Apparatus and method for vector s-parameter measurements
The disclosure relates to an apparatus and a method for vector scattering parameter (s-parameter) measurements, and more particularly, to an apparatus and a method for providing a simple, low cost solution for tests requiring vector s-parameter measurements. The apparatus includes a source which provides an input signal, a divider which splits the input signal to a reference signal and a testing signal, a phase shifter which shifts the reference signal by a first phase and outputs a phase shifted signal, a device under test (DUT) which shifts the testing signal by a second phase and outputs a DUT shifted signal, a combiner which combines the phase shifted signal and the DUT shifted signal into a combined signal, and a detector which detects a product of the phase shifted signal and the DUT shifted signal.
1. An apparatus, comprising:
a source which provides an input signal;
a divider which splits the input signal to a reference signal and a testing signal;
a phase shifter which shifts the reference signal by a first phase and outputs a phase shifted signal;
a device under test (DUT) which shifts the testing signal by a second phase and outputs a DUT shifted signal;
a combiner which combines the phase shifted signal and the DUT shifted signal into a combined signal; and
a detector which detects a product of the phase shifted signal and the DUT shifted signal,
wherein the second phase of the DUT is calculated based on a peak of the combined signal.
2. The apparatus of claim 1 , wherein the first phase and the second phase are different phase shift values.
3. The apparatus of claim 1 , wherein the phase shifter provides a gain or loss to the reference signal.
4. The apparatus of claim 1 , wherein the DUT provides a gain or loss to the testing signal.
5. The apparatus of claim 1 , wherein at the peak of the combined signal, the second phase of the DUT is equal to the first phase of the phase shifter.
6. The apparatus of claim 1 , wherein the phase shifter comprises a coarse tune phase shifter and a fine tune phase shifter.
7. The apparatus of claim 1 , further comprising:
a first controller for controlling the phase shifter; and
a second controller for controlling the source and the detector.
8. The apparatus of claim 1 , wherein the divider is a direction dual hybrid coupler which splits the input signal into the reference signal and the testing signal, and splits a reflection signal from the DUT.
9. The apparatus of claim 1 , wherein the detector is a diode detector.
10. An apparatus, comprising:
a source which provides an input signal;
a directional dual hybrid coupler which splits the input signal into the reference signal and the testing signal, and splits a reflection signal from a device under test (DUT);
a phase shifter which shifts the reference signal by a first phase and outputs a phase shifted signal;
the device under test (DUT) which shifts the testing signal by a second phase and outputs a DUT shifted signal;
a combiner which combines the phase shifted signal and the DUT shifted signal into a combined signal; and
a detector which detects a product of the phase shifted signal and the DUT shifted signal,
wherein the second phase of the DUT is calculated based on a peak of the combined signal.
11. The apparatus of claim 10 , wherein at the peak of the combined signal, the second phase of the DUT is equal to the first phase of the phase shifter.
12. The apparatus of claim 10 , wherein the phase shifter comprises a course tune phase shifter and a fine tune phase shifter.
13. The apparatus of claim 10 , wherein the phase shifter provides a first gain or loss to the reference signal, and the DUT provides a second gain or loss to the testing signal.