Array test apparatus and method
An array test apparatus includes a signal transmission unit which transmits a data signal to each of a plurality of data lines of a low-temperature polysilicon (“LTPS”) substrate, a signal measurement unit which measures the data signal of each of the data lines of the LTPS substrate, a timer which generates a horizontal period for setting a section in which the data signal is transmitted from the signal transmission unit to each of the data lines and a section in which the data signal output from each of the data lines is measured by the signal measurement unit, and a determination unit which determines whether each of the data lines of the LTPS substrate is normal based on the data signal measured by the signal measurement unit.
1. An array test method comprising: selecting one of a first data voltage and a second data voltage having different voltage levels from one another to be applied to each of a plurality of data lines of an low-temperature polysilicon substrate including a plurality of pixels which are defined by an intersection of the plurality of data lines and a plurality of scan lines on the substrate; transmitting a scan signal sequentially to the plurality of scan lines; applying the selected data voltage to each of the plurality of data lines; measuring a data signal of each of the plurality of data lines; and determining whether a data line disposed in each of the pixels is normal based on the measured data signal, wherein a horizontal period is a section in which the scan signal is transmitted to one of the plurality of scan lines, and the data voltage to be applied to each of the plurality of data lines is selected from the first data voltage and the second data voltage in each horizontal period.
2. The method of claim 1 , wherein the determining whether the data line disposed in each of the pixels is normal based on the measured data signal comprises:
calculating an average value of the measured data signals;
determining the data line to be normal when a measured data signal is within a predetermined threshold range from the average value of the measured data signals; and
determining the data line to be abnormal when the measured data signal is outside the predetermined threshold range from the average value of the measured data signals.
3. The method of claim 2 , wherein the determining the data line to be abnormal when the measured data signal is outside the predetermined threshold range from the average value of the measured data signals further comprises detecting the location of an abnormal pixel based on the location of the data line which was determined to be abnormal and the location of a scan line to which the scan signal was transmitted.
4. An array test method comprising: applying an alternating current data voltage to each of a plurality of data lines of an low-temperature polysilicon substrate including a plurality of pixels which are defined by the intersection of the plurality of data lines and a plurality of scan lines; transmitting a scan signal sequentially to the plurality of scan lines on the substrate; measuring a data signal of each of the plurality of data lines; and determining whether a data line disposed in each of the pixels is normal based on the measured data signal, wherein the applying the alternating current data voltage to each of the plurality of data lines comprises: selecting one of a first data voltage and a second data voltage having different voltage levels from one another, wherein a horizontal period is a section in which the scan signal is transmitted to one of the plurality of scan lines, and an electric potential of the alternating current data voltage changes every horizontal period.
5. The method of claim 4 , wherein the measuring of the data signal of each of the plurality of data lines is performed when a phase of the alternating current data voltage applied to each of the plurality of data lines is changed.