Electron emitting construct configured with ion bombardment resistant
An electron emitting construct design of an x-ray emitter device is disclosed configured to facilitate radiation in the X-ray spectrum and further relates to preventing a cold cathode from being damaged by ion bombardment in high-voltage applications. The electron beam emitted by the emitting construct is focused and accelerated by an electrical field towards an electron anode target operable to attract electron beam to an associated focal spot, wherein the generated ions are accelerated along a trajectory perpendicular to the electric field in parallel to the surface of the electron anode target. More specifically, the present invention relates to realizing a robust cold cathode to avoid ion bombardments damages in high-voltage applications, by means of setting non-emitter zone surrounded by or set between the emitter areas. The system is further configured to provide an angled target anode or a stepped target anode to further reduce the ion bombardment damage.
1. An x-ray emitter device, comprising:
an electron anode target, producing an electric field adjacent to its surface; and
a cold cathode electron source having at least one electron emitting zone configured to emit electrons towards said electron anode target;
wherein said x-ray emitter device further comprises:
a stepped surface of said electron anode target, comprising a step along its surface; and
a focus structure of said cold cathode electron source operable to direct said electrons towards an electron focal spot close to said step within the surface of said electron anode target;
such that the electric field adjacent to the step within the surface of the electron anode target is asymmetrical and ions generated near said electron focal spot are accelerated away from said electron focal spot along a trajectory at a deflection angle towards at least one ion beam striking point in the plane of said at least one electron emitting zone of said cold cathode electron source, said ion beam striking point being distinct from said at least one electron emitting zone of said cold cathode electron source.
2. The x-ray emitter device of claim 1 , further comprising a non-emitter zone set between constructs of said emitting zones of said cold cathode electron source.
3. The x-ray emitter device of claim 1 , further comprising an electrically insulating emitter substrate and an emitter chip mounted to a top-facing chip-mounting surface of said electrically insulating emitter substrate.
4. The x-ray emitter device of claim 1 , wherein said electron anode target comprises an angled electron anode target configured to form an angle to said electron emitting zone.
5. The x-ray emitter device of claim 1 wherein said electron emitting zone comprises a plurality of field emission type electron sources.
6. The x-ray emitter device of claim 5 wherein said field emission type electron sources are Spindt-type electron sources.
7. The x-ray emitter device of claim 5 further comprising a resistive layer situated between the field emission type electron sources and the cathode.
8. The x-ray emitter device of claim 5 , further comprising a silicon-based substrate.
9. The x-ray emitter device of claim 5 , further comprising a silicon carbide-based substrate.
10. An x-ray emitter device, comprising:
an electron anode target, producing an electric field adjacent to its surface; and
a cold cathode electron source having at least one electron emitting zone configured to emit electrons towards said electron anode target;
wherein said x-ray emitter device further comprises:
a stepped surface of said electron anode target, comprising a step along its surface; and
a focus structure of said cold cathode electron source operable to direct said electrons towards an electron focal spot close to said step within the surface of said electron anode target;
such that the electric field adjacent to the step within the surface of the electron anode target is asymmetrical and ions generated from said electron focal spot are accelerated away from said electron focal spot along a trajectory at a deflection angle towards at least one ion bombardment zone comprising an ion beam striking point in the plane of said at least one electron emitting zone of said cold cathode electron source, said ion beam striking point being distinct from said at least one electron emitting zone of said cold cathode electron source, said at least one ion bombardment zone being coated with an elemental material.
11. The x-ray emitter device of claim 10 , further comprising a focus structure configured to direct said electrons towards said electron anode target such that said electrons strike an electron focal spot at an angle.
12. The x-ray emitter device of claim 11 , wherein said at least one ion bombardment zone is disposed along a line perpendicular to the surface of said electron anode target at said electron focal spot.
13. The x-ray emitter device of claim 11 , wherein said at least one ion bombardment zone has larger dimensions than said electron focal spot.
14. The x-ray emitter device of claim 10 wherein said elemental material comprises a pure metal.
15. The x-ray emitter device of claim 10 wherein said elemental material comprises carbon.
16. The x-ray emitter device of claim 10 , wherein said at least one ion bombardment zone comprises a central region surrounded by said electron emitting zone of said cold cathode electron source.
17. The x-ray emitter device of claim 10 wherein the angle of said electron anode target is selected such that said ion bombardment zone is outside an emitter area of said cold cathode electron source.