Method for classifying light-emitting semiconductor components and image sensor application having an image sensor and a semiconductor element
The invention relates to a method for classifying a light-emitting semiconductor component ( 301 ) for an image sensor application, wherein the semiconductor component ( 301 ) is designed as a light source for an image sensor ( 302 ), comprising the following steps: providing the light-emitting semiconductor component ( 301 ); determining at least one of the following parameters of the light emitted with an emission spectrum by the light-emitting semiconductor component ( 301 ) during operation: R=∫qR(λ)·S(λ)dλ·texp, G=∫qG(λ)·S(λ)dλ·texp, B=∫qB(λ)·S(λ)dλ·texp, wherein qR(λ), qG(λ), and qB(λ) are spectral sensitivities of a red, green, and blue color channel of the image sensor ( 302 ), S(λ) is the emission spectrum of the light-emitting semiconductor component ( 301 ), texp is an exposure time, and λ designates a wavelength; classifying the light-emitting semiconductor component ( 301 ) into a class from a group of classes, which are characterized by different value ranges of at least one parameter that depends on at least one of the parameters R, G, and B. The invention further relates to an image sensor application.
1. A method for classifying a light-emitting semiconductor component for an image sensor application, wherein the light-emitting semiconductor component is configured as a light source for an image sensor, comprising:
providing the light-emitting semiconductor component comprising at least two light-emitting semiconductor chips;
determining at least one of R, G, or B of a light emitted during operation with an emission spectrum by the light-emitting semiconductor component;
wherein R=∫q R (λ)· S (λ) dλ·t exp ;
wherein G=∫q G (λ)· S (λ) dλ·t exp ;
wherein B=∫q B (λ)· S (λ) dλ·t exp ;
wherein q R (λ), q G (λ) and q B (λ) are spectral sensitivities of a red, green, and blue color channel of the image sensor, S(λ) is the emission spectrum of the light-emitting semiconductor component, t exp is an exposure time, and λ designates a wavelength;
categorizing the light-emitting semiconductor component in a class from a group of classes which are characterized by different value ranges of at least one parameter that depends on at least one of R, G, or B;
selecting the light-emitting semiconductor component for use with one or more other light-emitting semiconductor components having a same class as the class of the light-emitting semiconductor component; and
illuminating the light source based on the selecting.
2. The method according to claim 1 , wherein the light-emitting semiconductor component is categorized in the class from the group of classes which are characterized by respective value ranges of parameters:
rg 1 =R/ ( R+G+B ), or bg 1 =B/ ( R+G+B ), or both.
3. The method according to claim 1 , wherein the light-emitting semiconductor component is categorized in the class from the group of classes which are characterized by respective value ranges of parameters:
rg 2 =G/R , or bg 2 =G/B , or both.
4. The method according to claim 1 , wherein the light-emitting semiconductor component is categorized in the class from the group of classes which are characterized by respective value ranges of parameters:
rg 3 =G/R , or bg 3 =G/B , or both.
5. The method according to claim 2 , wherein the class in which the light-emitting semiconductor component is categorized is characterized by rg1 and bg1 values which correspond to corresponding rg1 and bg1 values of sunlight or of light according to a standard illuminant A or D or light of a Planckian emitter.
6. The method according to claim 1 , wherein the image sensor forms part of a video camera, a photographic apparatus, a mobile telephone, or a medical imaging device.
7. The method according to claim 1 , wherein the light-emitting semiconductor component forms part of a video camera, a photographic apparatus, a mobile phone, a stadium lighting system, a stage lighting system, a studio lighting system, or a medical imaging device.
8. The method according to claim 1 , wherein the light-emitting semiconductor component emits white light during operation.
9. The method according to claim 1 , wherein the image sensor is a CCD sensor or a CMOS sensor.
10. An apparatus comprising:
an image sensor; and
a light-emitting semiconductor component which is configured as a light source for the image sensor and comprises at least two light-emitting semiconductor chips,
wherein the light-emitting semiconductor component is selected by:
determining at least one of R, G, or B of a light emitted during operation with an emission spectrum by the light-emitting semiconductor component;
wherein R=∫q R (λ)· S (λ) dλ·t exp ;
wherein G=∫q G (λ)· S (λ) dλ·t exp ;
wherein B=∫q B (λ)· S (λ) dλ·t exp ;
wherein q R (λ), q G (λ) and q B (λ) are spectral sensitivities of a red, green, and blue color channel of the image sensor, S(λ) is the emission spectrum of the light-emitting semiconductor component, t exp is an exposure time, and λ designates a wavelength;
categorizing the light-emitting semiconductor component in a class from a group of classes which are characterized by different value ranges of at least one parameter that depends on at least one of R, G, or B;
selecting the light-emitting semiconductor component for use with one or more other light-emitting semiconductor components having a same class as the class of the light-emitting semiconductor component; and
illuminating the light source.
11. The method according to claim 3 , wherein the class in which the light-emitting semiconductor component is categorized is characterized by rg2 and bg2 values which correspond to corresponding rg2 and bg2 values of sunlight or of light according to a standard illuminant A or D or light of a Planckian emitter.
12. The method according to claim 4 , wherein the class in which the light-emitting semiconductor component is categorized is characterized by rg3 and bg3 values which correspond to corresponding rg3 and bg3 values of sunlight or of light according to a standard illuminant A or D or light of a Planckian emitter.
13. The method of claim 1 , wherein the light-emitting semiconductor component and the one or more other light-emitting semiconductor components having the same class are configured for use in an illuminating application of the image sensor.
14. A method for classifying a light-emitting semiconductor component for an image sensor application, wherein the light-emitting semiconductor component is configured as a light source for an image sensor, comprising:
providing the light-emitting semiconductor component comprising at least two light-emitting semiconductor chips;
determining at least one of R, G, or B of a light emitted during operation with an emission spectrum by the light-emitting semiconductor component;
wherein R=∫q R (λ)· S (λ) dλ·t exp ;
wherein G=∫q G (λ)· S (λ) dλ·t exp ;
wherein B=∫q B (λ)· S (λ) dλ·t exp ;
wherein q R (λ), q G (λ) and q B (λ) are spectral sensitivities of a red, green, and blue color channel of the image sensor, S(λ) is the emission spectrum of the light-emitting semiconductor component, t exp is an exposure time, and λ designates a wavelength;
categorizing the light-emitting semiconductor component in a class from a group of classes which are characterized by different value ranges of at least one parameter that depends on at least one of R, G, or B;
sorting the light-emitting semiconductor component into a category from a group of categories; and
selecting the light-emitting semiconductor component during illumination for use with one or more other light-emitting semiconductor components having a same class as the class of the light-emitting semiconductor component.