IP Library Patent Application 15049427
Patent Application
App. No. 15/049,427

METHOD FOR FORMING A COUPLING LAYER

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Patent No.
US None
App. No.
15/049,427
Abstract

Molecules of a coupling layer composition in a semiconductor device are bidimensionally polymerized in order to provide enhanced moisture blocking effect, particularly when the coupling layer is formed on a porous layer, such as a porous dielectric layer. The deposition of the coupling layer on the underlying structure and/or the cross-polymerization of the coupling layer composition and/or a final metallization can be photo-activated, especially, but not only, using an ultraviolet light.

Claims (126)

1 . A method of forming a coupling layer on a dielectric layer having hydroxyl groups on a surface thereof, comprising:

depositing a first organosilane on the dielectric layer, the first organosilane having the general formula:

in which:

n 1 is an integer greater than or equal to 1,

each Si is a silicon atom;

X 1 is a functional group able to react with a surface hydroxyl site of the dielectric material,

Y 1 is either:

X 3 , which is a further functional group able to react with a surface hydroxyl site of the dielectric material,

H, which is a hydrogen atom, or

R 1 , which is an organic group;

Y 2 is either:

X 4 , which is a further functional group able to react with a surface hydroxyl site of the dielectric material,

H, which is a hydrogen atom, or

R 2 , which is an organic group,

B 1 , the presence of which is optional, is a bridging group,

Z 1 is either:

R 3 , which is an organic group,

H, which is a hydrogen atom, or

Xq, which is a hydrolizable functional group,

Z 2 is either:

R 4 , which is an organic group,

H, which is a hydrogen atom, or

X 6 , which is a hydrolizable functional group; and

X 2 is a hydrolizable functional group,

such that at least some of the functional groups of the first organosilane react with hydroxyl groups formed on the dielectric layer;

hydrolyzing at least the hydrolizable functional group X 2 of the first organosilane,

depositing a second organosilane having a functional group able to react with the hydrolyzed functional group of the first organosilane, and a ligand for providing a metal nucleation site, the second organosilane having the general formula:

in which:

n 2 is an integer equal to or greater than or equal to 0,

each Si is a silicon atom;

X 7 is a functional group able to react with a hydrolyzed functional group of the first organosilane molecule,

Y 3 is either:

X 8 , which is a further functional group able to react with a hydrolyzed functional group of the first organosilane molecule,

H, which is a hydrogen atom, or

R 5 , which is an organic group;

Y 4 is either:

X 9 , which is a further functional group able to react with a hydrolyzed functional group of the first organosilane molecule,

H, which is a hydrogen atom, or

R 6 , which is an organic group,

B 2 , the presence of which is optional, is a bridging group,

Z 3 is either:

R 7 , which is an organic group,

H, which is a hydrogen atom, or

L 1 , which is a ligand having an electron donor functionality and which is able to act as a metal nucleation site,

Z 4 is either:

R 8 , which is an organic group,

H, which is a hydrogen atom, or

L 2 , which is a ligand having an electron donor functionality and which is able to act as a metal nucleation site, and

L is a ligand having an electron donor functionality and is able to act as a metal nucleation site;

reacting at least some of the functional groups X 7 and, if present, X 8 and X 9 , of the second organosilane with a respective hydrolyzed functional group of the first organosilane; and

cross-linking at least some respective combinations of first and second organosilanes;

wherein at least one of:

the reaction between the first organosilane and hydroxyl groups on the dielectric layer, and

the cross-linking of respective combinations of first and second organosilanes is carried out with a photo-activation step.

2 . The method of claim 1 , wherein the photo-activation step is dependent on one or more of light wavelength, time of exposure, and temperature.

3 . The method of claim 2 , wherein the photo-activation step uses light at a wavelength between 190 nm to 10 μm.

4 . The method of claim 3 , wherein the photo-activation step uses light at wavelength between 190 nm to 500 nm.

5 . The method of claim 2 , wherein the time of exposure is between 1 and 1000 seconds.

6 . The method of claim 2 , wherein the time of exposure is between 1 and 60 seconds.

7 . The method of claim 2 , wherein the temperature at which the photo-activation step is performed is between 0° C. and 400° C.

8 . The method of claim 2 , wherein the temperature at which the photo-activation step is performed is between 10° C. and 100° C.

9 . The method of claim 1 , further comprising depositing a barrier layer over the cross-linked first and second organosilanes.

10 . The method of claim 9 , wherein depositing the barrier layer includes depositing a metallic barrier layer from a liquid phase.

11 . A method of forming a coupling layer on a dielectric layer having hydroxyl groups on a surface thereof, comprising:

depositing a first organosilane on the dielectric layer, at least some of the functional groups of the first organosilane reacting with hydroxyl groups formed on the surface of the dielectric layer, the first organosilane including a hydrolysable functional group;

hydrolyzing at least the hydrolizable functional group of the first organosilane,

depositing a second organosilane having a functional group able to react with the hydrolyzed functional group of the first organosilane, the second organosilane having a ligand for providing a metal nucleation site;

reacting at least some of the functional groups of the second organosilane with a respective hydrolyzed functional group of the first organosilane;

cross-linking at least some respective combinations of first and second organosilanes; and

depositing a barrier layer on the cross-linked first and second organosilanes,

wherein at least one of:

the reaction between the first organosilane and hydroxyl groups on the dielectric layer, and

the cross-linking of respective combinations of first and second organosilanes is carried out with a photo-activation step.

12 . The method of claim 11 , wherein the first organosilane has the general formula:

in which:

n 1 is an integer greater than or equal to 1,

each Si is a silicon atom;

X 1 is a functional group able to react with a surface hydroxyl site of the dielectric material,

Y 1 is either:

X 3 , which is a further functional group able to react with a surface hydroxyl site of the dielectric material,

H, which is a hydrogen atom, or

R 1 , which is an organic group;

Y 2 is either:

X 4 , which is a further functional group able to react with a surface hydroxyl site of the dielectric material,

H, which is a hydrogen atom, or

R 2 , which is an organic group,

B 1 , the presence of which is optional, is a bridging group,

Z 1 is either:

R 3 , which is an organic group,

H, which is a hydrogen atom, or

Xq, which is a hydrolizable functional group,

Z 2 is either:

R 4 , which is an organic group,

H, which is a hydrogen atom, or

X 6 , which is a hydrolizable functional group; and

X 2 is a hydrolizable functional group.

13 . The method of claim 12 , wherein the second organosilane has the general formula:

in which:

n 2 is an integer equal to or greater than or equal to 0,

each Si is a silicon atom;

X 7 is a functional group able to react with a hydrolyzed functional group of the first organosilane molecule,

Y 3 is either:

X 8 , which is a further functional group able to react with a hydrolyzed functional group of the first organosilane molecule,

H, which is a hydrogen atom, or

R 5 , which is an organic group;

Y 4 is either:

X 9 , which is a further functional group able to react with a hydrolyzed functional group of the first organosilane molecule,

H, which is a hydrogen atom, or

R 6 , which is an organic group,

B 2 , the presence of which is optional, is a bridging group,

Z 3 is either:

R 7 , which is an organic group,

H, which is a hydrogen atom, or

L 1 , which is a ligand having an electron donor functionality and which is able to act as a metal nucleation site,

Z 4 is either:

R 8 , which is an organic group,

H, which is a hydrogen atom, or

L 2 , which is a ligand having an electron donor functionality and which is able to act as a metal nucleation site, and

L is a ligand having an electron donor functionality and is able to act as a metal nucleation site.

14 . The method of claim 13 , wherein reacting includes reacting at least some of the functional groups X 7 and, if present, X 8 and X 9 , of the second organosilane with a respective hydrolyzed functional group of the first organosilane.

15 . The method of claim 11 , wherein the photo-activation step is dependent on one or more of light wavelength, time of exposure, and temperature.

16 . The method of claim 15 , wherein the photo-activation step uses light at a wavelength between 190 nm to 10 μm.

17 . The method of claim 16 , wherein the photo-activation step uses light at wavelength between 190 nm to 500 nm.

18 . The method of claim 15 , wherein the time of exposure is between 1 and 1000 seconds.

19 . The method of claim 15 , wherein the temperature at which the photo-activation step is performed is between 0° C. and 400° C.

20 . The method of claim 11 , wherein depositing the barrier layer includes depositing a metallic barrier layer from a liquid phase.

Assignments (4)
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040626 FRAME: 0683. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME EFFECTIVE NOVEMBER 7, 2016. Recorded Jan 12, 2017
From: NXP SEMICONDUCTORS USA, INC. (MERGED INTO); FREESCALE SEMICONDUCTOR, INC. (UNDER)
To: NXP USA, INC.
Reel/Frame 041414/0883 →
CHANGE OF NAME Recorded Nov 16, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040626/0683 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →