Systems and methods for manufacturing nano-electro-mechanical-system probes

1. A microscope probe configured to analyze a sample, the microscope probe comprising:

a moveable probe tip comprising a metal layer affixed to a top surface of a supporting layer, the moveable probe tip further comprising a terminal probe end, at least a portion of the metal layer at the terminal probe end extending past the supporting layer in a plane parallel to the to a top surface of a fixed substrate;

wherein at least a portion of a bottom surface of the supporting layer is attached to a spacer, the spacer fixedly secured to the top surface of the fixed substrate;

wherein at least a portion of the supporting layer extends past the fixed substrate; and

wherein the moveable probe tip is configured to be moveable in the plane parallel to the top surface of the fixed substrate.

2. The microscope probe of claim 1 , further comprising:

a first monolithically integrated actuator configured to displace the movable probe tip along a first axis; and

a monolithically integrated detection component configured to detect motion of the movable probe tip in response to an applied signal.

3. The microscope probe of claim 1 , wherein said metal is platinum, gold, tungsten, or nickel.

4. The microscope probe of claim 1 , wherein said supporting layer is silicon, silicon dioxide, or silicon nitride.

5. The microscope probe of claim 1 , wherein the microscope probe comprises a plurality of probe tips each comprising a terminal probe end, each of the plurality of probe tips further comprising a metal layer affixed to a supporting layer, at least a portion of the metal layer at the terminal probe ends extending past the supporting layer.

6. A microscope probe configured to analyze a sample, the microscope probe comprising:

a plurality of moveable probe tips each comprising a metal layer affixed to a top surface of a respective supporting layer, and each comprising a terminal probe end;

wherein a portion of a bottom surface of each of the respective supporting layers is attached to respective spacer, each respective spacer fixedly secured to a top surface of a fixed substrate;

wherein at least a portion of the metal layer at the terminal probe end of each of the moveable probe tips extend past the respective supporting layer in a plane parallel to the top surface of the fixed substrate and the respective supporting layer extends past the fixed substrate in a plane parallel to the top surface of the fixed substrate; and

wherein each of the plurality of moveable probe tips is freely moveable in the plane parallel to the top surface of the fixed substrate.

7. A microscope probe configured to analyze a sample, the microscope probe comprising:

a plurality of probe tips, each of the plurality of probe tips comprising a metal layer and a supporting layer, where each metal layer is arranged to extend past the supporting layer in a direction parallel to the surface of a fixed substrate of the microscope probe;

an insulated monolithically integrated interdigitated air-gap structure positioned between the plurality of probe tips and configured to provide a first air-gap between a first probe tip of the plurality of probe tips and a second probe tip of the plurality of probe tips; and

a first monolithically integrated actuator configured to displace at least one of the plurality of probe tips along a first axis; and a monolithically integrated detection component configured to detect motion of the at least one of the plurality of probe tips in response to an applied signal.

8. The microscope probe of claim 6 , further comprising an insulated interdigitated air-gap structure positioned between each of the plurality of probe tips.