Gain calibration by applying a portion of an input voltage to voltage associated with a capacitor array

1. An analog to digital converter system, comprising:

a capacitor array component comprising a plurality binary-weighted capacitors and configured for generating an output voltage received by a comparator based on an input voltage and a reference voltage; and

a gain calibration component configured for receiving the input voltage, generating, via a plurality of capacitors of the gain calibration component, a modified input voltage that corresponds to a portion of the input voltage, and applying the modified input voltage to the output voltage generated by the capacitor array component, the gain calibration component being configured for controlling transfer of the modified input voltage to the capacitor array component via a set of switches located between the plurality of capacitors and the capacitor array component.

2. The analog to digital converter system of claim 1 , wherein the comparator is configured for generating a digital signal based on the output voltage.

3. The analog to digital converter system of claim 1 , further comprising a successive approximation register configured for receiving a digital signal generated by the comparator based on the output voltage.

4. The analog to digital converter system of claim 3 , wherein the successive approximation register is configured for generating a control signal that is received by the capacitor array component.

5. The analog to digital converter system of claim 1 , wherein the plurality of capacitors are configured for generating the modified input voltage based on the input voltage.

6. The analog to digital converter system of claim 1 , wherein the set of switches, located between the plurality of capacitors and the capacitor array component, is associated with the input voltage and a common mode voltage.

7. The analog to digital converter system of claim 1 , wherein the plurality of capacitors are configured for sampling the input voltage using bottom-plate sampling and the plurality of binary-weighted capacitors are configured for sampling the input voltage using top-plate sampling.

8. The analog to digital converter system of claim 1 , wherein the plurality of capacitors and the plurality of binary-weighted capacitors are configured for sampling the input voltage using bottom-plate sampling.

9. The analog to digital converter system of claim 1 , wherein the gain calibration component is configured for transferring the modified input voltage to the capacitor array component via one or more bridge capacitors.

10. The analog to digital converter system of claim 1 , wherein the input voltage and the modified input voltage are analog voltage signals.

11. A gain calibration method, comprising:

providing an input voltage to a first plurality of capacitors configured for generating an output voltage based on the input voltage and a reference voltage;

providing the input voltage to a second plurality of capacitors configured for generating a modified input voltage based on the input voltage;

transferring the modified input voltage to the first plurality of capacitors via a set of switches located between the second plurality of capacitors and the first plurality of capacitors;

applying the modified input voltage to the output voltage to generate a gain adjusted output voltage; and

converting the gain adjusted output voltage into a digital output.

12. The gain calibration method of claim 11 , wherein the applying the modified input voltage to the output voltage comprises applying a portion of the input voltage to the output voltage.

13. The gain calibration method of claim 11 , wherein the providing the input voltage to the first plurality of capacitors comprises providing the input voltage to a plurality of binary-weighted capacitors.

14. The gain calibration method of claim 11 , wherein the providing the input voltage to the first plurality of capacitors comprises providing the input voltage to a charge scaling circuit of an analog to digital converter.

15. The gain calibration method of claim 11 , wherein the providing the input voltage to the second plurality of capacitors comprises providing the input voltage to a plurality of binary-weighted capacitors.

16. The gain calibration method of claim 11 , wherein the providing the input voltage to the second plurality of capacitors comprises providing the input voltage to a gain calibration circuit of an analog to digital converter.

17. A gain calibration method, comprising:

receiving an input voltage via a charge scaling circuit of an analog to digital converter (ADC);

receiving an input voltage, in parallel to the charge scaling circuit, via a gain calibration circuit of the ADC;

sampling the input voltage via a plurality of capacitors of the charge scaling circuit using top-plate sampling; and

sampling the input voltage via a different plurality of capacitors of the gain calibration circuit using bottom-plate sampling, comprising providing a modified input voltage to the charge scaling circuit via a set of switches located between the different plurality of capacitors and the charge scaling circuit.

18. The gain calibration method of claim 17 , wherein the sampling the input voltage via the plurality of capacitors of the charge scaling circuit comprises sampling the input voltage via a plurality of binary-weighted capacitors.

19. The gain calibration method of claim 17 , wherein the sampling the input voltage via the different plurality of capacitors of the gain calibration circuit comprises sampling the input voltage via a plurality of binary-weighted capacitors.

20. The gain calibration method of claim 17 , wherein the sampling the input voltage via the different plurality of capacitors of the gain calibration circuit comprises sampling the input voltage via a plurality of thermometric weighted capacitors.