IP Library Granted Patent US 9,923,116
Granted Patent B2
US 9,923,116 · App. 15/124,909 · Granted Mar 20, 2018

Method for producing solar cells having simultaneously etched-back doped regions

Inventors: Josh Engelhardt (Constance, DE); Alexander Frey (Constance, DE); Yvonne Schiele (Constance, DE); Barbara Terheiden (Constance, DE)
Assignee: UNIVERSITÄT KONSTANZ
H01L31/1804H01L31/022425H01L31/0684Y02E10/547Y02P70/521
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Quick Facts
Patent No.
US 9,923,116
App. No.
15/124,909
Granted
Mar 20, 2018
Kind
B2
Abstract

A method for producing a solar cell is described, in which a plurality of doped regions are to be etched-back selectively or over their entire surface. Once a semiconductor substrate ( 1 ) has been provided, various doped regions ( 3, 5 ) are formed in partial regions of a surface of the semiconductor substrate, the various doped regions ( 3, 5 ) differing as regards their doping concentration and/or their doping polarity. The various doped regions ( 3, 5 ) are then purposively etched-back in order to achieve desired doping profiles, and finally electrical contacts ( 21 ) are formed at least at some of the doped regions ( 3, 5 ). The etching-back of the various doped regions takes place in a common etching operation in an etching medium. In order that such common etching-back of various doped regions ( 3, 5 ) is possible, it is proposed purposively to adjust both properties of the initially unetched doped regions ( 3, 5 ) and parameters that influence the etching operation with regard to properties of the desired doping profiles within the etched doped regions.

Claims (37)

1. A method for producing a solar cell, comprising:

providing a semiconductor substrate;

forming various doped regions in partial regions of at least one surface of the semiconductor substrate, wherein the various doped regions differ as regards their doping concentration and/or their doping polarity;

etching-back the various doped regions in order to achieve desired doping profiles within the doped regions;

forming electrical contacts at least at some of the doped regions;

characterised in that

the etching-back of the various doped regions is carried out in a common etching operation under influence of an etching medium,

wherein both properties of the initially unetched doped regions and parameters that influence the etching operation are purposively adjusted with regard to properties of the desired doping profiles within the etched doped regions, and

wherein at least one cover layer which is produced before, during or after the formation of a doped region is purposively produced in such a manner that, with the aid thereof, an onset of etching of the underlying doped region is purposively delayed.

2. Method according to claim 1 , wherein properties of the initially unetched doped regions which are purposively adjusted are a surface doping concentration, a sheet resistance, a doping profile depth and/or a cover layer thickness, and wherein parameters that influence the etching operation which are purposively adjusted are an etching time, a composition of the etching medium and/or a temperature of the etching medium.

3. Method according to claim 1 , wherein each of the various doped regions is formed with a maximum doping concentration in the range of from 10 18 cm −3 to 10 22 cm −3 .

4. Method according to claim 1 , wherein the etching medium is based on fluorine.

5. Method according to claim 1 , wherein the etching medium is an HF solution.

6. Method according to claim 1 , wherein the etching medium comprises an oxidising substance.

7. Method according to claim 6 , wherein the etching medium comprises at least one oxidising substance selected from the group comprising HNO 3 , H 2 O 2 , X y S 2 O 8 , X y SO 5 , O 3 , X y MnO 4 and BrO 3 .

8. Method according to claim 1 , wherein the etching medium is a solution of HF, HNO 3 and H 2 O.

9. Method according to claim 8 , wherein the solution has an HF content of from 0 to 40 vol. %, an HNO 3 content of from 0 to 55 vol. % and an H 2 O content of from 0 to 90 vol. %.

10. Method according to claim 1 , wherein at least one of the doped regions is n-doped and wherein an HNO 3 content in the etching solution is so chosen that significant etching no longer occurs below a specific doping concentration within that doping range.

11. A method for producing a solar cell, comprising:

providing a semiconductor substrate;

forming various doped regions in partial regions of at least one surface of the semiconductor substrate, wherein the various doped regions differ as regards their doping concentration and/or their doping polarity;

etching-back the various doped regions in order to achieve desired doping profiles within the doped regions;

forming electrical contacts at least at some of the doped regions;

characterised in that

the etching-back of the various doped regions is carried out in a common etching operation under influence of an etching medium,

wherein both properties of the initially unetched doped regions and parameters that influence the etching operation are purposively adjusted with regard to properties of the desired doping profiles within the etched doped regions, and

wherein the various doped regions have different polarities.

12. A method for producing a solar cell, comprising:

providing a semiconductor substrate;

forming various doped regions in partial regions of at least one surface of the semiconductor substrate, wherein the various doped regions differ as regards their doping concentration and/or their doping polarity;

etching-back the various doped regions in order to achieve desired doping profiles within the doped regions;

forming electrical contacts at least at some of the doped regions;

characterised in that

the etching-back of the various doped regions is carried out in a common etching operation under influence of an etching medium,

wherein both properties of the initially unetched doped regions and parameters that influence the etching operation are purposively adjusted with regard to properties of the desired doping profiles within the etched doped regions, and

wherein, for the production of a selectively etched doped region, portions of a surface of the doped region that is selectively to be etched are protected with an etch mask.

13. Method according to claim 1 , wherein the semiconductor substrate consists of silicon.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 20, 2016
From: ENGELHARDT, JOSH; FREY, ALEXANDER; SCHIELE, YVONNE; TERHEIDEN, BARBARA
To: UNIVERSITÄT KONSTANZ
Reel/Frame 039790/0873 →
Priority Claims (1)
DE 10 2014 103 303 · Mar 12, 2014 · national
Continuity (1)
Related Publication 20170018676A1 · Jan 19, 2017