IP Library Granted Patent US 9,997,390
Granted Patent B2
US 9,997,390 · App. 15/064,941 · Granted Jun 12, 2018

Semiconductor manufacturing method and laminated body

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Quick Facts
Patent No.
US 9,997,390
App. No.
15/064,941
Granted
Jun 12, 2018
Kind
B2
Abstract

A semiconductor manufacturing method according to a present embodiment includes forming a supporter on a second surface of a semiconductor substrate opposite to a first surface to be ground of the semiconductor substrate. The semiconductor manufacturing method includes thinning the thickness of the semiconductor substrate by grinding the first surface. In the semiconductor manufacturing method, the supporter contains a resin.

Claims (48)

1. A semiconductor manufacturing method comprising:

forming a supporter on a second surface of a semiconductor substrate opposite to a first surface to be ground of the semiconductor substrate;

thinning a thickness of the semiconductor substrate by grinding the first surface; and

forming an electrically-conductive film on the supporter,

the supporter comprising a resin.

2. The semiconductor manufacturing method according to claim 1 , wherein

a lateral surface of the semiconductor substrate is coated by the supporter.

3. The semiconductor manufacturing method according to claim 1 , wherein

forming the supporter on the second surface via a passivation film.

4. The semiconductor manufacturing method according to claim 1 , comprising

forming a protective film on the electrically conductive film.

5. The semiconductor manufacturing method according to claim 1 , wherein

forming the supporter comprises:

applying a curable resin onto the second surface; and

curing the curable resin.

6. The semiconductor manufacturing method according to claim 5 , comprising

cutting the semiconductor substrate in a thickness direction after thinning the thickness of the semiconductor substrate.

7. The semiconductor manufacturing method according to claim 5 , wherein a lateral surface of the semiconductor substrate is coated by the supporter.

8. The semiconductor manufacturing method according to claim 5 , wherein

forming the supporter comprises planarizing a surface of the curable resin after curing the curable resin.

9. The semiconductor manufacturing method according to claim 8 , comprising

cutting the semiconductor substrate in a thickness direction after thinning the thickness of the semiconductor substrate.

10. The semiconductor manufacturing method according to claim 8 , wherein

a lateral surface of the semiconductor substrate is coated by the supporter.

11. The semiconductor manufacturing method according to claim 1 , comprising

cutting the semiconductor substrate in a thickness direction after thinning the thickness of the semiconductor substrate.

12. The semiconductor manufacturing method according to claim 11 , wherein a lateral surface of the semiconductor substrate is coated by the supporter.

13. The semiconductor manufacturing method according to claim 11 , comprising:

between thinning of the thickness of the semiconductor substrate and cutting of the semiconductor substrate in the thickness direction,

forming a through hole penetrating through the semiconductor substrate in the thickness direction; and

forming a first electrode burying the penetrating hole.

14. The semiconductor manufacturing method according to claim 13 , comprising:

forming, on the second surface, a second electrode connected to the first electrode before forming the supporter; and

exposing the second electrode by removing the supporter after cutting the semiconductor substrate in the thickness direction.

15. The semiconductor manufacturing method according to claim 13 , wherein

a lateral surface of the semiconductor substrate is coated by the supporter.

16. A laminated body comprising:

a semiconductor substrate; and

a supporter disposed on a second surface of the semiconductor substrate opposite to a first surface to be ground of the semiconductor substrate, wherein

a first portion of a lateral surface of the semiconductor substrate located on the second surface side is coated by the end of the supporter,

a second portion of the lateral surface of the semiconductor substrate located on the first surface side is not coated by the end of the supporter, and

the end of the supporter projects toward the first surface of the semiconductor substrate to coat the first portion of the lateral surface of the semiconductor substrate.

17. The laminated body according to claim 16 , wherein

the supporter comprises a resin.

18. The laminated body according to claim 16 , comprising

an electrically-conductive film on the supporter.

19. The laminated body according to claim 18 , comprising

a protective film on the electrically-conductive film.

Assignments (5)
MERGER Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 29, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043052/0218 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 18, 2016
From: TAKANO, EIJI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 038307/0941 →