IP Library Granted Patent US 9,920,227
Granted Patent B2
US 9,920,227 · App. 15/114,983 · Granted Mar 20, 2018

Resin composition, method for manufacturing semiconductor device using resin composition, and solid-state imaging element

Inventors: Sadaaki Katou (Tokyo, JP); Mika Kimura (Tokyo, JP); Aya Ikeda (Tokyo, JP); Shinjiro Fujii (Tokyo, JP)
Assignee: HITACHI CHEMICAL COMPANY, LTD.
C09J133/14C08F220/18C08F220/32C08F220/34C09J4/06C09J133/06H01L27/1464H01L27/14618H01L27/14632H01L27/14687C08F2220/325H01L27/14627H01L2224/48091H01L2224/48227H01L2224/73265H01L2224/97H01L2924/181
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Quick Facts
Patent No.
US 9,920,227
App. No.
15/114,983
Granted
Mar 20, 2018
Kind
B2
Abstract

A resin composition comprising (a) an acrylic polymer, (b) a compound having at least one (meth)acryloyl group and (c) a polymerization initiator, in which the absolute value of refractive index difference between the component (a) an acrylic polymer and the component (b) having at least one (meth)acryloyl group at 100° C. is 0.031 or less.

Claims (54)

1. A resin composition comprising:

(a) an acrylic polymer,

(b) a polyfunctional (meth)acrylic monomer having a dioxane glycol skeleton, and

(c) a polymerization initiator,

wherein an absolute value of refractive index difference between the (a) acrylic polymer and the (b) polyfunctional (meth)acrylic monomer having a dioxane glycol skeleton at 100° C. is 0.031 or less.

2. The resin composition according to claim 1 , further comprising (d) an antioxidant.

3. The resin composition according to claim 1 , wherein the (a) acrylic polymer contains at least one type of structural unit represented by the following formula (I)

where A represents an alicyclic group having 5 to 22 carbon atoms optionally having a substituent; and R represents a hydrogen atom or a methyl group.

4. The resin composition according to claim 1 , wherein the (a) acrylic polymer contains at least one type of structural unit represented by the following formula (II)

where Y represents a linear or branched alkyl group having 1 to 10 carbon atoms optionally having a substituent; and R represents a hydrogen atom or a methyl group.

5. The resin composition according to claim 1 , wherein the (a) acrylic polymer contains at least one type of structural unit represented by the following formula (III)

where Z represents a group containing at least one functional group selected from the group consisting of a carboxyl group, a hydroxyl group, an acid anhydride group, an amino group, an amide group, an epoxy group and a nitrile group; and R represents a hydrogen atom or a methyl group.

6. The resin composition according to claim 1 , for use in optical parts.

7. A method for manufacturing a semiconductor device comprising:

a step of forming an adhesive layer of the resin composition according to claim 1 on a semiconductor substrate,

a step of sandwiching the adhesive layer between the semiconductor substrate and a transparent substrate, and applying pressure onto the semiconductor substrate and the transparent substrate for bonding, and

a step of curing the adhesive layer.

8. A solid-state imaging element comprising:

a semiconductor substrate having a light receiving section provided on the upper surface,

an adhesive layer provided on the semiconductor substrate so as to cover the light receiving section, and

a transparent substrate bonded to the semiconductor substrate by the adhesive layer, wherein

the adhesive layer is formed of the resin composition according to claim 1 .

9. The resin composition according to claim 2 , wherein the (a) acrylic polymer contains at least one type of structural unit represented by the following formula (I)

where A represents an alicyclic group having 5 to 22 carbon atoms optionally having a substituent; and R represents a hydrogen atom or a methyl group.

10. The resin composition according to claim 2 , wherein the (a) acrylic polymer contains at least one type of structural unit represented by the following formula (II)

where Y represents a linear or branched alkyl group having 1 to 10 carbon atoms optionally having a substituent; and R represents a hydrogen atom or a methyl group.

11. The resin composition according to claim 3 , wherein the (a) acrylic polymer contains at least one type of structural unit represented by the following formula (II)

where Y represents a linear or branched alkyl group having 1 to 10 carbon atoms optionally having a substituent; and R represents a hydrogen atom or a methyl group.

12. The resin composition according to claim 2 , wherein the (a) acrylic polymer contains at least one type of structural unit represented by the following formula (III)

where Z represents a group containing at least one functional group selected from the group consisting of a carboxyl group, a hydroxyl group, an acid anhydride group, an amino group, an amide group, an epoxy group and a nitrile group; and R represents a hydrogen atom or a methyl group.

13. The resin composition according to claim 3 , wherein the (a) acrylic polymer contains at least one type of structural unit represented by the following formula (III)

where Z represents a group containing at least one functional group selected from the group consisting of a carboxyl group, a hydroxyl group, an acid anhydride group, an amino group, an amide group, an epoxy group and a nitrile group; and R represents a hydrogen atom or a methyl group.

14. The resin composition according to claim 4 , wherein the (a) acrylic polymer contains at least one type of structural unit represented by the following formula (III)

where Z represents a group containing at least one functional group selected from the group consisting of a carboxyl group, a hydroxyl group, an acid anhydride group, an amino group, an amide group, an epoxy group and a nitrile group; and R represents a hydrogen atom or a methyl group.

15. A solid-state imaging element comprising:

a semiconductor substrate having a light receiving section provided on the upper surface,

an adhesive layer provided on the semiconductor substrate so as to cover the light receiving section, and

a transparent substrate bonded to the semiconductor substrate by the adhesive layer, wherein

the adhesive layer is formed of the resin composition according to claim 2 .

16. A solid-state imaging element comprising:

a semiconductor substrate having a light receiving section provided on the upper surface,

an adhesive layer provided on the semiconductor substrate so as to cover the light receiving section, and

a transparent substrate bonded to the semiconductor substrate by the adhesive layer, wherein

the adhesive layer is formed of the resin composition according to claim 3 .

17. A solid-state imaging element comprising:

a semiconductor substrate having a light receiving section provided on the upper surface,

an adhesive layer provided on the semiconductor substrate so as to cover the light receiving section, and

a transparent substrate bonded to the semiconductor substrate by the adhesive layer, wherein

the adhesive layer is formed of the resin composition according to claim 4 .

18. A solid-state imaging element comprising:

a semiconductor substrate having a light receiving section provided on the upper surface,

an adhesive layer provided on the semiconductor substrate so as to cover the light receiving section, and

a transparent substrate bonded to the semiconductor substrate by the adhesive layer, wherein

the adhesive layer is formed of the resin composition according to claim 5 .

Assignments (4)
CHANGE OF ADDRESS Recorded Feb 14, 2024
From: RESONAC CORPORATION
To: RESONAC CORPORATION
Reel/Frame 066599/0037 →
CHANGE OF NAME Recorded Mar 3, 2023
From: SHOWA DENKO MATERIALS CO., LTD.
To: RESONAC CORPORATION
Reel/Frame 062946/0125 →
CHANGE OF NAME Recorded Mar 2, 2023
From: HITACHI CHEMICAL COMPANY, LTD.
To: SHOWA DENKO MATERIALS CO., LTD.
Reel/Frame 062917/0865 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 26, 2017
From: KATOU, SADAAKI; KIMURA, MIKA; IKEDA, AYA; FUJII, SHINJIRO
To: HITACHI CHEMICAL COMPANY, LTD.
Reel/Frame 042817/0389 →
Priority Claims (2)
JP 2014-014861 · Jan 29, 2014 · national
JP 2014-014863 · Jan 29, 2014 · national
Continuity (1)
Related Publication 20160355709A1 · Dec 8, 2016