IP Library Granted Patent US 9,589,637
Granted Patent B1
US 9,589,637 · App. 15/104,809 · Granted Mar 7, 2017

Storage element with storage and clock tree monitoring circuit and methods therefor

Inventors: Michael Rohleder (Unterschleissheim, DE); Thomas Koch (Kaufering, DE); Harald Luepken (Zorneding, DE)
Assignee: NXP USA, Inc.
G11C14/00G11C7/10G11C29/023G06F21/558
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Quick Facts
Patent No.
US 9,589,637
App. No.
15/104,809
Granted
Mar 7, 2017
Kind
B1
Abstract

A storage element with monitoring circuit, comprising a previous state information storage element configured to record a previous state of a monitored state information storage element, a state change indication unit having a clock input terminal coupled to the clock signal input interface, a state change indication unit being configured to generate a state change indication signal indicative of whether the monitored state information storage element shall have performed a state change by observing the data at a data input interface and a data output terminal, and a state change confirmation unit configured to generate a storage fault indicator by observing the data output terminal of the monitored state information storage element and the data output of the previous state information storage element and checking whether the result of this observation is in line with the state change indicator.

Claims (47)

1. A storage element with monitoring circuit, comprising:

a data input interface providing data;

a data output interface;

a clock signal input interface providing a clock;

a storage fault indicator interface;

a monitored state information storage element having a clock input terminal coupled to the clock signal input interface, a data input terminal coupled to the data input interface and a data output terminal;

a previous state information storage element having a clock input terminal coupled to the clock signal input interface, and a data input terminal coupled to the data output terminal of the monitored state information storage element, the previous state information storage element being configured to record the previous state of the monitored state information storage element;

a state change indication unit having a clock input terminal coupled to the clock signal input interface, the state change indication unit being configured to generate a state change indicator indicative of whether the monitored state information storage element shall have performed a state change by observing the data at the data input interface and the data at the output terminal of the monitored state information storage element; and

a state change confirmation unit coupled to the state change indication unit, the state change confirmation unit being configured to generate a storage fault indicator by observing the data at the output terminal of the monitored state information storage element and the data at the output of the previous state information storage element and checking whether the result of this observation is in line with the state change indicator.

2. The storage element with monitoring circuit of claim 1 , wherein the state change indication unit comprises:

a first comparison element having a first input terminal coupled to the data input interface, a second input terminal coupled to the data output terminal of the monitored state information storage element and an output terminal; and

a change indicator storage element having a clock input terminal coupled to the clock signal input interface, and a data input terminal coupled to the output terminal of the comparison element, and an output terminal; the change indicator storage element being configured to issue the state change indicator at its output terminal.

3. The storage element with monitoring circuit of claim 1 , wherein the state change confirmation unit comprises:

a second comparison element having a first input terminal coupled to the data output terminal of the monitored state information storage element, and a second input terminal coupled to the data output terminal of the previous state information storage element; and

a storage check unit configured to generate the storage fault indicator from the state change indicator and the output of the second comparison element, the storage fault indicator being indicative of whether or not the monitored state information storage element correctly stored data provided at its data input terminal.

4. The storage element with monitoring circuit of claim 1 , further comprising:

a data fault unit, including a clock input terminal coupled to the clock signal input interface, a first data input terminal coupled to the data input interface, and a second data input terminal coupled to the data output terminal of the monitored state information storage element, wherein the data fault unit is configured to generate a data fault indicator when the data recorded by the monitored state information storage element does not match a redundant copy of this data within the data fault unit.

5. The storage element with monitoring circuit of claim 4 , wherein the data fault unit comprises:

a redundant state information storage element having a clock input terminal coupled to the clock input signal interface and a data input terminal coupled to the data input interface, the redundant state information storage element being configured to provide a redundant copy of the data recorded by the monitored state information storage element; and

a third comparison element configured to compare the data output of the monitored state information storage element with the data output of the redundant state information storage element and configured to generate a data fault indicator, when the data output of the monitored state information storage element and the data output of the redundant state information storage element are not equivalent.

6. The storage element with monitoring circuit of claim 1 , further comprising:

a data fault detection and correction unit, having a clock input terminal coupled to the clock signal input interface, a first data input terminal coupled to the data input interface, and a second data input terminal coupled to the data output terminal of the monitored state information storage element, and a third input terminal connected to the storage fault indicator interface,

the data fault detection and correction unit being configured to generate a data fault indicator when the data recorded by the monitored state information storage element does not match a redundant copy of this data within the data fault detection and correction unit, and to generate a corrected data output selected from the data output terminal of the monitored state information storage element and the redundant copy of this data depending on the storage fault indicator and the data fault indicator.

7. The storage element with monitoring circuit of claim 6 , the data fault detection and correction unit further comprising:

a redundant state information storage element having a clock input terminal coupled to the clock input signal interface and a data input terminal coupled to the data input interface, the redundant state information storage element being configured to provide a redundant copy of the data recorded by the monitored state information storage element;

a third comparison element configured to compare the data output of the monitored state information storage element with the data output of the redundant state information storage element and configured to generate a data fault indicator, when the data output of the monitored state information storage element and the data output of the redundant state information storage element are not equivalent; and

a data selection unit configured to select one of the original data output of the monitored state information storage element or data output output by the redundant state information storage element, dependent on the storage fault indicator and the data fault indicator and to provide the selected data at the data output interface.

8. An integrated circuit, comprising at least one storage element with monitoring circuit of claim 1 .

9. The integrated circuit of claim 8 , comprising at least one clock root that is driving the clock input terminal of a set of storage elements either directly or indirectly, the set of storage elements comprising at least the monitored state information storage element, the change indicator storage element and the previous state information storage element of a first one of the storage elements with monitoring circuit.

10. The integrated circuit of claim 9 , wherein the change indicator storage element of the first one of the storage elements with monitoring circuit is arranged in a different clock signal subtree than the clock signal subtree driving the clock input terminal of the monitored state information storage element of the first one of the storage elements with monitoring circuit.

11. The integrated circuit of claim 8 , wherein the previous state information storage element of the first one of the storage elements with monitoring circuit is arranged in a different clock signal subtree than the clock signal subtree driving the clock input terminal of the change indicator storage element of the first one of the storage elements with monitoring circuit.

12. A method for monitoring a state information storage element, the method comprising:

feeding a monitored state information storage element with state information from a data input interface clocked with a clock signal;

detecting whether the current state information of the monitored state information storage element is different from the state information fed in the next clock period and generating a state change indicator with the clock signal CLK based on the detection result;

feeding a previous state information storage element with state information output from the monitored state information storage element clocked with the clock signal; and

detecting after the clock signal whether the current state information of the monitored state information storage element is different from the previous state information from the previous state information storage element and generating a storage fault indicator based on comparison of the detection result and the state change indicator.

13. The method of claim 12 , further comprising:

feeding a redundant state information storage element with state information of the data input interface clocked with the clock signal in parallel to the monitored state information storage element; and

comparing after the clock signal the data output of the monitored state information storage element with the data output of the redundant state information storage element and generating a data fault indicator, if the data output of the monitored state information storage element and the data output of the redundant state information storage element are not equivalent.

14. The method of claim 13 , further comprising:

selecting one of the data outputs of the monitored state information storage element and the redundant state information storage element as a corrected data output dependent on the evaluation of the storage fault indicator in combination with the data fault indicator.

15. The method of claim 12 , further comprising:

detecting a clock failure in a clock tree including:

determining, if a failure is present in a monitored state information storage element;

determining, if a failure is present in a previous state information storage element;

determining, if a failure is present in a change indicator storage element; and

determining a faulty clock signal subtree depending on a combination of the determined failure.

Assignments (5)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040626 FRAME: 0683. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME EFFECTIVE NOVEMBER 7, 2016. Recorded Jan 12, 2017
From: NXP SEMICONDUCTORS USA, INC. (MERGED INTO); FREESCALE SEMICONDUCTOR, INC. (UNDER)
To: NXP USA, INC.
Reel/Frame 041414/0883 →
CHANGE OF NAME Recorded Nov 16, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040626/0683 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 15, 2016
From: ROHLEDER, MICHAEL; KOCH, THOMAS; LUEPKEN, HARALD
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 038921/0457 →