IP Library Granted Patent US 10,224,103
Granted Patent B2
US 10,224,103 · App. 15/019,175 · Granted Mar 5, 2019

Memory devices with a transistor that selectively connects a data line to another data line

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Quick Facts
Patent No.
US 10,224,103
App. No.
15/019,175
Granted
Mar 5, 2019
Kind
B2
Abstract

In an example, a memory device has a first string of memory cells selectively connected to a first data line, a second string of memory cells selectively connected to a second data line, and a transistor that selectively connects the first data line to the second data line, thereby permitting connecting the first and second data lines in series before programming or sensing memory cells of the first and second strings of memory cells.

Claims (28)

1. A memory device, comprising:

a first string of memory cells selectively electrically connected to a first data line;

a second string of memory cells selectively electrically connected to a second data line;

a transistor that selectively electrically connects the first data line to the second data line; and

a plurality of buffers connected in series with the second data line;

wherein respective ones of at least a portion of the plurality of page buffers are respectively used for different ones of a first number of bits of data for a memory cell in either the first string or the second string when the memory device is operating the first string and the second string in a first mode of operation, and wherein, when the memory device is operating the first string and the second string in a second mode of operation, respective ones of one or more page buffers of the plurality of page buffers are respectively used for respective ones of one or more bits of data for a memory cell in the first string and respective ones of one or more other page buffers of the plurality of page buffers are respectively used for respective ones of one or more bits of data for a memory cell in the second string, wherein the first number of bits is greater than a number of the one or more bits of the data for the memory cell in the first string and a number of the one or more bits of the data for the memory cell in the second string.

2. A memory device, comprising:

a first string of memory cells selectively connected to a first data line;

a second string of memory cells selectively connected to a second data line;

a first transistor connected in series with the first data line;

a second transistor connected in series with the second data line and the first transistor; and

a plurality of page buffers connected to a node between the first transistor and the second transistor;

wherein the first transistor selectively connects the plurality of page buffers in parallel to the first data line and the second transistor selectively connects the plurality of page buffers in parallel to the second data line; and

wherein respective ones of at least a portion of the plurality of page buffers are respectively used for different ones of a first number of bits of data for a memory cell in either the first string or the second string when the memory device is operating the first string and the second string in a first mode of operation, and wherein, when the memory device is operating the first string and the second string in a second mode of operation, respective ones of one or more page buffers of the plurality of page buffers are respectively used for respective ones of one or more bits of data for a memory cell in the first string and respective ones of one or more other page buffers of the plurality of page buffers are respectively used for respective ones of one or more bits of data for a memory cell in the second string, wherein the first number of bits is greater than a number of the one or more bits of the data for the memory cell in the first string and a number of the one or more bits of the data for the memory cell in the second string.

3. The memory device of claim 2 , further comprising a sense amplifier connected between the node and the plurality of page buffers.

4. The memory device of claim 2 , further comprising a data latch connected to the node and the plurality of page buffers.

5. A memory device, comprising:

a first string of memory cells selectively electrically connected to a first data line;

a second string of memory cells selectively electrically connected to a second data line;

a transistor that selectively electrically connects the first data line to the second data line; and

a sense amplifier, a plurality of page buffers, and a data latch connected in series with the second data line;

wherein first and second page buffers of the plurality of page buffers are respectively used to receive respective ones of two bits to be programmed to a memory cell of the first string of memory cells when the memory cells of the first string of memory cells are operating as two-bit memory cells, and wherein the first and second page buffers of the plurality of page buffers are respectively used to receive one bit to be programmed to the memory cell of the first string of memory cells and one bit to be programmed to a memory cell of the second string of memory cells when the memory cells of the first and second strings of memory cells are operating as single-bit memory cells.

6. A memory device, comprising:

a first string of memory cells selectively electrically connected to a first data line;

a second string of memory cells selectively electrically connected to a second data line;

a transistor that selectively electrically connects the first data line to the second data line; and

a sense amplifier, a plurality of page buffers, and a data latch connected in series with the second data line;

wherein first and second page buffers of the plurality of page buffers are respectively used to receive respective ones of two bits read from a memory cell of the first string of memory cells when the memory cells of the first string of memory cells are operating as two-bit memory cells, and wherein the first and second page buffers of the plurality of page buffers are respectively used to receive one bit read from the memory cell of the first string of memory cells and one bit read from a memory cell of the second string of memory cells when the memory cells in the first and second strings of memory cells are operating as single-bit memory cells.

Assignments (8)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 10, 2016
From: TANZAWA, TORU
To: MICRON TECHNOLOGY, INC.
Reel/Frame 037693/0472 →