Apparatus and method for inspecting a semiconductor package
There is provided an apparatus and method for inspecting a semiconductor package. The apparatus includes at least one 3D camera positioned at a first angle relative to a normal axis of the semiconductor package; and a light source configured to provide illumination for the at least one 3D camera, the light source being directed at the semiconductor package. The method includes casting a shadow of a bonded wire onto the semiconductor package; obtaining a 3D image of the semiconductor package; determining a distance S of the shadow and the bonded wire in the image; and obtaining a wire loop height H of the bonded wire.
1. A method for inspecting a semiconductor package, the method including:
casting a shadow of a bonded wire onto the semiconductor package;
obtaining a 3D image of the semiconductor package;
determining a distance S of the shadow and the bonded wire in the image; and
obtaining a wire loop height H of the bonded wire.
2. The method of claim 1 , wherein a plurality of the distance S is determined to compute a height profile of a length of the bonded wire.
3. The method of claim 1 , wherein the 3D image is obtained using a 3D camera with an imaging lens positioned at a first angle β relative to a normal axis of the semiconductor package.
4. The method of claim 3 , wherein the shadow is cast using a light source positioned at a second angle α relative to the normal axis, opposite to the 3D camera.
5. The method of claim 4 , wherein the wire loop height H is S·cos(α)/sin(α+β).