer is in contact with an upper surface of the first barrier layer.

12. The semiconductor memory device according to claim 1 , further comprising

an insulating layer which is in contact with side surfaces and a bottom surface of the second conductive line.

13. The semiconductor memory device according to claim 1 , further comprising

a fourth conductive line extending in the second direction and provided in the first direction above the second conductive line.

14. The semiconductor memory device according to claim 13 , further comprising

a second barrier layer between the second conductive line and the fourth conductive line in the first direction,

wherein the second conductive line is electrically connected to the fourth conductive line with the second barrier layer interposed therebetween.

15. The semiconductor memory device according to claim 14 , wherein

the second conductive line is in contact with a bottom surface of the second barrier layer.

16. A semiconductor memory device comprising:

a plurality of first conductive lines which are stacked in a first direction above a semiconductor substrate and extend in a second direction along to the semiconductor substrate;

a second conductive line which extends in the first direction;

a semiconductor layer which is arranged between the first conductive lines and the second conductive line and extends in the first direction; and

a variable resistance film which is arranged between the first conductive lines and the semiconductor layer,

the semiconductor layer having a first semiconductor part which is arranged from a bottom surface of the semiconductor layer to a position equal to or lower than a bottom surface of the first conductive line at a lowermost layer in the first direction and includes an acceptor.

17. The semiconductor memory device according to claim 16 , wherein

the acceptor is boron (B).

18. The semiconductor memory device according to claim 16 , wherein

the semiconductor layer has a second semiconductor part which is arranged from an upper surface of the first semiconductor part to an upper surface of the semiconductor layer in the first direction, and

the second semiconductor part is formed using an intrinsic semiconductor.

19. The semiconductor memory device according to claim 16 , wherein

the semiconductor layer has a second semiconductor part which is arranged from an upper surface of the first semiconductor part to an upper surface of the semiconductor layer in the first direction, and

the second semiconductor part includes a donor or an acceptor.

20. The semiconductor memory device according to claim 19 , wherein

the first semiconductor part has a higher impurity concentration than the second semiconductor part.