IP Library › Granted Patent US 10,282,266
Granted Patent B2
US 10,282,266 · App. 15/084,873 · Granted May 7, 2019

Apparatus and system for testing touch screen and apparatus for controlling test of touch screen

Inventors: Guowen Yang (Beijing, CN); Yongjun Liao (Beijing, CN); Zhen Wu (Beijing, CN); Dongnian Han (Beijing, CN); Jiayin Wang (Beijing, CN)
Assignees: BOE TECHNOLOGY GROUP CO., LTD.; BOE (HEBEI) MOBILE DISPLAY TECHNOLOGY CO., LTD.
G06F11/263G06F3/041G06F3/0414G06F3/0416G06F3/0418G06F11/2221G06F11/277G06F11/2733
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Quick Facts
Patent No.
US 10,282,266
App. No.
15/084,873
Granted
May 7, 2019
Kind
B2
Abstract

The present disclosure provides an apparatus and system for testing a touch screen, and an apparatus for controlling test of a touch screen. The apparatus for testing a touch screen comprises: a processor, a test signal collection interface unit, and an external communication interface unit, wherein the processor is connected to the test signal collection interface unit, and is configured to, after touch information is collected by the test signal collection interface unit, convert the collected touch information into a format which is recognizable by an intelligent device, and transmit the converted touch information to the intelligent device through the external communication interface unit. The apparatus for testing a touch screen according to the present disclosure enables the touch information to be correspondingly processed and displayed by a processor and a display of the intelligent device, respectively. In this way, as the processor of the apparatus for testing a touch screen per se needs not to perform corresponding data processing and analysis processes, a processor with low performance may be used to facilitate reducing the manufacturing cost of the apparatus for testing a touch screen.

Claims (15)

1. An apparatus for testing a touch screen, comprising: a processor, a display screen, a test signal collection interface unit, and an external communication interface unit, the processor being connected to the test signal collection interface unit and the external communication interface unit, wherein,

the test signal collection interface unit is configured to collect touch information of the tested touch screen, and

the processor is configured to convert the touch information collected by the test signal collection interface unit into a format which is recognizable by an intelligent device, and transmit the converted touch information to the intelligent device through the external communication interface unit,

the processor is further configured to receive touch defect information transmitted by the intelligent device through the external communication interface unit and display the touch defect information on the display screen, wherein the touch defect information is obtained by the intelligent device making a fault judgment on the received touch information.

2. The apparatus according to claim 1 , further comprising:

a memory, configured to receive and store attribute parameters corresponding to different types of touch screens; wherein,

the processor is connected to the memory to collect touch information of a touch screen according to attribute parameters of the corresponding type of touch screen stored in the memory.

3. The apparatus according to claim 1 , wherein the display screen is an LCD1602 display screen.

4. The apparatus according to claim 1 , wherein the processor is a microcontroller unit or an STM32 ARM processor.

5. The apparatus according to claim 1 , wherein the external communication interface unit comprises a Bluetooth transmitter and/or an RS232 interface.

6. The apparatus according to claim 1 , wherein the test signal collection interface unit comprises an Inter-Integrated Circuit (IIC) interface, and the processor is configured to generate an IIC timing, output the IIC timing to a touch chip of the touch screen through the test signal collection interface unit, and collect touch information detected by the touch chip through the test signal collection interface unit; and/or

the test signal collection interface unit comprises a Serial Peripheral Interface (SPI), and the processor is configured to generate an SPI timing, output the SPI timing to the touch chip of the touch screen through the test signal collection interface unit, and collect touch information detected by the touch chip through the test signal collection interface unit.

7. The apparatus according to claim 1 , wherein the touch information comprises coordinate information of a touch point.

8. The apparatus according to claim 1 , wherein the processor is further configured to receive configuration parameters of the touch screen transmitted by the intelligent device through the external communication interface unit, and transmit the configuration parameters of the touch screen to the touch screen through the test signal collection interface unit to configure parameters of the touch screen.

9. The apparatus according to claim 1 , wherein the intelligent device is an intelligent device external to the tested touch screen or an intelligent device to which the tested touch screen belongs.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 30, 2016
From: YANG, GUOWEN; LIAO, YONGJUN; WU, ZHEN; HAN, DONGNIAN; WANG, JIAYIN
To: BOE TECHNOLOGY GROUP CO., LTD.; BOE (HEBEI) MOBILE DISPLAY TECHNOLOGY CO., LTD.
Reel/Frame 038137/0079 →
Priority Claims (1)
CN 2015 1 0435030 · Jul 22, 2015 · national
Continuity (1)
Related Publication 20170023637A1 · Jan 26, 2017