Multi-stage test response compactors
Disclosed herein are exemplary embodiments of a so-called “X-press” test response compactor. Certain embodiments of the disclosed compactor comprise an overdrive section and scan chain selection logic. Certain embodiments of the disclosed technology offer compaction ratios on the order of 1000×. Exemplary embodiments of the disclosed compactor can maintain about the same coverage and about the same diagnostic resolution as that of conventional scan-based test scenarios. Some embodiments of a scan chain selection scheme can significantly reduce or entirely eliminate unknown states occurring in test responses that enter the compactor. Also disclosed herein are embodiments of on-chip comparator circuits and methods for generating control circuitry for masking selection circuits.
1. An apparatus for compacting test responses of a circuit-under-test, the apparatus comprising:
a spatial compactor comprising a plurality of compactor inputs and a compactor output;
error detection logic coupled to the compactor output and having an error detection logic output, the error detection logic being configured to detect whether a test response bit output from the compactor output is an expected test response bit;
masking logic coupled to the error detection logic output, the masking logic having a masking logic output; and
a shift register comprising a plurality of shift register inputs and a register output, one of the shift register inputs being coupled to the masking logic output, the shift register being operable to load bits in parallel through the shift register inputs and to output the bits through the register output.
2. The apparatus of claim 1 , wherein the spatial compactor is feedback free.
3. The apparatus of claim 1 , wherein the spatial compactor comprises respective networks of XOR or XNOR gates.
4. The apparatus of claim 1 , wherein the shift register comprises two or more sequential elements coupled in series.
5. The apparatus of claim 1 , wherein the masking logic is controlled by masking signals.
6. The apparatus of claim 1 , further comprising circuitry configured to count a number of failing bits detected by the error detection logic.
7. One or more non-transitory computer-readable media storing circuit design information for implementing an apparatus, the apparatus comprising:
a spatial compactor comprising a plurality of compactor inputs and a compactor output;
error detection logic coupled to the compactor output and having an error detection logic output, the error detection logic being configured to detect whether a test response bit output from the compactor output is an expected test response bit;
masking logic coupled to the error detection logic output, the masking logic having a masking logic output; and
a shift register comprising a plurality of shift register inputs and a register output, one of the shift register inputs being coupled to the masking logic output, the shift register being operable to load bits in parallel through the shift register inputs and to output the bits through the register output.
8. One or more non-transitory computer-readable media storing computer-executable instructions for causing a computer to create an apparatus, the apparatus comprising:
a spatial compactor comprising a plurality of compactor inputs and a compactor output;
error detection logic coupled to the compactor output and having an error detection logic output, the error detection logic being configured to detect whether a test response bit output from the compactor output is an expected test response bit;
masking logic coupled to the error detection logic output, the masking logic having a masking logic output; and
a shift register comprising a plurality of shift register inputs and a register output, one of the shift register inputs being coupled to the masking logic output, the shift register being operable to load bits in parallel through the shift register inputs and to output the bits through the register output.
9. A method for compacting test responses of a circuit-under-test, comprising:
compressing a plurality of uncompressed test response bits, thereby producing a set of compressed test response bits;
detecting whether the compressed test response bits are expected or unexpected test response bits, thereby producing a set of error detection bits;
selectively masking one or more of the error detection bits, thereby producing a selectively masked set of error detection bits;
loading the selectively masked set of error detection bits into a shift register;
unloading the shift register.
10. The method of claim 9 , wherein the loading occurs in a first period of one or more clock cycles, and wherein the unloading occurs in a second period of one or more clock cycles.
11. The method of claim 10 , wherein the first period and the second period overlap.
12. The method of claim 9 , further comprising loading masking instruction bits for controlling the selective masking.
13. A circuit for compressing test responses configured to perform the method of claim 9 .