ELECTRONIC SYSTEM AND METHOD FOR ESTIMATING AND PREDICTING A FAILURE OF THAT ELECTRONIC SYSTEM
An electronic system, e.g. a power supply, includes elements, and the elements include devices that limit reliability of the electronic system. A system that can monitor parameters that affect electronic system reliability such as temperature, and parameters that can predict power supply failure such as bulk capacitor ESR, includes a monitoring system measuring and monitoring at least one reliability limiting parameter of at least one of the devices connected to the monitoring system. A method for estimating and predicting a failure of the electronic system includes: measuring parameters affecting or associating the reliability of the device by sensors, collecting the measured sensor data and/or other data by a communications unit, and communicating the data to a computing device for processing and predicting a failure of the device and alerting to the failure.
1 . An electronic system comprising elements and the elements comprising devices that limit reliability of the electronic system, wherein at least one of the devices is connected to a monitoring system measuring and monitoring at least one reliability limiting parameter.
2 . The electronic system according to claim 1 , wherein the electronic system comprises a power supply, the elements comprise an AC-DC converter, a power factor correction, a bus converter, and a point of load regulation, and one of said elements is connected to the monitoring system measuring and monitoring at least one reliability limiting parameter.
3 . The electronic system according to claim 1 , wherein the monitoring system comprises sensors for measuring device parameters, a communications unit communicating with the sensors, a computing unit connected to the communications unit, and a storage means associated with the computing unit.
4 . The electronic system according to claim 3 , wherein the communications unit is connected to a local embedded host by a local communications bus, and the embedded host is located within a facility where the monitoring system is located.
5 . The electronic system according to claim 3 , wherein the computing unit and the storage means are located within a facility where the at least one of the devices connected to the monitoring system is located.
6 . The electronic system according to claim 3 , wherein the computing unit and the storage means are located outside a facility where the at least one of the devices connected to the monitoring system is located.
7 . The electronic system according to claim 6 , wherein the computing unit and the storage means are located in a different facility than where the at least one of the devices connected to the monitoring system is located.
8 . The electronic system according to claim 8 , wherein the computing unit and the storage means are located at a remote data-center.
9 . The electronic system according to claim 2 , wherein the monitoring system is connected over cloud computing means with other power supplies and sensors of the other power supplies building up a database of parameters.
10 . The electronic system according to claim 3 , wherein the computing unit comprises an ASIC or a FPGA.
11 . The electronic system according to claim 3 , wherein the computing unit is connected to indicator function means.
12 . The electronic system according to claim 11 wherein the indicator function means comprises at least one of a light emitting diode or a status register.
13 . The electronic system according to claim 1 , wherein the monitoring system is incorporated into a digital power control IC or a power management integrated circuit (PMIC) comprising all power controllers, sensors, estimators, observers and communications and processing logic.
14 . A method for estimating and predicting a reliability limiting failure of an electronic system comprising the following steps: measuring parameters affecting or associating reliability of a device by sensors, collecting measured sensor data and/or other data by a communications unit, communicating the data to a computing unit for processing, and predicting a failure of the device and alerting to the failure.
15 . The method for estimating and predicting a reliability limiting failure of an electronic system according to claim 11 , wherein the computing unit runs a machine learning program for estimating, learning and predicting the failure of the device.
16 . The method for estimating and predicting a reliability limiting failure of an electronic system according to claim 12 , wherein the machine learning program processes the collected and communicated sensor data and/or other data.
17 . The method for estimating and predicting a reliability limiting failure of an electronic system according to claim 11 , wherein the machine learning program uses at least one of the following algorithms: Anomaly Detection, Neural Network, K-Nearest Neighbor, Linear Regression, Markov Chain Monte Carlo, Hidden Markov Modelling, Naive Bayes or Decision Trees.
18 . The method for estimating and predicting a reliability limiting failure of an electronic system according to claim 11 , wherein the computing unit is used in a cloud based environment, and is configured via a web interface.