IP Library Granted Patent US 10,005,999
Granted Patent B2
US 10,005,999 · App. 15/071,921 · Granted Jun 26, 2018

Method and apparatus for measuring biofilm thickness and topology

Inventors: Curtis J. Larimer (Richland, WA); Jonathan D. Suter (Richland, WA); Raymond S. Addleman (Benton City, WA); George T. Bonheyo (Sequim, WA); Michelle R. Brann (Richland, WA)
Assignee: BATTELLE MEMORIAL INSTITUTE
C12M41/46C12M23/12C12M23/22C12M23/58C12M29/10C12M41/36C12M41/48G01B9/0209G01B9/02021G01B11/0675G01B11/2441
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Quick Facts
Patent No.
US 10,005,999
App. No.
15/071,921
Granted
Jun 26, 2018
Kind
B2
Abstract

An apparatus and method of measuring biofilm and biological activity on a surface is disclosed. The apparatus includes a biofilm, which includes one or more microorganisms, grown on a substrate. A viewing window is placed on a surface of the biofilm and a gas bubble is introduced between the viewing window and the surface of the biofilm. The space between the substrate and the viewing window may be enclosed in a casing that has an inlet and an outlet, forming a flow cell. A microscope system, such as a white light interferometer, captures data of the biofilm in situ and non-destructively. The 3D images of biofilm surface have high resolution while maintaining a large field of view. The apparatuses and methods will be useful for fundamental studies of biofilms, biomedical and environmental screening, and many other applications in biology and the life sciences.

Claims (8)

1. A method of measuring biofilm surface properties comprising:

a. growing a biofilm including one or more microorganisms on a base of one or more wells of a multi-well plate containing a plurality of individual wells, each well having a base;

b. localizing a gas bubble on a surface of the biofilm; and

c. inverting the multi-well plate so as to position the base of the multi-well plate proximate to the objective lens of a microscope system; and

d. capturing data of the biofilm using the microscope system to measure biofilm thickness and topology.

2. The method of claim 1 wherein the microscope system is a three-dimensional profile microscope system.

3. The method of claim 2 wherein the three-dimensional profile microscope system is a white light interferometer.

4. The method of claim 1 wherein the microscope system includes a stage to allow the multi-well plate to be inverted automatically.

Assignments (2)
CONFIRMATORY LICENSE Recorded Apr 14, 2016
From: BATTELLE MEMORIAL INSTITUTE, PACIFIC NORTHWEST DIVISION
To: U.S. DEPARTMENT OF ENERGY
Reel/Frame 038279/0722 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 25, 2016
From: LARIMER, CURTIS J.; SUTER, JONATHAN D.; ADDLEMAN, RAYMOND S.; BONHEYO, GEORGE T.; BRANN, MICHELLE R.
To: BATTELLE MEMORIAL INSTITUTE
Reel/Frame 038105/0270 →
Continuity (2)
Provisional Application 62134945 · Mar 18, 2015
Related Publication 20160272933A1 · Sep 22, 2016
Cited By (1)
US 12,332,160